FR2218721A1 - - Google Patents

Info

Publication number
FR2218721A1
FR2218721A1 FR7342155A FR7342155A FR2218721A1 FR 2218721 A1 FR2218721 A1 FR 2218721A1 FR 7342155 A FR7342155 A FR 7342155A FR 7342155 A FR7342155 A FR 7342155A FR 2218721 A1 FR2218721 A1 FR 2218721A1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7342155A
Other languages
French (fr)
Other versions
FR2218721B1 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Italtel SpA
Original Assignee
Societa Italiana Telecomunicazioni Siemens SpA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Societa Italiana Telecomunicazioni Siemens SpA filed Critical Societa Italiana Telecomunicazioni Siemens SpA
Publication of FR2218721A1 publication Critical patent/FR2218721A1/fr
Application granted granted Critical
Publication of FR2218721B1 publication Critical patent/FR2218721B1/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/24—Arrangements for supervision, monitoring or testing with provision for checking the normal operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
FR7342155A 1973-02-19 1973-11-27 Expired FR2218721B1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT2053873A IT983459B (it) 1973-02-19 1973-02-19 Sistema per effettuare prove di collaudo di componenti elettri ci ed elettronici di tipo ana logico

Publications (2)

Publication Number Publication Date
FR2218721A1 true FR2218721A1 (es) 1974-09-13
FR2218721B1 FR2218721B1 (es) 1977-06-10

Family

ID=11168444

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7342155A Expired FR2218721B1 (es) 1973-02-19 1973-11-27

Country Status (4)

Country Link
DE (1) DE2407963A1 (es)
ES (1) ES421945A1 (es)
FR (1) FR2218721B1 (es)
IT (1) IT983459B (es)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2405607A1 (fr) * 1977-10-10 1979-05-04 Cit Alcatel Systeme de controle d'organes electriques
EP0128946A1 (en) * 1982-12-15 1984-12-27 Equipment Sales Company Inc. High speed testing of complex circuits
FR2561480A1 (fr) * 1984-03-14 1985-09-20 Teradyne Inc Procede et circuit de multiplexage a relais pour un appareil de test de circuits

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0743413B2 (ja) * 1984-05-09 1995-05-15 三菱電機株式会社 半導体試験装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3219927A (en) * 1958-09-15 1965-11-23 North American Aviation Inc Automatic functional test equipment utilizing digital programmed storage means
FR1602196A (es) * 1968-01-15 1970-10-19
US3597682A (en) * 1968-11-12 1971-08-03 E H Research Lab Inc Programmable testing unit for single shot testing

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3219927A (en) * 1958-09-15 1965-11-23 North American Aviation Inc Automatic functional test equipment utilizing digital programmed storage means
FR1602196A (es) * 1968-01-15 1970-10-19
US3597682A (en) * 1968-11-12 1971-08-03 E H Research Lab Inc Programmable testing unit for single shot testing

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
DE CI DE LOGIQUE" *
PAGES 190-193.) *
REVUE FR:"ELECTRONIQUE INDUSTRIELLE". AVRIL 1970, NO. 132, "METHODES ET MOYENS DE CONTROLE *
REVUE US:"IEEE SPECTRUM". MAI 1971, PAGES 64-78."A LOOK AT AUTOMATIC TESTING" MCALEER *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2405607A1 (fr) * 1977-10-10 1979-05-04 Cit Alcatel Systeme de controle d'organes electriques
EP0128946A1 (en) * 1982-12-15 1984-12-27 Equipment Sales Company Inc. High speed testing of complex circuits
EP0128946A4 (en) * 1982-12-15 1988-03-22 Equipment Sales Company Inc HIGH SPEED CHECKING OF COMPLEX CIRCUITS.
FR2561480A1 (fr) * 1984-03-14 1985-09-20 Teradyne Inc Procede et circuit de multiplexage a relais pour un appareil de test de circuits

Also Published As

Publication number Publication date
DE2407963A1 (de) 1974-11-21
FR2218721B1 (es) 1977-06-10
ES421945A1 (es) 1976-05-01
IT983459B (it) 1974-10-31

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Legal Events

Date Code Title Description
ST Notification of lapse