FR2881834B1 - Procede et systeme de test ou de mesure d'elements electriques, au moyen de deux impulsions decalees - Google Patents

Procede et systeme de test ou de mesure d'elements electriques, au moyen de deux impulsions decalees

Info

Publication number
FR2881834B1
FR2881834B1 FR0501099A FR0501099A FR2881834B1 FR 2881834 B1 FR2881834 B1 FR 2881834B1 FR 0501099 A FR0501099 A FR 0501099A FR 0501099 A FR0501099 A FR 0501099A FR 2881834 B1 FR2881834 B1 FR 2881834B1
Authority
FR
France
Prior art keywords
testing
electrical elements
measuring electrical
offset pulses
pulses
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0501099A
Other languages
English (en)
Other versions
FR2881834A1 (fr
Inventor
Christophe Vaucher
Pierre Benech
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beamind SAS
Original Assignee
Beamind SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to FR0501099A priority Critical patent/FR2881834B1/fr
Application filed by Beamind SAS filed Critical Beamind SAS
Priority to PCT/FR2006/000154 priority patent/WO2006082293A1/fr
Priority to JP2007553640A priority patent/JP2008529022A/ja
Priority to EP06709153A priority patent/EP1844344A1/fr
Priority to KR1020077020185A priority patent/KR20070104453A/ko
Priority to CNA200680004084XA priority patent/CN101116002A/zh
Priority to TW095103182A priority patent/TW200643448A/zh
Publication of FR2881834A1 publication Critical patent/FR2881834A1/fr
Application granted granted Critical
Publication of FR2881834B1 publication Critical patent/FR2881834B1/fr
Priority to US11/833,392 priority patent/US20080006427A1/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • G01R31/307—Contactless testing using electron beams of integrated circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
FR0501099A 2005-02-04 2005-02-04 Procede et systeme de test ou de mesure d'elements electriques, au moyen de deux impulsions decalees Expired - Fee Related FR2881834B1 (fr)

Priority Applications (8)

Application Number Priority Date Filing Date Title
FR0501099A FR2881834B1 (fr) 2005-02-04 2005-02-04 Procede et systeme de test ou de mesure d'elements electriques, au moyen de deux impulsions decalees
JP2007553640A JP2008529022A (ja) 2005-02-04 2006-01-24 ２つのオフセットパルスを使用して電気素子を試験または測定するための方法およびシステム
EP06709153A EP1844344A1 (fr) 2005-02-04 2006-01-24 Procede et systeme de test ou de mesure d'elements electriques, au moyen de deux impulsions decalees
KR1020077020185A KR20070104453A (ko) 2005-02-04 2006-01-24 두 개의 오프셋 펄스를 사용하여, 전기 소자를 시험하거나측정하는 방법 및 시스템
PCT/FR2006/000154 WO2006082293A1 (fr) 2005-02-04 2006-01-24 Procede et systeme de test ou de mesure d'elements electriques, au moyen de deux impulsions decalees
CNA200680004084XA CN101116002A (zh) 2005-02-04 2006-01-24 利用两个位移脉冲来测试或测量电气元件之方法及系统
TW095103182A TW200643448A (en) 2005-02-04 2006-01-26 Method and system for testing or measuring electric elements, by means of two shifted pulses
US11/833,392 US20080006427A1 (en) 2005-02-04 2007-08-03 Method and System for Testing or Measuring Electrical Elements, Using Two Offset Pulses

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0501099A FR2881834B1 (fr) 2005-02-04 2005-02-04 Procede et systeme de test ou de mesure d'elements electriques, au moyen de deux impulsions decalees

Publications (2)

Publication Number Publication Date
FR2881834A1 FR2881834A1 (fr) 2006-08-11
FR2881834B1 true FR2881834B1 (fr) 2007-05-11

Family

ID=35045456

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0501099A Expired - Fee Related FR2881834B1 (fr) 2005-02-04 2005-02-04 Procede et systeme de test ou de mesure d'elements electriques, au moyen de deux impulsions decalees

Country Status (8)

Country Link
US (1) US20080006427A1 (fr)
EP (1) EP1844344A1 (fr)
JP (1) JP2008529022A (fr)
KR (1) KR20070104453A (fr)
CN (1) CN101116002A (fr)
FR (1) FR2881834B1 (fr)
TW (1) TW200643448A (fr)
WO (1) WO2006082293A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023217354A1 (fr) * 2022-05-10 2023-11-16 Applied Materials, Inc. Procédé et appareil de test de substrat d'encapsulation

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6369591B1 (en) * 1999-01-14 2002-04-09 Maniatech Incorporated Apparatus and method using photoelectric effect for testing electrical traces
FR2801680B3 (fr) * 1999-11-26 2002-02-15 Christophe Vaucher Methode de test electrique de la conformite de l'interconnexion de conducteurs electriques disposes sur un substrat, sans contact et sans outillage
KR100877243B1 (ko) * 2001-02-19 2009-01-07 니혼 덴산 리드 가부시끼가이샤 회로 기판 검사 장치 및 회로 기판을 검사하기 위한 방법

Also Published As

Publication number Publication date
EP1844344A1 (fr) 2007-10-17
TW200643448A (en) 2006-12-16
JP2008529022A (ja) 2008-07-31
WO2006082293A1 (fr) 2006-08-10
KR20070104453A (ko) 2007-10-25
CN101116002A (zh) 2008-01-30
FR2881834A1 (fr) 2006-08-11
US20080006427A1 (en) 2008-01-10

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20091030