FR2454602B1 - - Google Patents

Info

Publication number
FR2454602B1
FR2454602B1 FR8013051A FR8013051A FR2454602B1 FR 2454602 B1 FR2454602 B1 FR 2454602B1 FR 8013051 A FR8013051 A FR 8013051A FR 8013051 A FR8013051 A FR 8013051A FR 2454602 B1 FR2454602 B1 FR 2454602B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8013051A
Other languages
French (fr)
Other versions
FR2454602A1 (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Research Development Corp UK
Original Assignee
National Research Development Corp UK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Research Development Corp UK filed Critical National Research Development Corp UK
Publication of FR2454602A1 publication Critical patent/FR2454602A1/en
Application granted granted Critical
Publication of FR2454602B1 publication Critical patent/FR2454602B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/165—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by means of a grating deformed by the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/30—Grating as beam-splitter

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Transform (AREA)
FR8013051A 1977-11-25 1980-06-10 METHOD AND APPARATUS FOR DETECTING THE DEFORMATION OF A SURFACE IN RELATION TO THE PLANET Granted FR2454602A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB4917077 1977-11-25

Publications (2)

Publication Number Publication Date
FR2454602A1 FR2454602A1 (en) 1980-11-14
FR2454602B1 true FR2454602B1 (en) 1983-01-28

Family

ID=10451426

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8013051A Granted FR2454602A1 (en) 1977-11-25 1980-06-10 METHOD AND APPARATUS FOR DETECTING THE DEFORMATION OF A SURFACE IN RELATION TO THE PLANET

Country Status (6)

Country Link
EP (1) EP0006945A1 (en)
JP (1) JPS54500096A (en)
CH (1) CH626992A5 (en)
FR (1) FR2454602A1 (en)
GB (1) GB2008791B (en)
WO (1) WO1979000320A1 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8005258A (en) * 1980-09-22 1982-04-16 Philips Nv INTERFEROMETER.
US4474466A (en) * 1981-03-11 1984-10-02 National Research Development Corporation Measurement of deformation
FR2504256A1 (en) * 1981-04-16 1982-10-22 Euromask METHOD AND DEVICE FOR OPTICAL MEASUREMENT OF DISPLACEMENT AND APPLICATION TO WAFER PHOTOREPETORS
GB2242518B (en) * 1990-03-12 1994-03-30 Univ Southampton Strain gauge
NL1011035C2 (en) * 1999-01-15 2000-07-18 Kema Nv Method and device for measuring in-plane displacements.
CN103278268A (en) * 2013-05-31 2013-09-04 哈尔滨工业大学 Stress testing device and stress concentration testing method based on speckle interference principle
US9459093B2 (en) * 2014-02-20 2016-10-04 Kabushiki Kaisha Toshiba Deflection measuring device and deflection measuring method

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2127483A1 (en) * 1971-06-03 1972-12-14 Leitz Ernst Gmbh Procedure for the interferential measurement of lengths, angles, differences in gait or speeds

Also Published As

Publication number Publication date
WO1979000320A1 (en) 1979-06-14
FR2454602A1 (en) 1980-11-14
JPS54500096A (en) 1979-12-20
GB2008791A (en) 1979-06-06
EP0006945A1 (en) 1980-01-23
GB2008791B (en) 1982-04-28
CH626992A5 (en) 1981-12-15

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Legal Events

Date Code Title Description
ST Notification of lapse