FR2288438A1 - Installation pour examiner des objets similaires - Google Patents

Installation pour examiner des objets similaires

Info

Publication number
FR2288438A1
FR2288438A1 FR7530858A FR7530858A FR2288438A1 FR 2288438 A1 FR2288438 A1 FR 2288438A1 FR 7530858 A FR7530858 A FR 7530858A FR 7530858 A FR7530858 A FR 7530858A FR 2288438 A1 FR2288438 A1 FR 2288438A1
Authority
FR
France
Prior art keywords
installation
similar objects
examining similar
examining
objects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR7530858A
Other languages
English (en)
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Westinghouse Electric Corp
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Publication of FR2288438A1 publication Critical patent/FR2288438A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95607—Inspecting patterns on the surface of objects using a comparative method

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Radar Systems Or Details Thereof (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
FR7530858A 1974-10-15 1975-10-08 Installation pour examiner des objets similaires Withdrawn FR2288438A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/514,880 US3969577A (en) 1974-10-15 1974-10-15 System for evaluating similar objects

Publications (1)

Publication Number Publication Date
FR2288438A1 true FR2288438A1 (fr) 1976-05-14

Family

ID=24049066

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7530858A Withdrawn FR2288438A1 (fr) 1974-10-15 1975-10-08 Installation pour examiner des objets similaires

Country Status (6)

Country Link
US (1) US3969577A (enExample)
JP (1) JPS5165659A (enExample)
CA (1) CA1042105A (enExample)
DE (1) DE2545753A1 (enExample)
FR (1) FR2288438A1 (enExample)
GB (1) GB1483963A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2443104A1 (fr) * 1978-11-17 1980-06-27 Hajime Industries Procede de controle de gabarit
EP0244781A3 (en) * 1986-05-06 1989-02-08 Kla Instruments Corporation Method and apparatus of using a two beam interference microscope for inspection of integrated circuits and the like

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4079416A (en) * 1975-12-01 1978-03-14 Barry-Wehmiller Company Electronic image analyzing method and apparatus
GB1568379A (en) * 1976-02-19 1980-05-29 Micro Consultants Ltd Video store
CH609795A5 (enExample) * 1976-04-30 1979-03-15 Gretag Ag
FR2380551A1 (fr) * 1977-02-10 1978-09-08 Barry Wehmiller Co Procede et appareil d'analyse electronique d'images
GB2031686B (en) * 1978-09-14 1983-02-02 Micro Consultants Ltd Movement detection
DE2916159C2 (de) * 1979-04-20 1987-04-23 Hajime Industries, Ltd., Tokio/Tokyo Inspektionseinrichtung
US4378495A (en) * 1980-11-07 1983-03-29 Owens-Illinois, Inc. Method and apparatus for setup of inspection devices for glass bottles
US4378494A (en) * 1980-11-07 1983-03-29 Owens-Illinois, Inc. Apparatus and method for detecting defects in glass bottles using event proximity
JPS57105088A (en) * 1980-12-22 1982-06-30 Toshiba Corp Character reader
JPS58143206A (ja) * 1982-02-19 1983-08-25 Canon Inc 位置検知信号処理装置
US4500202A (en) * 1982-05-24 1985-02-19 Itek Corporation Printed circuit board defect detection of detecting maximum line width violations
GB8300512D0 (en) * 1983-01-10 1983-02-09 Cruickshank J S Profile imaging techniques
US4589140A (en) * 1983-03-21 1986-05-13 Beltronics, Inc. Method of and apparatus for real-time high-speed inspection of objects for identifying or recognizing known and unknown portions thereof, including defects and the like
JPS59206705A (ja) * 1983-05-11 1984-11-22 Dainippon Screen Mfg Co Ltd パタ−ン検査方法
US4578810A (en) * 1983-08-08 1986-03-25 Itek Corporation System for printed circuit board defect detection
US4628353A (en) * 1984-04-04 1986-12-09 Chesebrough-Pond's Inc. Video measuring system
JPS60161805U (ja) * 1984-04-04 1985-10-28 日本ドライケミカル株式会社 パタ−ン比較検出装置
EP0242365A1 (en) * 1985-02-13 1987-10-28 University Of Queensland Digital imagery and analysis system
GB2192110A (en) * 1985-02-13 1987-12-31 Univ Queensland Digital imagery and analysis system
GB8724527D0 (en) * 1987-10-20 1987-11-25 Cruickshank J S Projection apparatus
US4934537A (en) * 1988-01-28 1990-06-19 Grove Telecommunications Ltd. Fish sorting apparatus and method
US4991007A (en) * 1989-05-05 1991-02-05 Corley Ferrand D E Image evaluation of at least one characteristic of an object, and method of evaluation
US5008745A (en) * 1989-12-21 1991-04-16 Burle Technologies, Inc. Clock synchronized digital TV motion detector
US6597934B1 (en) 2000-11-06 2003-07-22 Inspektor Research Systems B.V. Diagnostic image capture
KR100488516B1 (ko) * 2002-02-05 2005-05-11 삼성전자주식회사 디스플레이장치 및 디스플레이장치의 에러검출방법
US20040240716A1 (en) * 2003-05-22 2004-12-02 De Josselin De Jong Elbert Analysis and display of fluorescence images
AU2017250458A1 (en) 2016-04-13 2018-11-08 Inspektor Research Systems B.V. Bi-frequency dental examination

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3081379A (en) * 1956-12-04 1963-03-12 Jerome H Lemelson Automatic measurement apparatus
US3049588A (en) * 1959-08-28 1962-08-14 Prec Controls Corp Quality control system
US3743768A (en) * 1971-04-02 1973-07-03 Halliburton Co Method and apparatus for electronically monitoring a field of view
US3872243A (en) * 1971-05-18 1975-03-18 Image Analysing Computers Ltd Method and apparatus for checking measurements made in image analysis systems
JPS4864849A (enExample) * 1971-12-09 1973-09-07

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2443104A1 (fr) * 1978-11-17 1980-06-27 Hajime Industries Procede de controle de gabarit
EP0244781A3 (en) * 1986-05-06 1989-02-08 Kla Instruments Corporation Method and apparatus of using a two beam interference microscope for inspection of integrated circuits and the like

Also Published As

Publication number Publication date
DE2545753A1 (de) 1976-04-22
CA1042105A (en) 1978-11-07
JPS5165659A (enExample) 1976-06-07
US3969577A (en) 1976-07-13
GB1483963A (en) 1977-08-24

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Legal Events

Date Code Title Description
ST Notification of lapse