FR2881832B1 - Procede de test de conducteurs electriques par effet photoelectrique, au moyen d'une plaque separatrice - Google Patents
Procede de test de conducteurs electriques par effet photoelectrique, au moyen d'une plaque separatriceInfo
- Publication number
- FR2881832B1 FR2881832B1 FR0501093A FR0501093A FR2881832B1 FR 2881832 B1 FR2881832 B1 FR 2881832B1 FR 0501093 A FR0501093 A FR 0501093A FR 0501093 A FR0501093 A FR 0501093A FR 2881832 B1 FR2881832 B1 FR 2881832B1
- Authority
- FR
- France
- Prior art keywords
- electrical conductors
- separating plate
- photoelectric effect
- testing electrical
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004020 conductor Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0501093A FR2881832B1 (fr) | 2005-02-04 | 2005-02-04 | Procede de test de conducteurs electriques par effet photoelectrique, au moyen d'une plaque separatrice |
EP06709156A EP1844345A1 (fr) | 2005-02-04 | 2006-01-24 | Procede de test de conducteurs electriques par effet photoelectrique, au moyen d'une plaque separatrice |
PCT/FR2006/000157 WO2006082295A1 (fr) | 2005-02-04 | 2006-01-24 | Procede de test de conducteurs electriques par effet photoelectrique, au moyen d'une plaque separatrice |
TW095103190A TW200641378A (en) | 2005-02-04 | 2006-01-26 | Method for testing electrical conductors by photoelectric effect, by means of a separator plate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0501093A FR2881832B1 (fr) | 2005-02-04 | 2005-02-04 | Procede de test de conducteurs electriques par effet photoelectrique, au moyen d'une plaque separatrice |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2881832A1 FR2881832A1 (fr) | 2006-08-11 |
FR2881832B1 true FR2881832B1 (fr) | 2007-04-20 |
Family
ID=35045332
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR0501093A Expired - Fee Related FR2881832B1 (fr) | 2005-02-04 | 2005-02-04 | Procede de test de conducteurs electriques par effet photoelectrique, au moyen d'une plaque separatrice |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP1844345A1 (fr) |
FR (1) | FR2881832B1 (fr) |
TW (1) | TW200641378A (fr) |
WO (1) | WO2006082295A1 (fr) |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6089050A (ja) * | 1983-10-20 | 1985-05-18 | Toshiba Corp | ストロボ走査電子顕微鏡 |
EP0264481B1 (fr) * | 1986-10-23 | 1992-05-13 | International Business Machines Corporation | Procédé de test dans le vide pour substrats de circuits intégrés employant un laser |
JPS63231858A (ja) * | 1987-03-20 | 1988-09-27 | Hitachi Ltd | 電子ビ−ム装置 |
FR2801680B3 (fr) * | 1999-11-26 | 2002-02-15 | Christophe Vaucher | Methode de test electrique de la conformite de l'interconnexion de conducteurs electriques disposes sur un substrat, sans contact et sans outillage |
KR100877243B1 (ko) * | 2001-02-19 | 2009-01-07 | 니혼 덴산 리드 가부시끼가이샤 | 회로 기판 검사 장치 및 회로 기판을 검사하기 위한 방법 |
-
2005
- 2005-02-04 FR FR0501093A patent/FR2881832B1/fr not_active Expired - Fee Related
-
2006
- 2006-01-24 EP EP06709156A patent/EP1844345A1/fr not_active Withdrawn
- 2006-01-24 WO PCT/FR2006/000157 patent/WO2006082295A1/fr active Application Filing
- 2006-01-26 TW TW095103190A patent/TW200641378A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
WO2006082295A1 (fr) | 2006-08-10 |
TW200641378A (en) | 2006-12-01 |
EP1844345A1 (fr) | 2007-10-17 |
FR2881832A1 (fr) | 2006-08-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20091030 |