FR2827959B1 - DEVICE AND METHOD FOR MEASURING A SAMPLE BY CORRELATION SPECTROSCOPY - Google Patents

DEVICE AND METHOD FOR MEASURING A SAMPLE BY CORRELATION SPECTROSCOPY

Info

Publication number
FR2827959B1
FR2827959B1 FR0110017A FR0110017A FR2827959B1 FR 2827959 B1 FR2827959 B1 FR 2827959B1 FR 0110017 A FR0110017 A FR 0110017A FR 0110017 A FR0110017 A FR 0110017A FR 2827959 B1 FR2827959 B1 FR 2827959B1
Authority
FR
France
Prior art keywords
sample
measuring
correlation spectroscopy
spectroscopy
correlation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0110017A
Other languages
French (fr)
Other versions
FR2827959A1 (en
Inventor
Herve Rigneault
Pierre Francois Lenne
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Original Assignee
Centre National de la Recherche Scientifique CNRS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS filed Critical Centre National de la Recherche Scientifique CNRS
Priority to FR0110017A priority Critical patent/FR2827959B1/en
Priority to PCT/FR2002/002696 priority patent/WO2003010523A1/en
Publication of FR2827959A1 publication Critical patent/FR2827959A1/en
Application granted granted Critical
Publication of FR2827959B1 publication Critical patent/FR2827959B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • G01J3/4406—Fluorescence spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/457—Correlation spectrometry, e.g. of the intensity

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Optics & Photonics (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
FR0110017A 2001-07-26 2001-07-26 DEVICE AND METHOD FOR MEASURING A SAMPLE BY CORRELATION SPECTROSCOPY Expired - Fee Related FR2827959B1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR0110017A FR2827959B1 (en) 2001-07-26 2001-07-26 DEVICE AND METHOD FOR MEASURING A SAMPLE BY CORRELATION SPECTROSCOPY
PCT/FR2002/002696 WO2003010523A1 (en) 2001-07-26 2002-07-26 Device and method for measuring a sample by correlation spectroscopy

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0110017A FR2827959B1 (en) 2001-07-26 2001-07-26 DEVICE AND METHOD FOR MEASURING A SAMPLE BY CORRELATION SPECTROSCOPY

Publications (2)

Publication Number Publication Date
FR2827959A1 FR2827959A1 (en) 2003-01-31
FR2827959B1 true FR2827959B1 (en) 2004-03-19

Family

ID=8865953

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0110017A Expired - Fee Related FR2827959B1 (en) 2001-07-26 2001-07-26 DEVICE AND METHOD FOR MEASURING A SAMPLE BY CORRELATION SPECTROSCOPY

Country Status (2)

Country Link
FR (1) FR2827959B1 (en)
WO (1) WO2003010523A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7285789B2 (en) * 2003-06-06 2007-10-23 Oc Oerlikon Balzers Ag Optical device for surface-generated fluorescence
US7625679B2 (en) 2005-09-23 2009-12-01 Applied Materials, Inc. Method of aligning a particle-beam-generated pattern to a pattern on a pre-patterned substrate
US7388213B2 (en) 2005-09-23 2008-06-17 Applied Materials, Inc. Method of registering a blank substrate to a pattern generating particle beam apparatus and of correcting alignment during pattern generation
FR2954499B1 (en) 2009-12-22 2012-02-03 Centre Nat Rech Scient METHOD AND SYSTEM FOR MOLECULAR ANALYSIS SWITCHING IMAGING AND SPECTROSCOPY MEASUREMENTS
DE102016013236B4 (en) * 2016-11-07 2020-07-16 Particle Metrix Gmbh Device and method for measuring the concentration, size and zeta potential of nanoparticles in liquids in the scattered light mode and in the fluorescence mode

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4545646A (en) * 1983-09-02 1985-10-08 Hughes Aircraft Company Process for forming a graded index optical material and structures formed thereby
US4621911A (en) * 1985-03-12 1986-11-11 Carnegie-Mellon University Standing wave luminescence microscopy
US5394268A (en) * 1993-02-05 1995-02-28 Carnegie Mellon University Field synthesis and optical subsectioning for standing wave microscopy
DE19630956A1 (en) * 1996-07-31 1998-02-05 Basf Ag Method and device for Raman correlation spectroscopy
DK0941466T3 (en) * 1996-11-27 2004-03-01 Max Planck Gesellschaft Method and apparatus for determining predetermined properties of target particles in a sample medium
WO1999002974A1 (en) * 1997-07-10 1999-01-21 Ruprecht-Karls-Universität Heidelberg Wave field microscope, method for a wave field microscope, including for dna sequencing, and calibration method for wave field microscopy

Also Published As

Publication number Publication date
FR2827959A1 (en) 2003-01-31
WO2003010523A1 (en) 2003-02-06

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Legal Events

Date Code Title Description
ST Notification of lapse