FR2507414B1 - - Google Patents

Info

Publication number
FR2507414B1
FR2507414B1 FR8111311A FR8111311A FR2507414B1 FR 2507414 B1 FR2507414 B1 FR 2507414B1 FR 8111311 A FR8111311 A FR 8111311A FR 8111311 A FR8111311 A FR 8111311A FR 2507414 B1 FR2507414 B1 FR 2507414B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8111311A
Other languages
French (fr)
Other versions
FR2507414A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR8111311A priority Critical patent/FR2507414A1/fr
Publication of FR2507414A1 publication Critical patent/FR2507414A1/fr
Application granted granted Critical
Publication of FR2507414B1 publication Critical patent/FR2507414B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F7/00—Methods or arrangements for processing data by operating upon the order or content of the data handled
    • G06F7/76—Arrangements for rearranging, permuting or selecting data according to predetermined rules, independently of the content of the data
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/15—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors
    • H03K5/15013—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors with more than two outputs
    • H03K5/1502—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors with more than two outputs programmable
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/15—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors
    • H03K5/15013—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors with more than two outputs
    • H03K5/1506—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors with more than two outputs with parallel driven output stages; with synchronously driven series connected output stages
    • H03K5/15093—Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors with more than two outputs with parallel driven output stages; with synchronously driven series connected output stages using devices arranged in a shift register

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
FR8111311A 1981-06-09 1981-06-09 Generateur de signaux logiques combines Granted FR2507414A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8111311A FR2507414A1 (fr) 1981-06-09 1981-06-09 Generateur de signaux logiques combines

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8111311A FR2507414A1 (fr) 1981-06-09 1981-06-09 Generateur de signaux logiques combines

Publications (2)

Publication Number Publication Date
FR2507414A1 FR2507414A1 (fr) 1982-12-10
FR2507414B1 true FR2507414B1 (cg-RX-API-DMAC7.html) 1983-10-14

Family

ID=9259305

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8111311A Granted FR2507414A1 (fr) 1981-06-09 1981-06-09 Generateur de signaux logiques combines

Country Status (1)

Country Link
FR (1) FR2507414A1 (cg-RX-API-DMAC7.html)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2567339B1 (fr) * 1984-07-03 1986-11-14 Commissariat Energie Atomique Generateur de sequences predeterminees de signaux logiques combines

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3383661A (en) * 1964-09-30 1968-05-14 Bell Telephone Labor Inc Arrangement for generating permutations
US3371320A (en) * 1965-03-12 1968-02-27 Sperry Rand Corp Multipurpose matrix
US3873818A (en) * 1973-10-29 1975-03-25 Ibm Electronic tester for testing devices having a high circuit density

Also Published As

Publication number Publication date
FR2507414A1 (fr) 1982-12-10

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Legal Events

Date Code Title Description
ST Notification of lapse