FR2577675B1 - Instrument pour mesurer la fluorescence produite dans un echantillon excite par des rayons x - Google Patents
Instrument pour mesurer la fluorescence produite dans un echantillon excite par des rayons xInfo
- Publication number
- FR2577675B1 FR2577675B1 FR868602256A FR8602256A FR2577675B1 FR 2577675 B1 FR2577675 B1 FR 2577675B1 FR 868602256 A FR868602256 A FR 868602256A FR 8602256 A FR8602256 A FR 8602256A FR 2577675 B1 FR2577675 B1 FR 2577675B1
- Authority
- FR
- France
- Prior art keywords
- rays
- instrument
- measuring
- fluorescence produced
- sample excited
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60031076A JPS61189448A (ja) | 1985-02-19 | 1985-02-19 | X線により励起された螢光を測定する装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2577675A1 FR2577675A1 (fr) | 1986-08-22 |
FR2577675B1 true FR2577675B1 (fr) | 1990-05-04 |
Family
ID=12321340
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR868602256A Expired - Fee Related FR2577675B1 (fr) | 1985-02-19 | 1986-02-19 | Instrument pour mesurer la fluorescence produite dans un echantillon excite par des rayons x |
Country Status (4)
Country | Link |
---|---|
US (1) | US4724536A (fr) |
JP (1) | JPS61189448A (fr) |
DE (1) | DE3604836A1 (fr) |
FR (1) | FR2577675B1 (fr) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5042058A (en) * | 1989-03-22 | 1991-08-20 | University Of California | Ultrashort time-resolved x-ray source |
US5930331A (en) * | 1989-03-22 | 1999-07-27 | Rentzepis; Peter M. | Compact high-intensity pulsed x-ray source, particularly for lithography |
US6349128B1 (en) * | 2000-04-27 | 2002-02-19 | Philips Electronics North America Corporation | Method and device using x-rays to measure thickness and composition of thin films |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE213512C (fr) * | ||||
US3991309A (en) * | 1975-07-09 | 1976-11-09 | University Of Rochester | Methods and apparatus for the control and analysis of X-rays |
US4435828A (en) * | 1982-04-14 | 1984-03-06 | Battelle Development Corporation | Fluorescence laser EXAFS |
-
1985
- 1985-02-19 JP JP60031076A patent/JPS61189448A/ja active Pending
-
1986
- 1986-02-15 DE DE19863604836 patent/DE3604836A1/de active Granted
- 1986-02-18 US US06/830,687 patent/US4724536A/en not_active Expired - Fee Related
- 1986-02-19 FR FR868602256A patent/FR2577675B1/fr not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPS61189448A (ja) | 1986-08-23 |
DE3604836C2 (fr) | 1989-12-21 |
US4724536A (en) | 1988-02-09 |
FR2577675A1 (fr) | 1986-08-22 |
DE3604836A1 (de) | 1986-08-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |