FR2486758A1 - Dispositif pour tester un circuit equipe - Google Patents

Dispositif pour tester un circuit equipe Download PDF

Info

Publication number
FR2486758A1
FR2486758A1 FR8015526A FR8015526A FR2486758A1 FR 2486758 A1 FR2486758 A1 FR 2486758A1 FR 8015526 A FR8015526 A FR 8015526A FR 8015526 A FR8015526 A FR 8015526A FR 2486758 A1 FR2486758 A1 FR 2486758A1
Authority
FR
France
Prior art keywords
circuit
pierced
test
guide support
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR8015526A
Other languages
English (en)
French (fr)
Other versions
FR2486758B1 (Direct
Inventor
Michel Mahieu
Christian Lescure
Jean Aime
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Industrielle et Commerciale SA
Original Assignee
Philips Industrielle et Commerciale SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Industrielle et Commerciale SA filed Critical Philips Industrielle et Commerciale SA
Priority to FR8015526A priority Critical patent/FR2486758A1/fr
Publication of FR2486758A1 publication Critical patent/FR2486758A1/fr
Application granted granted Critical
Publication of FR2486758B1 publication Critical patent/FR2486758B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
FR8015526A 1980-07-11 1980-07-11 Dispositif pour tester un circuit equipe Granted FR2486758A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8015526A FR2486758A1 (fr) 1980-07-11 1980-07-11 Dispositif pour tester un circuit equipe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8015526A FR2486758A1 (fr) 1980-07-11 1980-07-11 Dispositif pour tester un circuit equipe

Publications (2)

Publication Number Publication Date
FR2486758A1 true FR2486758A1 (fr) 1982-01-15
FR2486758B1 FR2486758B1 (Direct) 1982-10-01

Family

ID=9244130

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8015526A Granted FR2486758A1 (fr) 1980-07-11 1980-07-11 Dispositif pour tester un circuit equipe

Country Status (1)

Country Link
FR (1) FR2486758A1 (Direct)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2690596A1 (fr) * 1992-04-24 1993-10-29 Godier Christian Dispositif d'interface de test pour carte électronique.
EP0662614A3 (en) * 1994-01-06 1996-12-18 Ibm Test bench for integrated circuit boards and test method.

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE800483A (fr) * 1973-06-05 1973-12-05 Siemens Sa Adapteur pour la connexion d'un groupe construction electrique a un montage de mesure

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE800483A (fr) * 1973-06-05 1973-12-05 Siemens Sa Adapteur pour la connexion d'un groupe construction electrique a un montage de mesure

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2690596A1 (fr) * 1992-04-24 1993-10-29 Godier Christian Dispositif d'interface de test pour carte électronique.
EP0662614A3 (en) * 1994-01-06 1996-12-18 Ibm Test bench for integrated circuit boards and test method.

Also Published As

Publication number Publication date
FR2486758B1 (Direct) 1982-10-01

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Legal Events

Date Code Title Description
TP Transmission of property
ST Notification of lapse