FR2888926B1 - Interferometre ewod - Google Patents

Interferometre ewod

Info

Publication number
FR2888926B1
FR2888926B1 FR0552281A FR0552281A FR2888926B1 FR 2888926 B1 FR2888926 B1 FR 2888926B1 FR 0552281 A FR0552281 A FR 0552281A FR 0552281 A FR0552281 A FR 0552281A FR 2888926 B1 FR2888926 B1 FR 2888926B1
Authority
FR
France
Prior art keywords
ewod
interferometer
ewod interferometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0552281A
Other languages
English (en)
Other versions
FR2888926A1 (fr
Inventor
Jerome Boutet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR0552281A priority Critical patent/FR2888926B1/fr
Priority to PCT/EP2006/064516 priority patent/WO2007010041A1/fr
Publication of FR2888926A1 publication Critical patent/FR2888926A1/fr
Application granted granted Critical
Publication of FR2888926B1 publication Critical patent/FR2888926B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/004Optical devices or arrangements for the control of light using movable or deformable optical elements based on a displacement or a deformation of a fluid
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/40Non-mechanical variable delay line
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03Cuvette constructions
    • G01N2021/0346Capillary cells; Microcells
    • G01N2021/035Supports for sample drops
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G01N2021/458Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods using interferential sensor, e.g. sensor fibre, possibly on optical waveguide
FR0552281A 2005-07-22 2005-07-22 Interferometre ewod Expired - Fee Related FR2888926B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR0552281A FR2888926B1 (fr) 2005-07-22 2005-07-22 Interferometre ewod
PCT/EP2006/064516 WO2007010041A1 (fr) 2005-07-22 2006-07-21 Interferometre ewod

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0552281A FR2888926B1 (fr) 2005-07-22 2005-07-22 Interferometre ewod

Publications (2)

Publication Number Publication Date
FR2888926A1 FR2888926A1 (fr) 2007-01-26
FR2888926B1 true FR2888926B1 (fr) 2007-09-28

Family

ID=36123248

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0552281A Expired - Fee Related FR2888926B1 (fr) 2005-07-22 2005-07-22 Interferometre ewod

Country Status (2)

Country Link
FR (1) FR2888926B1 (fr)
WO (1) WO2007010041A1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI480513B (zh) * 2009-12-04 2015-04-11 Raydium Semiconductor Corp 光學同調斷層檢測裝置及其運作方法
FR2969748B1 (fr) 2010-12-22 2013-01-25 Astrium Sas Piece a rupture pyrotechnique detonante reversible
US9976983B2 (en) * 2014-03-07 2018-05-22 Taiwan Semiconductor Manufacturing Company Limited Semiconductor arrangement and formation thereof
US11618025B2 (en) * 2018-08-01 2023-04-04 University Of Macau Apparatus and method for on-chip microfluids dispensing

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0924507B1 (fr) * 1997-12-22 2003-08-13 Optical Technologies U.S.A. Corp. Interferomètre pour mesurer des propriétés optiques d'un échantillon
US7016560B2 (en) * 2001-02-28 2006-03-21 Lightwave Microsystems Corporation Microfluidic control for waveguide optical switches, variable attenuators, and other optical devices
WO2002069016A2 (fr) * 2001-02-28 2002-09-06 Lightwave Microsystems Corporation Commande microfluidique pour commutateurs de guides d'ondes optiques, attenuateurs variables et autres dispositifs optiques

Also Published As

Publication number Publication date
FR2888926A1 (fr) 2007-01-26
WO2007010041A1 (fr) 2007-01-25

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20090331