FR2854241B1 - DEVICE AND METHOD FOR MEASURING A CONCENTRATION OF POLLUTANT COMPOUNDS IN A GASEOUS EFFLUENT, COMPRISING A SEMICONDUCTOR DETECTOR - Google Patents

DEVICE AND METHOD FOR MEASURING A CONCENTRATION OF POLLUTANT COMPOUNDS IN A GASEOUS EFFLUENT, COMPRISING A SEMICONDUCTOR DETECTOR

Info

Publication number
FR2854241B1
FR2854241B1 FR0304949A FR0304949A FR2854241B1 FR 2854241 B1 FR2854241 B1 FR 2854241B1 FR 0304949 A FR0304949 A FR 0304949A FR 0304949 A FR0304949 A FR 0304949A FR 2854241 B1 FR2854241 B1 FR 2854241B1
Authority
FR
France
Prior art keywords
concentration
measuring
gaseous effluent
semiconductor detector
pollutant compounds
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0304949A
Other languages
French (fr)
Other versions
FR2854241A1 (en
Inventor
Joel Brulefer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renault SAS
Original Assignee
Renault SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renault SAS filed Critical Renault SAS
Priority to FR0304949A priority Critical patent/FR2854241B1/en
Priority to EP04742469A priority patent/EP1616175A2/en
Priority to PCT/FR2004/000883 priority patent/WO2004097399A2/en
Publication of FR2854241A1 publication Critical patent/FR2854241A1/en
Application granted granted Critical
Publication of FR2854241B1 publication Critical patent/FR2854241B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0011—Sample conditioning
    • G01N33/0016—Sample conditioning by regulating a physical variable, e.g. pressure or temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0011—Sample conditioning
    • G01N33/0018—Sample conditioning by diluting a gas

Landscapes

  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Combustion & Propulsion (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
FR0304949A 2003-04-23 2003-04-23 DEVICE AND METHOD FOR MEASURING A CONCENTRATION OF POLLUTANT COMPOUNDS IN A GASEOUS EFFLUENT, COMPRISING A SEMICONDUCTOR DETECTOR Expired - Fee Related FR2854241B1 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FR0304949A FR2854241B1 (en) 2003-04-23 2003-04-23 DEVICE AND METHOD FOR MEASURING A CONCENTRATION OF POLLUTANT COMPOUNDS IN A GASEOUS EFFLUENT, COMPRISING A SEMICONDUCTOR DETECTOR
EP04742469A EP1616175A2 (en) 2003-04-23 2004-04-09 Device and method for measuring the concentration of a pollutant in gaseous effluents
PCT/FR2004/000883 WO2004097399A2 (en) 2003-04-23 2004-04-09 Device and method for measuring the concentration of a pollutant in gaseous effluents

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0304949A FR2854241B1 (en) 2003-04-23 2003-04-23 DEVICE AND METHOD FOR MEASURING A CONCENTRATION OF POLLUTANT COMPOUNDS IN A GASEOUS EFFLUENT, COMPRISING A SEMICONDUCTOR DETECTOR

Publications (2)

Publication Number Publication Date
FR2854241A1 FR2854241A1 (en) 2004-10-29
FR2854241B1 true FR2854241B1 (en) 2005-07-15

Family

ID=33104323

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0304949A Expired - Fee Related FR2854241B1 (en) 2003-04-23 2003-04-23 DEVICE AND METHOD FOR MEASURING A CONCENTRATION OF POLLUTANT COMPOUNDS IN A GASEOUS EFFLUENT, COMPRISING A SEMICONDUCTOR DETECTOR

Country Status (1)

Country Link
FR (1) FR2854241B1 (en)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4402910A (en) * 1981-06-15 1983-09-06 Exlog Smith Gas sampling system
JP3688074B2 (en) * 1996-08-29 2005-08-24 フィガロ技研株式会社 Gas sensor
US6493638B1 (en) * 2000-03-01 2002-12-10 Raytheon Company Sensor apparatus for measuring volatile organic compounds

Also Published As

Publication number Publication date
FR2854241A1 (en) 2004-10-29

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20131231