FR2608775B1 - Interface de test pour circuits imprimes nus - Google Patents

Interface de test pour circuits imprimes nus

Info

Publication number
FR2608775B1
FR2608775B1 FR8617878A FR8617878A FR2608775B1 FR 2608775 B1 FR2608775 B1 FR 2608775B1 FR 8617878 A FR8617878 A FR 8617878A FR 8617878 A FR8617878 A FR 8617878A FR 2608775 B1 FR2608775 B1 FR 2608775B1
Authority
FR
France
Prior art keywords
test interface
printed circuits
bare printed
bare
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8617878A
Other languages
English (en)
Other versions
FR2608775A1 (fr
Inventor
Jean-Pierre Simondin
Michel Aubineau
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thomson CSF SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson CSF SA filed Critical Thomson CSF SA
Priority to FR8617878A priority Critical patent/FR2608775B1/fr
Publication of FR2608775A1 publication Critical patent/FR2608775A1/fr
Application granted granted Critical
Publication of FR2608775B1 publication Critical patent/FR2608775B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
FR8617878A 1986-12-19 1986-12-19 Interface de test pour circuits imprimes nus Expired FR2608775B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8617878A FR2608775B1 (fr) 1986-12-19 1986-12-19 Interface de test pour circuits imprimes nus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8617878A FR2608775B1 (fr) 1986-12-19 1986-12-19 Interface de test pour circuits imprimes nus

Publications (2)

Publication Number Publication Date
FR2608775A1 FR2608775A1 (fr) 1988-06-24
FR2608775B1 true FR2608775B1 (fr) 1988-12-30

Family

ID=9342113

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8617878A Expired FR2608775B1 (fr) 1986-12-19 1986-12-19 Interface de test pour circuits imprimes nus

Country Status (1)

Country Link
FR (1) FR2608775B1 (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2634071B1 (fr) * 1988-07-08 1991-04-19 Thomson Csf Connecteur de test mobile pour circuits imprimes
FR2660072B1 (fr) * 1990-03-21 1992-07-24 Int Market Dev Appareil de test de circuit imprime.
US5421741A (en) * 1993-08-20 1995-06-06 Berg Technology, Inc. Electrical connection assembly
US6154863A (en) * 1996-10-28 2000-11-28 Atg Test Systems Gmbh Apparatus and method for testing non-componented printed circuit boards
DE19718637A1 (de) * 1997-05-02 1998-11-05 Atg Test Systems Gmbh Vorrichtung und Verfahren zum Prüfen von Leiterplatten
EP0902296A1 (fr) * 1997-09-11 1999-03-17 Photo Print Electronic GmbH Adaptateurs pour tester des circuits imprimés
WO2005091916A2 (fr) 2004-03-10 2005-10-06 Wentworth Laboratories, Inc. Transformateur de l'espace de microcircuit flexible
EP1995602B1 (fr) * 2007-05-23 2013-08-14 RRo Holding B.V. Panneau de sonde, élément de test, procédé de fabrication d'un panneau de sonde, et procédé de test pour une carte de circuit imprimé
DE102019002342A1 (de) * 2019-03-29 2020-10-01 Yamaichi Electronics Deutschland Gmbh Testvorrichtung und Verwendung der Testvorrichtung

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4056773A (en) * 1976-08-25 1977-11-01 Sullivan Donald F Printed circuit board open circuit tester
GB2156532B (en) * 1984-03-24 1988-07-20 Plessey Co Plc Apparatus for testing a printed circuit board

Also Published As

Publication number Publication date
FR2608775A1 (fr) 1988-06-24

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Legal Events

Date Code Title Description
ST Notification of lapse