FR2379813A1 - Structural analysis appts. for monocrystal - utilises processor control of crystal rotation for recording reflected ray indices and intensity - Google Patents

Structural analysis appts. for monocrystal - utilises processor control of crystal rotation for recording reflected ray indices and intensity

Info

Publication number
FR2379813A1
FR2379813A1 FR7704039A FR7704039A FR2379813A1 FR 2379813 A1 FR2379813 A1 FR 2379813A1 FR 7704039 A FR7704039 A FR 7704039A FR 7704039 A FR7704039 A FR 7704039A FR 2379813 A1 FR2379813 A1 FR 2379813A1
Authority
FR
France
Prior art keywords
crystal
structural analysis
processor control
monocrystal
utilises
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7704039A
Other languages
French (fr)
Other versions
FR2379813B1 (en
Inventor
Jean Galy
Jean-Jacques Bonnet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bpifrance Financement SA
Original Assignee
Agence National de Valorisation de la Recherche ANVAR
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agence National de Valorisation de la Recherche ANVAR filed Critical Agence National de Valorisation de la Recherche ANVAR
Priority to FR7704039A priority Critical patent/FR2379813A1/en
Publication of FR2379813A1 publication Critical patent/FR2379813A1/en
Application granted granted Critical
Publication of FR2379813B1 publication Critical patent/FR2379813B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Abstract

Detailed structural analysis of a fragile crystal such as protein is performed by measuring diffraction of X-rays to obtain reflections as the crystal is rotated. The reflections are detected for recording. A crystal (2) is subjected to bombardment of X-rays through a collimator (3). Two linear position detectors (4) are located on a turntable (5) moved by step motors (6, 7). A third step motor (8) rotates about a vertical axis (mu). Optical benches (9) permit movement of the detectors relative to the crystal. The crystal is rotated under processor control to accumulate detector data of reflected X rays on storage discs. The indices and intensities of the reflexions are calculated for each plane.
FR7704039A 1977-02-07 1977-02-07 Structural analysis appts. for monocrystal - utilises processor control of crystal rotation for recording reflected ray indices and intensity Granted FR2379813A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR7704039A FR2379813A1 (en) 1977-02-07 1977-02-07 Structural analysis appts. for monocrystal - utilises processor control of crystal rotation for recording reflected ray indices and intensity

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7704039A FR2379813A1 (en) 1977-02-07 1977-02-07 Structural analysis appts. for monocrystal - utilises processor control of crystal rotation for recording reflected ray indices and intensity

Publications (2)

Publication Number Publication Date
FR2379813A1 true FR2379813A1 (en) 1978-09-01
FR2379813B1 FR2379813B1 (en) 1980-02-29

Family

ID=9186671

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7704039A Granted FR2379813A1 (en) 1977-02-07 1977-02-07 Structural analysis appts. for monocrystal - utilises processor control of crystal rotation for recording reflected ray indices and intensity

Country Status (1)

Country Link
FR (1) FR2379813A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1524516A1 (en) * 2003-10-17 2005-04-20 Samsung Electronics Co., Ltd. X-ray diffractometer and method of correcting measurement position thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1524516A1 (en) * 2003-10-17 2005-04-20 Samsung Electronics Co., Ltd. X-ray diffractometer and method of correcting measurement position thereof

Also Published As

Publication number Publication date
FR2379813B1 (en) 1980-02-29

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