FR2592958B1 - Procede et dispositif d'analyse de composants electroniques en contraste de potentiel. - Google Patents

Procede et dispositif d'analyse de composants electroniques en contraste de potentiel.

Info

Publication number
FR2592958B1
FR2592958B1 FR8600437A FR8600437A FR2592958B1 FR 2592958 B1 FR2592958 B1 FR 2592958B1 FR 8600437 A FR8600437 A FR 8600437A FR 8600437 A FR8600437 A FR 8600437A FR 2592958 B1 FR2592958 B1 FR 2592958B1
Authority
FR
France
Prior art keywords
contrast
potential
electronic components
analyzing electronic
analyzing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8600437A
Other languages
English (en)
Other versions
FR2592958A1 (fr
Inventor
Joel Bonnet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Societe des Telephones Ericsson SA
Original Assignee
Societe des Telephones Ericsson SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Societe des Telephones Ericsson SA filed Critical Societe des Telephones Ericsson SA
Priority to FR8600437A priority Critical patent/FR2592958B1/fr
Publication of FR2592958A1 publication Critical patent/FR2592958A1/fr
Application granted granted Critical
Publication of FR2592958B1 publication Critical patent/FR2592958B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
FR8600437A 1986-01-14 1986-01-14 Procede et dispositif d'analyse de composants electroniques en contraste de potentiel. Expired FR2592958B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8600437A FR2592958B1 (fr) 1986-01-14 1986-01-14 Procede et dispositif d'analyse de composants electroniques en contraste de potentiel.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8600437A FR2592958B1 (fr) 1986-01-14 1986-01-14 Procede et dispositif d'analyse de composants electroniques en contraste de potentiel.

Publications (2)

Publication Number Publication Date
FR2592958A1 FR2592958A1 (fr) 1987-07-17
FR2592958B1 true FR2592958B1 (fr) 1988-05-13

Family

ID=9331089

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8600437A Expired FR2592958B1 (fr) 1986-01-14 1986-01-14 Procede et dispositif d'analyse de composants electroniques en contraste de potentiel.

Country Status (1)

Country Link
FR (1) FR2592958B1 (fr)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07226426A (ja) * 1994-02-10 1995-08-22 Toshiba Corp 電子ビ−ムテスタ及び電子ビ−ムテスタを使用したテスト方法
US7468611B2 (en) * 2006-10-20 2008-12-23 Photon Dynamics, Inc. Continuous linear scanning of large flat panel media

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3796947A (en) * 1973-02-27 1974-03-12 Bell Telephone Labor Inc Electron beam testing of film integrated circuits
DE3110140A1 (de) * 1981-03-16 1982-09-23 Siemens AG, 1000 Berlin und 8000 München Vorrichtung und verfahren fuer eine rasche interne logikpruefung an integrierten schaltungen
DE3110138A1 (de) * 1981-03-16 1982-09-23 Siemens AG, 1000 Berlin und 8000 München Verfahren zur darstellung logischer zustandsaenderungen mehrerer benachbarter schaltungsknoten in integrierten schaltungen in einem logikbild mittels einer gepulsten elektronensonde

Also Published As

Publication number Publication date
FR2592958A1 (fr) 1987-07-17

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Legal Events

Date Code Title Description
ST Notification of lapse