FR2666917B1 - DUAL ACCESS STORAGE DEVICE. - Google Patents

DUAL ACCESS STORAGE DEVICE.

Info

Publication number
FR2666917B1
FR2666917B1 FR9011389A FR9011389A FR2666917B1 FR 2666917 B1 FR2666917 B1 FR 2666917B1 FR 9011389 A FR9011389 A FR 9011389A FR 9011389 A FR9011389 A FR 9011389A FR 2666917 B1 FR2666917 B1 FR 2666917B1
Authority
FR
France
Prior art keywords
storage device
access storage
dual access
dual
storage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
FR9011389A
Other languages
French (fr)
Other versions
FR2666917A1 (en
Inventor
Jang-Kyu Lee
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of FR2666917A1 publication Critical patent/FR2666917A1/en
Application granted granted Critical
Publication of FR2666917B1 publication Critical patent/FR2666917B1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70Masking faults in memories by using spares or by reconfiguring
    • G11C29/78Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/80Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
    • G11C29/816Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for an application-specific layout
    • G11C29/818Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for an application-specific layout for dual-port memories
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1075Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers for multiport memories each having random access ports and serial ports, e.g. video RAM
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70Masking faults in memories by using spares or by reconfiguring
    • G11C29/86Masking faults in memories by using spares or by reconfiguring in serial access memories, e.g. shift registers, CCDs, bubble memories
FR9011389A 1990-09-14 1990-09-14 DUAL ACCESS STORAGE DEVICE. Expired - Lifetime FR2666917B1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9020183A GB2247965B (en) 1990-09-14 1990-09-14 Dual-port memory device

Publications (2)

Publication Number Publication Date
FR2666917A1 FR2666917A1 (en) 1992-03-20
FR2666917B1 true FR2666917B1 (en) 1994-02-18

Family

ID=10682252

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9011389A Expired - Lifetime FR2666917B1 (en) 1990-09-14 1990-09-14 DUAL ACCESS STORAGE DEVICE.

Country Status (3)

Country Link
DE (1) DE4029247C2 (en)
FR (1) FR2666917B1 (en)
GB (1) GB2247965B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5646896A (en) * 1995-10-31 1997-07-08 Hyundai Electronics America Memory device with reduced number of fuses

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0150194A4 (en) * 1983-07-14 1988-04-26 Advanced Micro Devices Inc A byte wide memory circuit having a column redundancy circuit.
JPS6148200A (en) * 1984-08-14 1986-03-08 Fujitsu Ltd Semiconductor memory device
EP0523760B1 (en) * 1985-01-22 1997-06-04 Texas Instruments Incorporated Serial accessed semiconductor memory
US4719601A (en) * 1986-05-02 1988-01-12 International Business Machine Corporation Column redundancy for two port random access memory
JPH0283899A (en) * 1988-09-20 1990-03-23 Fujitsu Ltd Semiconductor memory
JPH0289299A (en) * 1988-09-27 1990-03-29 Nec Corp Semiconductor storage device

Also Published As

Publication number Publication date
GB2247965A (en) 1992-03-18
GB2247965B (en) 1994-08-24
FR2666917A1 (en) 1992-03-20
DE4029247A1 (en) 1992-03-19
DE4029247C2 (en) 1994-04-14
GB9020183D0 (en) 1990-10-24

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