FR2460040B1 - - Google Patents

Info

Publication number
FR2460040B1
FR2460040B1 FR7916056A FR7916056A FR2460040B1 FR 2460040 B1 FR2460040 B1 FR 2460040B1 FR 7916056 A FR7916056 A FR 7916056A FR 7916056 A FR7916056 A FR 7916056A FR 2460040 B1 FR2460040 B1 FR 2460040B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7916056A
Other languages
French (fr)
Other versions
FR2460040A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thomson CSF SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson CSF SA filed Critical Thomson CSF SA
Priority to FR7916056A priority Critical patent/FR2460040A1/fr
Priority to EP80400625A priority patent/EP0021869B1/fr
Priority to DE8080400625T priority patent/DE3063587D1/de
Priority to US06/161,571 priority patent/US4310362A/en
Publication of FR2460040A1 publication Critical patent/FR2460040A1/fr
Application granted granted Critical
Publication of FR2460040B1 publication Critical patent/FR2460040B1/fr
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/102Constructional design considerations for preventing surface leakage or controlling electric field concentration
    • H10D62/112Constructional design considerations for preventing surface leakage or controlling electric field concentration for preventing surface leakage due to surface inversion layers, e.g. by using channel stoppers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D8/00Diodes
    • H10D8/60Schottky-barrier diodes 
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/018Compensation doping
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/139Schottky barrier
FR7916056A 1979-06-22 1979-06-22 Procede pour realiser une diode schottky a tenue en tension amelioree Granted FR2460040A1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR7916056A FR2460040A1 (fr) 1979-06-22 1979-06-22 Procede pour realiser une diode schottky a tenue en tension amelioree
EP80400625A EP0021869B1 (fr) 1979-06-22 1980-05-08 Procédé pour réaliser une diode Schottky à tenue en tension améliorée
DE8080400625T DE3063587D1 (en) 1979-06-22 1980-05-08 Method of making a schottky diode with improved voltage properties
US06/161,571 US4310362A (en) 1979-06-22 1980-06-20 Method of making Schottky diode with an improved voltage behavior

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7916056A FR2460040A1 (fr) 1979-06-22 1979-06-22 Procede pour realiser une diode schottky a tenue en tension amelioree

Publications (2)

Publication Number Publication Date
FR2460040A1 FR2460040A1 (fr) 1981-01-16
FR2460040B1 true FR2460040B1 (show.php) 1983-01-07

Family

ID=9226970

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7916056A Granted FR2460040A1 (fr) 1979-06-22 1979-06-22 Procede pour realiser une diode schottky a tenue en tension amelioree

Country Status (4)

Country Link
US (1) US4310362A (show.php)
EP (1) EP0021869B1 (show.php)
DE (1) DE3063587D1 (show.php)
FR (1) FR2460040A1 (show.php)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3124572A1 (de) * 1981-06-23 1982-12-30 Siemens AG, 1000 Berlin und 8000 München Verfahren zur herstellung von schottky-dioden
IT1171402B (it) * 1981-07-20 1987-06-10 Selenia Ind Eletroniche Associ Transistor ad effeto di campo a barriera metallo-semiconduttorre conzona svuotata modificata
DE3219598A1 (de) * 1982-05-25 1983-12-01 Siemens AG, 1000 Berlin und 8000 München Schottky-leistungsdiode
US4638551A (en) * 1982-09-24 1987-01-27 General Instrument Corporation Schottky barrier device and method of manufacture
JPS59232467A (ja) * 1983-06-16 1984-12-27 Toshiba Corp ガ−ドリング付きシヨツトキ−バリヤ−ダイオ−ド
US4622736A (en) * 1984-01-30 1986-11-18 Tektronix, Inc. Schottky barrier diodes
US4742377A (en) * 1985-02-21 1988-05-03 General Instrument Corporation Schottky barrier device with doped composite guard ring
KR880014692A (ko) * 1987-05-30 1988-12-24 강진구 반사경이 부착된 반도체 발광장치
US4874714A (en) * 1988-06-02 1989-10-17 Texas Instruments Incorporated Method of making laterally oriented Schottky diode
US4954864A (en) * 1988-12-13 1990-09-04 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Millimeter-wave monolithic diode-grid frequency multiplier
DE69433738T2 (de) * 1993-09-07 2005-03-17 Murata Mfg. Co., Ltd., Nagaokakyo Halbleiterelement und Verfahren zur Herstellung desselben
DE19526739C3 (de) * 1995-07-21 2001-03-29 Gen Semiconductor Ireland Macr Halbleiterbauelement
JPH0964381A (ja) * 1995-08-25 1997-03-07 Murata Mfg Co Ltd ショットキーバリアダイオード
US5763918A (en) * 1996-10-22 1998-06-09 International Business Machines Corp. ESD structure that employs a schottky-barrier to reduce the likelihood of latch-up
SE9700156D0 (sv) * 1997-01-21 1997-01-21 Abb Research Ltd Junction termination for Si C Schottky diode
JP3287269B2 (ja) 1997-06-02 2002-06-04 富士電機株式会社 ダイオードとその製造方法
EP0935816B1 (en) * 1997-09-03 2006-04-05 Koninklijke Philips Electronics N.V. Method of manufacturing a semiconductor device with a schottky junction
US6261932B1 (en) 1999-07-29 2001-07-17 Fairchild Semiconductor Corp. Method of fabricating Schottky diode and related structure
US6699775B2 (en) * 2000-02-22 2004-03-02 International Rectifier Corporation Manufacturing process for fast recovery diode
FR2832547A1 (fr) * 2001-11-21 2003-05-23 St Microelectronics Sa Procede de realisation d'une diode schottky sur substrat de carbure de silicium
US8901699B2 (en) 2005-05-11 2014-12-02 Cree, Inc. Silicon carbide junction barrier Schottky diodes with suppressed minority carrier injection
US10304971B2 (en) * 2016-07-16 2019-05-28 Champion Microelectronic Corp. High speed Schottky rectifier

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3541403A (en) * 1967-10-19 1970-11-17 Bell Telephone Labor Inc Guard ring for schottky barrier devices
IT985052B (it) * 1973-05-25 1974-11-30 Finike Italiana Marposs Metodo e relativa apparecchiatura per il controllo della rotazione di pezzi meccanici in lavorazione su rettificatrici
RO60829A2 (show.php) * 1973-12-05 1976-08-15
JPS51120674A (en) * 1975-04-16 1976-10-22 Hitachi Ltd Semiconductor device
US4096622A (en) * 1975-07-31 1978-06-27 General Motors Corporation Ion implanted Schottky barrier diode
GB1573309A (en) * 1976-03-24 1980-08-20 Mullard Ltd Semiconductor devices and their manufacture
US4110775A (en) * 1976-08-23 1978-08-29 Festa Thomas A Schottky diode with voltage limiting guard band
US4063964A (en) * 1976-12-27 1977-12-20 International Business Machines Corporation Method for forming a self-aligned schottky barrier device guardring
US4202002A (en) * 1977-01-19 1980-05-06 International Business Machines Corporation Ion-implanted layers with abrupt edges
US4149905A (en) * 1977-12-27 1979-04-17 Bell Telephone Laboratories, Incorporated Method of limiting stacking faults in oxidized silicon wafers

Also Published As

Publication number Publication date
EP0021869B1 (fr) 1983-06-01
DE3063587D1 (en) 1983-07-07
EP0021869A1 (fr) 1981-01-07
US4310362A (en) 1982-01-12
FR2460040A1 (fr) 1981-01-16

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Legal Events

Date Code Title Description
ST Notification of lapse