FR2433179A1 - Systeme de detection et de classification des criques de surfaces metalliques - Google Patents

Systeme de detection et de classification des criques de surfaces metalliques

Info

Publication number
FR2433179A1
FR2433179A1 FR7920114A FR7920114A FR2433179A1 FR 2433179 A1 FR2433179 A1 FR 2433179A1 FR 7920114 A FR7920114 A FR 7920114A FR 7920114 A FR7920114 A FR 7920114A FR 2433179 A1 FR2433179 A1 FR 2433179A1
Authority
FR
France
Prior art keywords
metal surface
classification system
surface cracks
comparator
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7920114A
Other languages
English (en)
Other versions
FR2433179B1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CBS Corp
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Publication of FR2433179A1 publication Critical patent/FR2433179A1/fr
Application granted granted Critical
Publication of FR2433179B1 publication Critical patent/FR2433179B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Monitoring And Testing Of Nuclear Reactors (AREA)

Abstract

a. Système de détection et de classification des criques de surfaces métalliques. b. Système caractérisé en ce qu'il comporte un moyen pour diviser chaque signal de balayage en série fourni par le premier et le second capteurs en plusieurs échantillons, des moyens pour combiner les échantillons, un premier comparateur pour comparer chaque échantillon d'un signal de balayage en série du premier capteur, un second comparateur pour comparer chaque échantillon d'un signal de balayage série du second capteur, ainsi qu'un analyseur pour créer un troisième signal. c. L'invention trouve son application principale dans la technique de fabrication de tubes pour réacteurs nucléaires.
FR7920114A 1978-08-09 1979-08-06 Systeme de detection et de classification des criques de surfaces metalliques Granted FR2433179A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/932,235 US4253768A (en) 1978-08-09 1978-08-09 Processing system for detection and the classification of flaws on metallic surfaces

Publications (2)

Publication Number Publication Date
FR2433179A1 true FR2433179A1 (fr) 1980-03-07
FR2433179B1 FR2433179B1 (fr) 1984-01-06

Family

ID=25461996

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7920114A Granted FR2433179A1 (fr) 1978-08-09 1979-08-06 Systeme de detection et de classification des criques de surfaces metalliques

Country Status (6)

Country Link
US (1) US4253768A (fr)
EP (1) EP0008353B1 (fr)
JP (1) JPS5543491A (fr)
CA (1) CA1133063A (fr)
DE (1) DE2963674D1 (fr)
FR (1) FR2433179A1 (fr)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4493554A (en) * 1979-02-27 1985-01-15 Diffracto Method and apparatus for determining physical characteristics of objects and object surfaces
DE3027373A1 (de) * 1979-07-20 1981-03-19 Hitachi, Ltd., Tokyo Verfahren und einrichtung zur oberflaechenpruefung
GB2087675B (en) * 1980-10-07 1984-03-28 Texas Instruments Ltd Electrical inverter
DE3043849A1 (de) * 1980-11-21 1982-07-08 Koninklijke Textielfabrieken Nijverdal-Ten Gate N.V., Almelo Verfahren zum beschauen einer reflektierenden und/oder transparenten, sich bewegenden bahn und beschaumaschine zur durchfuehrung des verfahrens
US4499595A (en) * 1981-10-01 1985-02-12 General Electric Co. System and method for pattern recognition
GB2114285B (en) * 1982-01-29 1985-08-29 Warren Peter Neal Bailey Optical inspection of machined surfaces
US4549662A (en) * 1982-03-25 1985-10-29 General Electric Company Transport apparatus
US4532723A (en) * 1982-03-25 1985-08-06 General Electric Company Optical inspection system
US4561104A (en) * 1984-01-16 1985-12-24 Honeywell Inc. Automated inspection of hot steel slabs
US5402228A (en) * 1990-05-23 1995-03-28 Pulp And Paper Research Institute Of Canada On-line dirt counter
US5544256A (en) * 1993-10-22 1996-08-06 International Business Machines Corporation Automated defect classification system
JPH07201946A (ja) 1993-12-28 1995-08-04 Hitachi Ltd 半導体装置等の製造方法及びその装置並びに検査方法及びその装置
US6546308B2 (en) 1993-12-28 2003-04-08 Hitachi, Ltd, Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices
US6256093B1 (en) * 1998-06-25 2001-07-03 Applied Materials, Inc. On-the-fly automatic defect classification for substrates using signal attributes
JP3699960B2 (ja) * 2003-03-14 2005-09-28 株式会社東芝 検査レシピ作成システム、欠陥レビューシステム、検査レシピ作成方法及び欠陥レビュー方法
US20050004811A1 (en) * 2003-07-02 2005-01-06 Babu Suresh Rangaswamy Automated recall management system for enterprise management applications
US7834991B2 (en) * 2006-07-13 2010-11-16 Byk Gardner Gmbh Determining surface properties with angle offset correction
US9423407B2 (en) * 2011-09-30 2016-08-23 Westinghouse Electric Company Llc Automated analysis coverage verification (AACV)
US9575008B2 (en) * 2014-02-12 2017-02-21 ASA Corporation Apparatus and method for photographing glass in multiple layers

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2975293A (en) * 1955-02-18 1961-03-14 Diamond Power Speciality Optical defect detector
US3749496A (en) * 1971-07-16 1973-07-31 Bendix Corp Automatic quality control surface inspection system for determining the character of a surface by measuring the shape and intensity of a modulated beam
US3804534A (en) * 1971-10-27 1974-04-16 Ferranti Ltd Detection of blemishes in a surface
US3781117A (en) * 1972-03-31 1973-12-25 United States Steel Corp Apparatus for surface inspection of moving material
US3743431A (en) * 1972-05-09 1973-07-03 Philco Ford Corp Radiation sensitive means for detecting flaws in glass
US3781531A (en) * 1972-06-23 1973-12-25 Intec Corp Flaw detector system utilizing a laser scanner
JPS5213952B2 (fr) * 1972-07-31 1977-04-18
US3984189A (en) * 1973-01-19 1976-10-05 Hitachi Electronics, Ltd. Method and apparatus for detecting defects in a surface regardless of surface finish
US3834822A (en) * 1973-03-29 1974-09-10 Gen Motors Corp Method and apparatus for surface defect detection using detection of non-symmetrical patterns of non-specularly reflected light
US3843890A (en) * 1973-07-27 1974-10-22 Du Pont Optical-electrical web inspection system
US3866054A (en) * 1973-09-28 1975-02-11 Du Pont Defect size discriminator circuit for web inspection system
US3900265A (en) * 1974-03-08 1975-08-19 Intec Corp Laser scanner flaw detection system
US3920970A (en) * 1974-04-30 1975-11-18 Intec Corp Laser scanner flaw detection system using baseline follower signal processing
US4005281A (en) * 1975-05-14 1977-01-25 E. I. Du Pont De Nemours And Company Defect identification with normalizing of gain function in optical-electrical inspection
GB1526375A (en) * 1977-03-23 1978-09-27 Ciba Geigy Ag Method of identifying streaks on a web

Also Published As

Publication number Publication date
US4253768A (en) 1981-03-03
DE2963674D1 (en) 1982-11-04
JPS5543491A (en) 1980-03-27
FR2433179B1 (fr) 1984-01-06
EP0008353B1 (fr) 1982-09-15
CA1133063A (fr) 1982-10-05
EP0008353A1 (fr) 1980-03-05
JPS6239379B2 (fr) 1987-08-22

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