FR2613084B1 - Dispositif electro-optique d'echantillonnage a effet pockels et son procede de mise en oeuvre - Google Patents

Dispositif electro-optique d'echantillonnage a effet pockels et son procede de mise en oeuvre

Info

Publication number
FR2613084B1
FR2613084B1 FR888803827A FR8803827A FR2613084B1 FR 2613084 B1 FR2613084 B1 FR 2613084B1 FR 888803827 A FR888803827 A FR 888803827A FR 8803827 A FR8803827 A FR 8803827A FR 2613084 B1 FR2613084 B1 FR 2613084B1
Authority
FR
France
Prior art keywords
pockel
electro
optical
sampling device
implementing method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR888803827A
Other languages
English (en)
Other versions
FR2613084A1 (fr
Inventor
Keith W Forsyth
Philippe Bado
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Princeton Applied Research Corp
University of Rochester
Original Assignee
Princeton Applied Research Corp
University of Rochester
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Princeton Applied Research Corp, University of Rochester filed Critical Princeton Applied Research Corp
Publication of FR2613084A1 publication Critical patent/FR2613084A1/fr
Application granted granted Critical
Publication of FR2613084B1 publication Critical patent/FR2613084B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/347—Circuits for representing a single waveform by sampling, e.g. for very high frequencies using electro-optic elements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
FR888803827A 1987-03-24 1988-03-23 Dispositif electro-optique d'echantillonnage a effet pockels et son procede de mise en oeuvre Expired - Fee Related FR2613084B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/029,835 US4910458A (en) 1987-03-24 1987-03-24 Electro-optic sampling system with dedicated electro-optic crystal and removable sample carrier

Publications (2)

Publication Number Publication Date
FR2613084A1 FR2613084A1 (fr) 1988-09-30
FR2613084B1 true FR2613084B1 (fr) 1990-11-23

Family

ID=21851148

Family Applications (1)

Application Number Title Priority Date Filing Date
FR888803827A Expired - Fee Related FR2613084B1 (fr) 1987-03-24 1988-03-23 Dispositif electro-optique d'echantillonnage a effet pockels et son procede de mise en oeuvre

Country Status (5)

Country Link
US (1) US4910458A (fr)
JP (1) JPS63298167A (fr)
DE (1) DE3809977A1 (fr)
FR (1) FR2613084B1 (fr)
GB (1) GB2202639A (fr)

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0264482B1 (fr) * 1986-10-23 1991-12-18 International Business Machines Corporation Procédé de test sans contact sous conditions atmosphériques pour substrats de circuits intégrés
JP2564148B2 (ja) * 1987-10-13 1996-12-18 浜松ホトニクス株式会社 電圧検出装置
US4975635A (en) * 1987-11-05 1990-12-04 Hironori Takahashi Voltage detector using a sampling type high-speed photodetector
US5142224A (en) * 1988-12-13 1992-08-25 Comsat Non-destructive semiconductor wafer probing system using laser pulses to generate and detect millimeter wave signals
DK0392830T3 (da) * 1989-04-12 1994-10-24 Hamamatsu Photonics Kk Fremgangsmåde og apparat til detektering af spænding
US4910454A (en) * 1989-05-23 1990-03-20 The University Of Rochester System for electrical signal sampling with ultrashort optical pulses
US4928058A (en) * 1989-05-23 1990-05-22 The University Of Rochester Electro-optic signal measurement
US5124635A (en) * 1990-02-15 1992-06-23 Photon Dynamics, Inc. Voltage imaging system using electro-optics
US5097201A (en) * 1990-02-15 1992-03-17 Photon Dynamics, Inc. Voltage imaging system using electro-optics
US4983911A (en) * 1990-02-15 1991-01-08 Photon Dynamics, Inc. Voltage imaging system using electro-optics
US5170127A (en) * 1991-02-19 1992-12-08 Photon Dynamics, Inc. Capacitance imaging system using electro-optics
US5432461A (en) * 1991-06-28 1995-07-11 Photon Dynamics, Inc. Method of testing active matrix liquid crystal display substrates
US5444385A (en) * 1991-09-10 1995-08-22 Photon Dynamics, Inc. Testing apparatus for liquid crystal display substrates
US5459409A (en) * 1991-09-10 1995-10-17 Photon Dynamics, Inc. Testing device for liquid crystal display base plate
US5465052A (en) * 1991-09-10 1995-11-07 Photon Dynamics, Inc. Method of testing liquid crystal display substrates
US5406213A (en) * 1991-09-10 1995-04-11 Photon Dynamics, Inc. Instrument for testing liquid crystal display base plates
US5543729A (en) * 1991-09-10 1996-08-06 Photon Dynamics, Inc. Testing apparatus and connector for liquid crystal display substrates
US5504438A (en) * 1991-09-10 1996-04-02 Photon Dynamics, Inc. Testing method for imaging defects in a liquid crystal display substrate
US5931159A (en) * 1995-09-09 1999-08-03 Origin Medical Instrument Co., Ltd. Lung ventilator
US6446867B1 (en) * 1995-11-22 2002-09-10 Jorge Sanchez Electro-optic interface system and method of operation
WO1997045747A1 (fr) * 1996-05-31 1997-12-04 Rensselaer Polytechnic Institute Dispositif electro-optique et magneto-optique et procede pour deceler le rayonnement electromagnetique dans l'espace libre
US5952818A (en) * 1996-05-31 1999-09-14 Rensselaer Polytechnic Institute Electro-optical sensing apparatus and method for characterizing free-space electromagnetic radiation
US6414473B1 (en) 1996-05-31 2002-07-02 Rensselaer Polytechnic Institute Electro-optic/magneto-optic measurement of electromagnetic radiation using chirped optical pulse
US6373260B1 (en) * 1998-02-24 2002-04-16 Agilent Technologies, Inc. Single cable, single point, stimulus and response probing system and method
US6178032B1 (en) * 1999-05-21 2001-01-23 Chung-Shan Institute Of Science And Technology Intensity modulator with optimum extinction ratio of an output optic pulse
US6573699B1 (en) * 1999-10-05 2003-06-03 Fujitsu Limited Device for measuring electric current by use of electro-optical crystal
US6573737B1 (en) * 2000-03-10 2003-06-03 The Trustees Of Princeton University Method and apparatus for non-contact measurement of electrical properties of materials
US6900710B2 (en) * 2001-04-10 2005-05-31 Picosecond Pulse Labs Ultrafast sampler with non-parallel shockline
US7084716B2 (en) 2001-04-10 2006-08-01 Picosecond Pulse Labs Ultrafast sampler with coaxial transition
US20040145381A1 (en) * 2001-12-28 2004-07-29 Jun Su Test fixture for die-level testing of planar lightwave circuits
US7505498B2 (en) 2002-01-08 2009-03-17 Jorge Sanchez Apparatus and method for measurement for dynamic laser signals
US7358834B1 (en) 2002-08-29 2008-04-15 Picosecond Pulse Labs Transmission line voltage controlled nonlinear signal processors
US7612629B2 (en) * 2006-05-26 2009-11-03 Picosecond Pulse Labs Biased nonlinear transmission line comb generators
FR2996958B1 (fr) * 2012-10-11 2014-12-26 Thales Sa Dispositif d'echantillonnage electro-optique d'un signal hyperfrequence
US10707968B2 (en) 2018-09-19 2020-07-07 Rohde & Schwarz Gmbh & Co. Kg Frequency comb generating device and method for generating a frequency comb
RU202151U1 (ru) * 2020-08-20 2021-02-04 Публичное акционерное общество "Межрегиональная распределительная сетевая компания Северо-Запада" Оптический датчик тока

