FR2811464B1 - MEMORY CIRCUIT COMPRISING RESCUE CELLS - Google Patents

MEMORY CIRCUIT COMPRISING RESCUE CELLS

Info

Publication number
FR2811464B1
FR2811464B1 FR0008746A FR0008746A FR2811464B1 FR 2811464 B1 FR2811464 B1 FR 2811464B1 FR 0008746 A FR0008746 A FR 0008746A FR 0008746 A FR0008746 A FR 0008746A FR 2811464 B1 FR2811464 B1 FR 2811464B1
Authority
FR
France
Prior art keywords
memory circuit
rescue cells
rescue
cells
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0008746A
Other languages
French (fr)
Other versions
FR2811464A1 (en
Inventor
Richard Ferrant
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
STMicroelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SA filed Critical STMicroelectronics SA
Priority to FR0008746A priority Critical patent/FR2811464B1/en
Publication of FR2811464A1 publication Critical patent/FR2811464A1/en
Application granted granted Critical
Publication of FR2811464B1 publication Critical patent/FR2811464B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
    • G11C29/808—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout using a flexible replacement scheme
FR0008746A 2000-07-05 2000-07-05 MEMORY CIRCUIT COMPRISING RESCUE CELLS Expired - Fee Related FR2811464B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR0008746A FR2811464B1 (en) 2000-07-05 2000-07-05 MEMORY CIRCUIT COMPRISING RESCUE CELLS

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0008746A FR2811464B1 (en) 2000-07-05 2000-07-05 MEMORY CIRCUIT COMPRISING RESCUE CELLS

Publications (2)

Publication Number Publication Date
FR2811464A1 FR2811464A1 (en) 2002-01-11
FR2811464B1 true FR2811464B1 (en) 2005-03-25

Family

ID=8852136

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0008746A Expired - Fee Related FR2811464B1 (en) 2000-07-05 2000-07-05 MEMORY CIRCUIT COMPRISING RESCUE CELLS

Country Status (1)

Country Link
FR (1) FR2811464B1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE60320745D1 (en) * 2003-02-12 2008-06-19 Infineon Technologies Ag Process and Memory Built-In Self Repair (MBISR) to repair a memory

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR910005601B1 (en) * 1989-05-24 1991-07-31 삼성전자주식회사 Semiconductor memory device having redundunt block
JP3351595B2 (en) * 1993-12-22 2002-11-25 株式会社日立製作所 Semiconductor memory device
JP2000100195A (en) * 1998-09-22 2000-04-07 Nec Corp Semiconductor storage device with redundant circuit

Also Published As

Publication number Publication date
FR2811464A1 (en) 2002-01-11

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20080331