FR2133600A1 - - Google Patents
Info
- Publication number
- FR2133600A1 FR2133600A1 FR7211663A FR7211663A FR2133600A1 FR 2133600 A1 FR2133600 A1 FR 2133600A1 FR 7211663 A FR7211663 A FR 7211663A FR 7211663 A FR7211663 A FR 7211663A FR 2133600 A1 FR2133600 A1 FR 2133600A1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB1051071 | 1971-04-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| FR2133600A1 true FR2133600A1 (enExample) | 1972-12-01 |
Family
ID=9969168
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR7211663A Withdrawn FR2133600A1 (enExample) | 1971-04-21 | 1972-03-31 |
Country Status (4)
| Country | Link |
|---|---|
| DE (1) | DE2213368A1 (enExample) |
| FR (1) | FR2133600A1 (enExample) |
| IT (1) | IT952317B (enExample) |
| NL (1) | NL7203912A (enExample) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3976864A (en) * | 1974-09-03 | 1976-08-24 | Hewlett-Packard Company | Apparatus and method for testing digital circuits |
| DE2951929C2 (de) * | 1979-12-21 | 1985-09-12 | Siemens AG, 1000 Berlin und 8000 München | Prüfeinrichtung |
-
1972
- 1972-03-20 IT IT4911972A patent/IT952317B/it active
- 1972-03-20 DE DE19722213368 patent/DE2213368A1/de active Pending
- 1972-03-23 NL NL7203912A patent/NL7203912A/xx unknown
- 1972-03-31 FR FR7211663A patent/FR2133600A1/fr not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| DE2213368A1 (de) | 1972-11-02 |
| NL7203912A (enExample) | 1972-10-24 |
| IT952317B (it) | 1973-07-20 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |