FR2406193A1 - Laser atomic spectral analysis of micro-samples - uses radiation from sample excited by laser directed to spectrograph by selective mirror - Google Patents
Laser atomic spectral analysis of micro-samples - uses radiation from sample excited by laser directed to spectrograph by selective mirrorInfo
- Publication number
- FR2406193A1 FR2406193A1 FR7731193A FR7731193A FR2406193A1 FR 2406193 A1 FR2406193 A1 FR 2406193A1 FR 7731193 A FR7731193 A FR 7731193A FR 7731193 A FR7731193 A FR 7731193A FR 2406193 A1 FR2406193 A1 FR 2406193A1
- Authority
- FR
- France
- Prior art keywords
- laser
- spectrograph
- sample
- samples
- micro
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
Abstract
The device has a laser emitting coherent light for evaporation and excitation of sample material, and an optical system for focussing coherent light on the sample to be analysed. A spectrograph is used for examination of the spectrum emitted by the heated sample material. A frequency selective, inclined coupling out mirror is provided in the beam path between the laser and focusing optical system. It directs the radiation originated in the excited sample material, after its passage through the sample vapour and focussing by the optical system, into the spectrograph slot plane. The tested sample is on a support with known continuous spectrum.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DD19533476 | 1976-10-19 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2406193A1 true FR2406193A1 (en) | 1979-05-11 |
| FR2406193B3 FR2406193B3 (en) | 1980-08-08 |
Family
ID=5506032
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR7731193A Granted FR2406193A1 (en) | 1976-10-19 | 1977-10-17 | Laser atomic spectral analysis of micro-samples - uses radiation from sample excited by laser directed to spectrograph by selective mirror |
Country Status (2)
| Country | Link |
|---|---|
| DE (1) | DE2736987A1 (en) |
| FR (1) | FR2406193A1 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10104556A1 (en) * | 2001-02-01 | 2002-02-07 | Siemens Ag | Non-dispersive infrared gas analyzer used for determining concentration of carbon dioxide in measuring gas has region of radiation between infrared radiation source and measuring cuvette together enclosed by housing |
-
1977
- 1977-08-17 DE DE19772736987 patent/DE2736987A1/en not_active Ceased
- 1977-10-17 FR FR7731193A patent/FR2406193A1/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| FR2406193B3 (en) | 1980-08-08 |
| DE2736987A1 (en) | 1978-04-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |