FR2783111B1 - Circuit integre comportant une cellule de test modifiee pour resynchroniser ledit circuit integre - Google Patents
Circuit integre comportant une cellule de test modifiee pour resynchroniser ledit circuit integreInfo
- Publication number
- FR2783111B1 FR2783111B1 FR9811384A FR9811384A FR2783111B1 FR 2783111 B1 FR2783111 B1 FR 2783111B1 FR 9811384 A FR9811384 A FR 9811384A FR 9811384 A FR9811384 A FR 9811384A FR 2783111 B1 FR2783111 B1 FR 2783111B1
- Authority
- FR
- France
- Prior art keywords
- integrated circuit
- resynchronize
- test cell
- modified test
- circuit including
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318541—Scan latches or cell details
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9811384A FR2783111B1 (fr) | 1998-09-08 | 1998-09-08 | Circuit integre comportant une cellule de test modifiee pour resynchroniser ledit circuit integre |
US09/392,036 US6415401B1 (en) | 1998-09-08 | 1999-09-08 | Integrated circuit having a test cell that resynchronizes the integrated circuit |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9811384A FR2783111B1 (fr) | 1998-09-08 | 1998-09-08 | Circuit integre comportant une cellule de test modifiee pour resynchroniser ledit circuit integre |
US09/392,036 US6415401B1 (en) | 1998-09-08 | 1999-09-08 | Integrated circuit having a test cell that resynchronizes the integrated circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2783111A1 FR2783111A1 (fr) | 2000-03-10 |
FR2783111B1 true FR2783111B1 (fr) | 2000-10-13 |
Family
ID=26234542
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9811384A Expired - Fee Related FR2783111B1 (fr) | 1998-09-08 | 1998-09-08 | Circuit integre comportant une cellule de test modifiee pour resynchroniser ledit circuit integre |
Country Status (2)
Country | Link |
---|---|
US (1) | US6415401B1 (fr) |
FR (1) | FR2783111B1 (fr) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9666302B1 (en) * | 2015-12-28 | 2017-05-30 | Taiwan Semiconductor Manufacturing Co., Ltd. | System and method for memory scan design-for-test |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6125230A (ja) * | 1984-07-13 | 1986-02-04 | Sony Corp | Ic装置 |
JPS6125229A (ja) * | 1984-07-13 | 1986-02-04 | Sony Corp | Ic装置 |
EP0358365B1 (fr) * | 1988-09-07 | 1998-10-21 | Texas Instruments Incorporated | Tampon/registre de test |
US5221865A (en) * | 1991-06-21 | 1993-06-22 | Crosspoint Solutions, Inc. | Programmable input/output buffer circuit with test capability |
US5615217A (en) * | 1994-12-01 | 1997-03-25 | International Business Machines Corporation | Boundary-scan bypass circuit for integrated circuit electronic component and circuit boards incorporating such circuits and components |
-
1998
- 1998-09-08 FR FR9811384A patent/FR2783111B1/fr not_active Expired - Fee Related
-
1999
- 1999-09-08 US US09/392,036 patent/US6415401B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
FR2783111A1 (fr) | 2000-03-10 |
US6415401B1 (en) | 2002-07-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ID26974A (id) | Ketoenol siklik arilfenil-tersubstitusi | |
DE19882678T1 (de) | Synchrone Schaltvorrichtung | |
DE19980447D2 (de) | Solarzellenanordnung | |
DE69832985D1 (de) | Multiplizier-Akkumulatorschaltungen | |
NO20000747D0 (no) | Forgassingsreaktor | |
DE69940291D1 (de) | Weltraumsolarzelle | |
DE69942942D1 (de) | Schaltanordnung | |
DE69903248D1 (de) | Leitfähige zusammensetzung | |
DE69907918D1 (de) | Solarzellen-BAUELEMENT | |
DE69833595D1 (de) | Synchrone Verzögerungsschaltung | |
DE69943248D1 (de) | Doppelmonochromator | |
MA25271A1 (fr) | Saponines antiprotozaires | |
LU90200B1 (de) | Schaltelement in Folienbauweise | |
NO993443D0 (no) | Kabinstruktur | |
DE69902363D1 (de) | Wägeeinrichtung | |
ATE269106T1 (de) | Glycolipid-cremes | |
DE69840993D1 (de) | Synchrone Verzögerungsschaltung | |
DE69918236D1 (de) | Rückseitig beleuchtbare Monoblock Zeiger-Einheit | |
DE69917909D1 (de) | Elektroden | |
FR2783111B1 (fr) | Circuit integre comportant une cellule de test modifiee pour resynchroniser ledit circuit integre | |
NO991216D0 (no) | Elektrisk kopling | |
DE59907448D1 (de) | Flüssigkeitsmesszelle | |
DE59904743D1 (de) | Exzenteranordnung | |
FR2779542B1 (fr) | Circuit integre comportant au moins deux memoires | |
FI980440A (fi) | Tuotantosolu |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20080531 |