FR2887029B1 - Appareillage de mesure de temperature sans contact d'echantillons de materiaux places sous vide - Google Patents

Appareillage de mesure de temperature sans contact d'echantillons de materiaux places sous vide

Info

Publication number
FR2887029B1
FR2887029B1 FR0551563A FR0551563A FR2887029B1 FR 2887029 B1 FR2887029 B1 FR 2887029B1 FR 0551563 A FR0551563 A FR 0551563A FR 0551563 A FR0551563 A FR 0551563A FR 2887029 B1 FR2887029 B1 FR 2887029B1
Authority
FR
France
Prior art keywords
samples
temperature measurement
contact temperature
vacuum materials
vacuum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0551563A
Other languages
English (en)
Other versions
FR2887029A1 (fr
Inventor
Christoph Semprimoschnig
Eesbeek Marc R J Van
Stan Heltzel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agence Spatiale Europeenne
Original Assignee
Agence Spatiale Europeenne
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agence Spatiale Europeenne filed Critical Agence Spatiale Europeenne
Priority to FR0551563A priority Critical patent/FR2887029B1/fr
Priority to PCT/FR2006/001305 priority patent/WO2006131656A2/fr
Priority to US11/922,079 priority patent/US7980758B2/en
Priority to EP06764757A priority patent/EP1889041A2/fr
Publication of FR2887029A1 publication Critical patent/FR2887029A1/fr
Application granted granted Critical
Publication of FR2887029B1 publication Critical patent/FR2887029B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K13/00—Thermometers specially adapted for specific purposes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Radiation Pyrometers (AREA)
FR0551563A 2005-06-09 2005-06-09 Appareillage de mesure de temperature sans contact d'echantillons de materiaux places sous vide Expired - Fee Related FR2887029B1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR0551563A FR2887029B1 (fr) 2005-06-09 2005-06-09 Appareillage de mesure de temperature sans contact d'echantillons de materiaux places sous vide
PCT/FR2006/001305 WO2006131656A2 (fr) 2005-06-09 2006-06-07 Appareillage de mesure de temperature sans contact d’echantillons de materiaux places sous vide
US11/922,079 US7980758B2 (en) 2005-06-09 2006-06-07 Equipment for non-contact temperature measurement of samples of materials arranged under vacuum
EP06764757A EP1889041A2 (fr) 2005-06-09 2006-06-07 Appareillage de mesure de temperature sans contact d echantillons de materiaux places sous vide

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0551563A FR2887029B1 (fr) 2005-06-09 2005-06-09 Appareillage de mesure de temperature sans contact d'echantillons de materiaux places sous vide

Publications (2)

Publication Number Publication Date
FR2887029A1 FR2887029A1 (fr) 2006-12-15
FR2887029B1 true FR2887029B1 (fr) 2007-08-03

Family

ID=35588006

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0551563A Expired - Fee Related FR2887029B1 (fr) 2005-06-09 2005-06-09 Appareillage de mesure de temperature sans contact d'echantillons de materiaux places sous vide

Country Status (4)

Country Link
US (1) US7980758B2 (fr)
EP (1) EP1889041A2 (fr)
FR (1) FR2887029B1 (fr)
WO (1) WO2006131656A2 (fr)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2466363C2 (ru) * 2011-01-13 2012-11-10 Юрий Александрович Чивель Устройство для измерения температуры поверхности в области воздействия лазерного излучения
CN102903287B (zh) * 2012-10-12 2014-10-08 四川大学 光致温度升高的温度测量装置
EP3088858A4 (fr) * 2013-12-27 2017-08-23 Nikon Corporation Procédé de mesure de la température pour un élément transmettant les ultraviolets, dispositif de mesure de la température pour un élément transmettant les ultraviolets, et dispositif source de lumière
SG10201806086TA (en) * 2014-01-16 2018-08-30 Agency Science Tech & Res System and method for detecting a defective sample
GB201414666D0 (en) * 2014-08-19 2014-10-01 Colormatrix Holdings Inc Polymeric materials
US9939396B2 (en) * 2015-01-30 2018-04-10 Netzsch-Gerätebau GmbH 3D diffusivity
US10139283B2 (en) * 2015-11-30 2018-11-27 Kla-Tencor Corporation Non-contact thermal measurements of VUV optics
FR3085296B1 (fr) * 2018-08-28 2020-07-31 Sidel Participations Procede de mesure individuelle de la temperature d'une preforme
CN112284543B (zh) * 2020-09-17 2022-03-04 北京卫星制造厂有限公司 一种热真空试验环境下温度场测量系统
CN113865512A (zh) * 2021-12-02 2021-12-31 北京中天星控科技开发有限公司 一种外形轮廓扫描测量装置及方法
CN115452882B (zh) * 2022-08-10 2024-07-23 山东大学 一种微波场中样品体相温度测量装置和方法
CN115561554B (zh) * 2022-10-17 2023-07-14 中国空气动力研究与发展中心超高速空气动力研究所 基于聚光灯加热的热透波材料电性能的测试装置及方法
CN116973382B (zh) * 2023-07-26 2024-07-16 中国科学院上海光学精密机械研究所 一种太空能量粒子与在轨服役状态性能试验装置与方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2939890C3 (de) * 1979-10-02 1982-02-25 Schubert & Salzer Maschinenfabrik Ag, 8070 Ingolstadt Verfahren und Vorrichtung zum Öffnen und Mischen von Faserballen
US4455741A (en) * 1982-02-11 1984-06-26 At&T Bell Laboratories Fabrication of solid state electronic devices using fluorescent imaging of surface temperature profiles
JPH0766910B2 (ja) 1984-07-26 1995-07-19 新技術事業団 半導体単結晶成長装置
DE3914709C1 (fr) * 1989-05-04 1990-10-25 Deutsche Forschungsanstalt Fuer Luft- Und Raumfahrt Ev, 5300 Bonn, De
US5106201A (en) * 1989-05-30 1992-04-21 Deutsche Forschungsanstalt Fur Luft Und Raumfahrt E.V. Device for measuring the radiation temperature of a melt in vacuum
US5219226A (en) * 1991-10-25 1993-06-15 Quadtek, Inc. Imaging and temperature monitoring system
US5483068A (en) * 1994-01-07 1996-01-09 Moulton; Russell D. Use of IR (thermal) imaging for determining cell diagnostics
FR2716533B1 (fr) * 1994-02-22 1996-05-31 Christophe Robert Yvon Dispositif de mesure de température à balayage.
US6098929A (en) * 1998-01-28 2000-08-08 Falbel; Gerald Three axis attitude readout system for geosynchronous spacecraft
US7126131B2 (en) * 2003-01-16 2006-10-24 Metrosol, Inc. Broad band referencing reflectometer
US7264220B2 (en) * 2004-10-01 2007-09-04 Flir Systems, Inc. Gimbal system
US7518728B2 (en) * 2005-09-30 2009-04-14 Intel Corporation Method and instrument for collecting fourier transform (FT) Raman spectra for imaging applications
US7277819B2 (en) * 2005-10-31 2007-10-02 Eastman Kodak Company Measuring layer thickness or composition changes

Also Published As

Publication number Publication date
US7980758B2 (en) 2011-07-19
FR2887029A1 (fr) 2006-12-15
WO2006131656A2 (fr) 2006-12-14
US20080224044A1 (en) 2008-09-18
EP1889041A2 (fr) 2008-02-20
WO2006131656A3 (fr) 2007-02-01

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Effective date: 20150227