FR2392421B1 - - Google Patents
Info
- Publication number
- FR2392421B1 FR2392421B1 FR7815244A FR7815244A FR2392421B1 FR 2392421 B1 FR2392421 B1 FR 2392421B1 FR 7815244 A FR7815244 A FR 7815244A FR 7815244 A FR7815244 A FR 7815244A FR 2392421 B1 FR2392421 B1 FR 2392421B1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/975—Substrate or mask aligning feature
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE2723902A DE2723902C2 (de) | 1977-05-26 | 1977-05-26 | Verfahren zur Parallelausrichtung und Justierung der Lage einer Halbleiterscheibe relativ zu einer Bestrahlungsmaske bei der Röntgenstrahl-Fotolithografie |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2392421A1 FR2392421A1 (fr) | 1978-12-22 |
FR2392421B1 true FR2392421B1 (fr) | 1982-04-23 |
Family
ID=6009991
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7815244A Granted FR2392421A1 (fr) | 1977-05-26 | 1978-05-23 | Procede pour ajuster une pastille semi-conductrice par rapport a un masque d'irradiation lors de la photolithographie aux rayons x |
Country Status (4)
Country | Link |
---|---|
US (1) | US4187431A (fr) |
JP (1) | JPS53148285A (fr) |
DE (1) | DE2723902C2 (fr) |
FR (1) | FR2392421A1 (fr) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4287235A (en) * | 1979-05-29 | 1981-09-01 | Massachusetts Institute Of Technology | X-ray lithography at ˜100 A linewidths using X-ray masks fabricated by shadowing techniques |
JPS56122128A (en) * | 1980-02-29 | 1981-09-25 | Telmec Co Ltd | Positioning system for printing device of semiconductor or the like |
US4326805A (en) * | 1980-04-11 | 1982-04-27 | Bell Telephone Laboratories, Incorporated | Method and apparatus for aligning mask and wafer members |
US4472824A (en) * | 1982-08-04 | 1984-09-18 | The Perkin-Elmer Corporation | Apparatus for effecting alignment and spacing control of a mask and wafer for use in X-ray lithography |
FR2538923A1 (fr) * | 1982-12-30 | 1984-07-06 | Thomson Csf | Procede et dispositif d'alignement optique de motifs dans deux plans rapproches dans un appareil d'exposition comprenant une source de rayonnement divergent |
US4610020A (en) * | 1984-01-06 | 1986-09-02 | The Perkin-Elmer Corporation | X-ray mask ring and apparatus for making same |
US4534047A (en) * | 1984-01-06 | 1985-08-06 | The Perkin-Elmer Corporation | Mask ring assembly for X-ray lithography |
US4539695A (en) * | 1984-01-06 | 1985-09-03 | The Perkin-Elmer Corporation | X-Ray lithography system |
JPS61276222A (ja) * | 1985-05-30 | 1986-12-06 | Nec Corp | X線露光アライメント方法 |
JPH0666241B2 (ja) * | 1985-10-14 | 1994-08-24 | 株式会社日立製作所 | 位置検出方法 |
AT391773B (de) * | 1987-10-12 | 1990-11-26 | Thallner Erich | Vorrichtung zum exponieren eines halbleitersubstrates gegen ein strahlungsmuster |
US5168513A (en) * | 1991-10-11 | 1992-12-01 | International Business Machines Corporation | X-ray metrology and alignment detection system |
GB2356786B (en) | 1999-11-29 | 2003-09-03 | Marconi Electronic Syst Ltd | Method and apparatus for aligning a crystalline substrate |
JP2003007601A (ja) * | 2001-06-26 | 2003-01-10 | Canon Inc | 2つの物体の間隔測定方法とそれを用いた半導体露光方法、および間隔測定装置、半導体露光装置 |
US7433018B2 (en) * | 2005-12-27 | 2008-10-07 | Asml Netherlands B.V. | Pattern alignment method and lithographic apparatus |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3742229A (en) * | 1972-06-29 | 1973-06-26 | Massachusetts Inst Technology | Soft x-ray mask alignment system |
US3885877A (en) * | 1973-10-11 | 1975-05-27 | Ibm | Electro-optical fine alignment process |
US3928094A (en) * | 1975-01-16 | 1975-12-23 | Fairchild Camera Instr Co | Method of aligning a wafer beneath a mask and system therefor and wafer having a unique alignment pattern |
US3984680A (en) * | 1975-10-14 | 1976-10-05 | Massachusetts Institute Of Technology | Soft X-ray mask alignment system |
DK142275B (da) * | 1978-03-14 | 1980-10-06 | Ole Simonni Mundeling Nielsen | Stempel til udpresning af en viskos eller plastisk masse fra en cylindrisk beholder eller emballage. |
-
1977
- 1977-05-26 DE DE2723902A patent/DE2723902C2/de not_active Expired
-
1978
- 1978-05-10 US US05/904,597 patent/US4187431A/en not_active Expired - Lifetime
- 1978-05-23 FR FR7815244A patent/FR2392421A1/fr active Granted
- 1978-05-25 JP JP6278778A patent/JPS53148285A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
DE2723902A1 (de) | 1978-11-30 |
FR2392421A1 (fr) | 1978-12-22 |
DE2723902C2 (de) | 1983-12-08 |
JPS53148285A (en) | 1978-12-23 |
US4187431A (en) | 1980-02-05 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |