FR2504308B1 - Instrument et procede pour focaliser des rayons x, des rayons gamma et des neutrons - Google Patents

Instrument et procede pour focaliser des rayons x, des rayons gamma et des neutrons

Info

Publication number
FR2504308B1
FR2504308B1 FR8206676A FR8206676A FR2504308B1 FR 2504308 B1 FR2504308 B1 FR 2504308B1 FR 8206676 A FR8206676 A FR 8206676A FR 8206676 A FR8206676 A FR 8206676A FR 2504308 B1 FR2504308 B1 FR 2504308B1
Authority
FR
France
Prior art keywords
rays
neutrons
focusing
instrument
gamma
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8206676A
Other languages
English (en)
Other versions
FR2504308A1 (fr
Inventor
Robert Karl Smither
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
US Department of Energy
Original Assignee
US Department of Energy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by US Department of Energy filed Critical US Department of Energy
Publication of FR2504308A1 publication Critical patent/FR2504308A1/fr
Application granted granted Critical
Publication of FR2504308B1 publication Critical patent/FR2504308B1/fr
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/068Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements specially adapted for particle beams

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
FR8206676A 1981-04-20 1982-04-19 Instrument et procede pour focaliser des rayons x, des rayons gamma et des neutrons Expired FR2504308B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US25597481A 1981-04-20 1981-04-20

Publications (2)

Publication Number Publication Date
FR2504308A1 FR2504308A1 (fr) 1982-10-22
FR2504308B1 true FR2504308B1 (fr) 1988-09-02

Family

ID=22970630

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8206676A Expired FR2504308B1 (fr) 1981-04-20 1982-04-19 Instrument et procede pour focaliser des rayons x, des rayons gamma et des neutrons

Country Status (6)

Country Link
JP (1) JPS57182152A (fr)
CA (1) CA1183285A (fr)
DE (1) DE3214611A1 (fr)
FR (1) FR2504308B1 (fr)
IT (1) IT1150848B (fr)
NL (1) NL8201621A (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4525853A (en) * 1983-10-17 1985-06-25 Energy Conversion Devices, Inc. Point source X-ray focusing device
JPS60111125A (ja) * 1983-11-21 1985-06-17 Hitachi Ltd モノクロメ−タ
US4699509A (en) * 1984-04-21 1987-10-13 Nippon Soken, Inc. Device for measuring contamination of lubricant
JPH0515120Y2 (fr) * 1985-05-29 1993-04-21
DE3820549A1 (de) * 1988-06-16 1989-12-21 Fraunhofer Ges Forschung Verfahren und vorrichtung zur untersuchung von membranoberflaechen
JPH02179500A (ja) * 1988-12-29 1990-07-12 Shimadzu Corp 軟x線用フレネルゾーンプレート
JPH0782117B2 (ja) * 1989-02-23 1995-09-06 オリンパス光学工業株式会社 反射型結像光学系
US5802137A (en) * 1993-08-16 1998-09-01 Commonwealth Scientific And Industrial Research X-ray optics, especially for phase contrast imaging
JP4521573B2 (ja) * 2007-01-10 2010-08-11 大学共同利用機関法人 高エネルギー加速器研究機構 中性子線の反射率曲線測定方法及び測定装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3777156A (en) * 1972-02-14 1973-12-04 Hewlett Packard Co Bent diffraction crystal with geometrical aberration compensation
US4012843A (en) * 1973-04-25 1977-03-22 Hitachi, Ltd. Concave diffraction grating and a manufacturing method thereof
US3980883A (en) * 1973-05-15 1976-09-14 National Research Development Corporation X-ray diffraction gratings
JPS5256856Y2 (fr) * 1974-05-15 1977-12-22
US3991309A (en) * 1975-07-09 1976-11-09 University Of Rochester Methods and apparatus for the control and analysis of X-rays
US4132654A (en) * 1976-07-02 1979-01-02 The Machlett Laboratories, Inc. X-ray focal spot test system
US4192994A (en) * 1978-09-18 1980-03-11 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Diffractoid grating configuration for X-ray and ultraviolet focusing

Also Published As

Publication number Publication date
JPS57182152A (en) 1982-11-09
NL8201621A (nl) 1982-11-16
FR2504308A1 (fr) 1982-10-22
IT1150848B (it) 1986-12-17
CA1183285A (fr) 1985-02-26
DE3214611A1 (de) 1982-11-04
JPH0421840B2 (fr) 1992-04-14
IT8220815A0 (it) 1982-04-19

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Legal Events

Date Code Title Description
ST Notification of lapse