FR2284980B1 - - Google Patents
Info
- Publication number
- FR2284980B1 FR2284980B1 FR7432368A FR7432368A FR2284980B1 FR 2284980 B1 FR2284980 B1 FR 2284980B1 FR 7432368 A FR7432368 A FR 7432368A FR 7432368 A FR7432368 A FR 7432368A FR 2284980 B1 FR2284980 B1 FR 2284980B1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical, image processing or photographic arrangements associated with the tube
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/026—Means for avoiding or neutralising unwanted electrical charges on tube components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7432368A FR2284980A1 (fr) | 1974-09-16 | 1974-09-16 | Perfectionnements aux microscopes electroniques a balayage et analogues |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7432368A FR2284980A1 (fr) | 1974-09-16 | 1974-09-16 | Perfectionnements aux microscopes electroniques a balayage et analogues |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2284980A1 FR2284980A1 (fr) | 1976-04-09 |
| FR2284980B1 true FR2284980B1 (OSRAM) | 1979-02-02 |
Family
ID=9143425
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR7432368A Granted FR2284980A1 (fr) | 1974-09-16 | 1974-09-16 | Perfectionnements aux microscopes electroniques a balayage et analogues |
Country Status (1)
| Country | Link |
|---|---|
| FR (1) | FR2284980A1 (OSRAM) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4639301B2 (en) * | 1985-04-24 | 1999-05-04 | Micrion Corp | Focused ion beam processing |
-
1974
- 1974-09-16 FR FR7432368A patent/FR2284980A1/fr active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| FR2284980A1 (fr) | 1976-04-09 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |