FR2263499A1 - Method of measuring transistor junction temp. - has constant current generator between collector and emitter - Google Patents

Method of measuring transistor junction temp. - has constant current generator between collector and emitter

Info

Publication number
FR2263499A1
FR2263499A1 FR7407218A FR7407218A FR2263499A1 FR 2263499 A1 FR2263499 A1 FR 2263499A1 FR 7407218 A FR7407218 A FR 7407218A FR 7407218 A FR7407218 A FR 7407218A FR 2263499 A1 FR2263499 A1 FR 2263499A1
Authority
FR
France
Prior art keywords
emitter
collector
constant current
current generator
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7407218A
Other languages
English (en)
French (fr)
Other versions
FR2263499B1 (enrdf_load_stackoverflow
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Radiotechnique Compelec RTC SA
Original Assignee
Radiotechnique Compelec RTC SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Radiotechnique Compelec RTC SA filed Critical Radiotechnique Compelec RTC SA
Priority to FR7407218A priority Critical patent/FR2263499A1/fr
Publication of FR2263499A1 publication Critical patent/FR2263499A1/fr
Application granted granted Critical
Publication of FR2263499B1 publication Critical patent/FR2263499B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2608—Circuits therefor for testing bipolar transistors
    • G01R31/2619—Circuits therefor for testing bipolar transistors for measuring thermal properties thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
FR7407218A 1974-03-04 1974-03-04 Method of measuring transistor junction temp. - has constant current generator between collector and emitter Granted FR2263499A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR7407218A FR2263499A1 (en) 1974-03-04 1974-03-04 Method of measuring transistor junction temp. - has constant current generator between collector and emitter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7407218A FR2263499A1 (en) 1974-03-04 1974-03-04 Method of measuring transistor junction temp. - has constant current generator between collector and emitter

Publications (2)

Publication Number Publication Date
FR2263499A1 true FR2263499A1 (en) 1975-10-03
FR2263499B1 FR2263499B1 (enrdf_load_stackoverflow) 1976-06-25

Family

ID=9135757

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7407218A Granted FR2263499A1 (en) 1974-03-04 1974-03-04 Method of measuring transistor junction temp. - has constant current generator between collector and emitter

Country Status (1)

Country Link
FR (1) FR2263499A1 (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0252697A3 (en) * 1986-07-07 1989-07-12 Varian Associates, Inc. Semiconductor wafer temperature measuring device and method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0252697A3 (en) * 1986-07-07 1989-07-12 Varian Associates, Inc. Semiconductor wafer temperature measuring device and method

Also Published As

Publication number Publication date
FR2263499B1 (enrdf_load_stackoverflow) 1976-06-25

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Legal Events

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ST Notification of lapse