FR2271569A1 - - Google Patents
Info
- Publication number
- FR2271569A1 FR2271569A1 FR7515545A FR7515545A FR2271569A1 FR 2271569 A1 FR2271569 A1 FR 2271569A1 FR 7515545 A FR7515545 A FR 7515545A FR 7515545 A FR7515545 A FR 7515545A FR 2271569 A1 FR2271569 A1 FR 2271569A1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
- G01N27/227—Sensors changing capacitance upon adsorption or absorption of fluid components, e.g. electrolyte-insulator-semiconductor sensors, MOS capacitors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Power Engineering (AREA)
- Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB2190274A GB1482929A (en) | 1974-05-16 | 1974-05-16 | Apparatus and method for measuring carrier concentration in semiconductor materials |
GB2190374 | 1974-05-16 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2271569A1 true FR2271569A1 (nl) | 1975-12-12 |
FR2271569B1 FR2271569B1 (nl) | 1981-04-10 |
Family
ID=26255598
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7515545A Expired FR2271569B1 (nl) | 1974-05-16 | 1975-05-16 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPS5127062A (nl) |
DE (1) | DE2521909A1 (nl) |
FR (1) | FR2271569B1 (nl) |
GB (1) | GB1482929A (nl) |
SE (1) | SE407629B (nl) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0531686A (ja) * | 1991-07-24 | 1993-02-09 | Nissan Motor Co Ltd | ユニツト型ロボツト |
CN107102038B (zh) * | 2017-06-12 | 2023-04-11 | 重庆交通大学 | 基于等效串联电容测量的拉索锈蚀损伤检测系统及方法 |
CN113030188A (zh) * | 2021-03-08 | 2021-06-25 | 内蒙古工业大学 | 一种半导体材料载流子浓度的检测方法 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH543098A (de) * | 1972-03-30 | 1973-10-15 | Bbc Brown Boveri & Cie | Verfahren und Einrichtung zur Untersuchung von dotiertem Halbleitermaterial |
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1974
- 1974-05-16 GB GB2190274A patent/GB1482929A/en not_active Expired
-
1975
- 1975-05-15 SE SE7505618A patent/SE407629B/xx not_active IP Right Cessation
- 1975-05-16 DE DE19752521909 patent/DE2521909A1/de active Granted
- 1975-05-16 FR FR7515545A patent/FR2271569B1/fr not_active Expired
- 1975-05-16 JP JP5845675A patent/JPS5127062A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
SE7505618L (sv) | 1975-11-17 |
DE2521909C2 (nl) | 1987-06-19 |
FR2271569B1 (nl) | 1981-04-10 |
GB1482929A (en) | 1977-08-17 |
JPS5342662B2 (nl) | 1978-11-14 |
DE2521909A1 (de) | 1975-12-04 |
SE407629B (sv) | 1979-04-02 |
JPS5127062A (ja) | 1976-03-06 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
TP | Transmission of property |