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4446425A (en) * 1982-02-12 1984-05-01 The University Of Rochester Measurement of electrical signals with picosecond resolution
US4434399A (en) * 1982-05-14 1984-02-28 The University Of Rochester Electron-optical wide band signal measurement system
US4618819A (en) * 1984-03-27 1986-10-21 The University Of Rochester Measurement of electrical signals with subpicosecond resolution
US4603293A (en) * 1984-03-27 1986-07-29 University Of Rochester Measurement of electrical signals with subpicosecond resolution
US4681449A (en) * 1984-09-07 1987-07-21 Stanford University High speed testing of electronic circuits by electro-optic sampling

Also Published As

Publication number Publication date
JPS63298167A (ja) 1988-12-05
FR2613084A1 (fr) 1988-09-30
US4910458A (en) 1990-03-20
GB8806947D0 (en) 1988-04-27
DE3809977A1 (de) 1988-10-06
GB2202639A (en) 1988-09-28

Similar Documents

Publication Publication Date Title
FR2613084B1 (fr) Dispositif electro-optique d'echantillonnage a effet pockels et son procede de mise en oeuvre
FR2610214B1 (fr) Procede et dispositif de filtration
FR2599978B1 (fr) Dispositif et procede de maintien en place d'un catheter
FR2557245B1 (fr) Procede et dispositif d'etancheification pour arbres
FR2622022B1 (fr) Procede d'acquisition de donnees sismiques et dispositif de mise en oeuvre du procede
FR2632713B1 (fr) Dispositif a rafraichissement rapide et procede de mise en oeuvre de ce dispositif
FR2582553B1 (fr) Dispositif et procede de coulee de metal
LU80254A1 (fr) Procede d'ancrage d'elements et dispositif pour la mise en oeuvre de ce procede
FR2628768B1 (fr) Procede et dispositif de calandrage
FR2650806B1 (fr) Procede et dispositif d'amenee de bouteilles
FR2577724B1 (fr) Procede de mise en place pneumatique d'un filin dans un fourreau et dispositif de mise en oeuvre
FR2576649B1 (fr) Dispositif de butee d'embrayage tiree et procede de mise en place associe
FR2596877B1 (fr) Procede et dispositif de modulation acousto-optique multifrequences
FR2602885B1 (fr) Procede de prises de vues permettant d'enregistrer des spheres visuelles et dispositif pour sa mise en oeuvre
FR2572907B1 (fr) Procede d'invalidation de documents de valeur et le dispositif permettant la mise en oeuvre du procede
FR2634969B1 (fr) Procede pour l'arrosage de grandes surfaces et dispositif pour la mise en oeuvre de ce procede
FR2582843B3 (fr) Procede d'affichage et dispositif de mise en oeuvre
FR2612636B1 (fr) Procede et dispositif de controle de la force de tension d'un fil
FR2725032B1 (fr) Procede et dispositif de contre-mesure remorque pour aeronef
FR2607529B3 (fr) Dispositif pour la realisation de pavage et son procede de mise en oeuvre
FR2649210B1 (fr) Procede de reception d'impulsion de type m.l.s. et dispositif permettant la mise en oeuvre de ce procede
FR2552880B1 (fr) Procede et dispositif de reconstitution d'un signal analogique
FR2626975B1 (fr) Dispositif de bipoinconnement et procede pour sa mise en oeuvre
FR2583560B3 (fr) Procede d'affichage de symboles et dispositif de mise en oeuvre de ce procede
FR2629964B1 (fr) Procede et dispositif de discrimination de signal

Legal Events

Date Code Title Description
ST Notification of lapse