FR2333248B3 - - Google Patents
Info
- Publication number
- FR2333248B3 FR2333248B3 FR7536429A FR7536429A FR2333248B3 FR 2333248 B3 FR2333248 B3 FR 2333248B3 FR 7536429 A FR7536429 A FR 7536429A FR 7536429 A FR7536429 A FR 7536429A FR 2333248 B3 FR2333248 B3 FR 2333248B3
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2621—Circuits therefor for testing field effect transistors, i.e. FET's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2637—Circuits therefor for testing other individual devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7536429A FR2333248A1 (fr) | 1975-11-28 | 1975-11-28 | Circuit de mesure de caracteristiques electriques de structures mos |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7536429A FR2333248A1 (fr) | 1975-11-28 | 1975-11-28 | Circuit de mesure de caracteristiques electriques de structures mos |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2333248A1 FR2333248A1 (fr) | 1977-06-24 |
| FR2333248B3 true FR2333248B3 (en:Method) | 1978-09-01 |
Family
ID=9163026
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR7536429A Granted FR2333248A1 (fr) | 1975-11-28 | 1975-11-28 | Circuit de mesure de caracteristiques electriques de structures mos |
Country Status (1)
| Country | Link |
|---|---|
| FR (1) | FR2333248A1 (en:Method) |
-
1975
- 1975-11-28 FR FR7536429A patent/FR2333248A1/fr active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| FR2333248A1 (fr) | 1977-06-24 |