FR2108079B1 - - Google Patents

Info

Publication number
FR2108079B1
FR2108079B1 FR7129456*A FR7129456A FR2108079B1 FR 2108079 B1 FR2108079 B1 FR 2108079B1 FR 7129456 A FR7129456 A FR 7129456A FR 2108079 B1 FR2108079 B1 FR 2108079B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7129456*A
Other versions
FR2108079A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of FR2108079A1 publication Critical patent/FR2108079A1/fr
Application granted granted Critical
Publication of FR2108079B1 publication Critical patent/FR2108079B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
FR7129456*A 1970-09-30 1971-07-30 Expired FR2108079B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US7692270A 1970-09-30 1970-09-30

Publications (2)

Publication Number Publication Date
FR2108079A1 FR2108079A1 (fr) 1972-05-12
FR2108079B1 true FR2108079B1 (fr) 1974-04-26

Family

ID=22135004

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7129456*A Expired FR2108079B1 (fr) 1970-09-30 1971-07-30

Country Status (5)

Country Link
US (1) US3631229A (fr)
JP (1) JPS5229581B1 (fr)
DE (1) DE2136034A1 (fr)
FR (1) FR2108079B1 (fr)
GB (1) GB1356324A (fr)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3751649A (en) * 1971-05-17 1973-08-07 Marcrodata Co Memory system exerciser
US3735105A (en) * 1971-06-11 1973-05-22 Ibm Error correcting system and method for monolithic memories
US3714403A (en) * 1971-09-01 1973-01-30 Gte Automatic Electric Lab Inc Computer implemented method of detecting and isolating electrical faults in core memory systems
US3764995A (en) * 1971-12-21 1973-10-09 Prd Electronics Inc Programmable test systems
US3787669A (en) * 1972-06-30 1974-01-22 Ibm Test pattern generator
JPS5329417B2 (fr) * 1973-02-26 1978-08-21
FR2232255A5 (fr) * 1973-05-28 1974-12-27 Honeywell Bull Soc Ind
US3939453A (en) * 1974-04-29 1976-02-17 Bryant Grinder Corporation Diagnostic display for machine sequence controller
US3969618A (en) * 1974-11-29 1976-07-13 Xerox Corporation On line PROM handling system
US3961252A (en) * 1974-12-20 1976-06-01 International Business Machines Corporation Testing embedded arrays
US3931506A (en) * 1974-12-30 1976-01-06 Zehntel, Inc. Programmable tester
US4012625A (en) * 1975-09-05 1977-03-15 Honeywell Information Systems, Inc. Non-logic printed wiring board test system
US4053844A (en) * 1975-09-26 1977-10-11 Moise N. Hamaoui Card-reader integrated circuit tester
US4070565A (en) * 1976-08-18 1978-01-24 Zehntel, Inc. Programmable tester method and apparatus
US4216539A (en) * 1978-05-05 1980-08-05 Zehntel, Inc. In-circuit digital tester
USRE31828E (en) * 1978-05-05 1985-02-05 Zehntel, Inc. In-circuit digital tester
US4184630A (en) * 1978-06-19 1980-01-22 International Business Machines Corporation Verifying circuit operation
US4308615A (en) * 1979-09-17 1981-12-29 Honeywell Information Systems Inc. Microprocessor based maintenance system
US4369511A (en) * 1979-11-21 1983-01-18 Nippon Telegraph & Telephone Public Corp. Semiconductor memory test equipment
DE2951929C2 (de) * 1979-12-21 1985-09-12 Siemens AG, 1000 Berlin und 8000 München Prüfeinrichtung
US4316259A (en) * 1980-03-18 1982-02-16 Grumman Aerospace Corporation Programmable function generator
DE3215074A1 (de) * 1982-04-22 1983-10-27 Siemens AG, 1000 Berlin und 8000 München Anordnung zur anpassung einer pruefeinrichtung an einen pruefling
JPH0349007U (fr) * 1989-09-12 1991-05-13
US5200696A (en) * 1990-09-10 1993-04-06 Ltx Corporation Test system apparatus with Schottky diodes with programmable voltages
US5144230A (en) * 1990-11-26 1992-09-01 The Boeing Company Method and system for testing integrated circuits by cycle stealing
KR100224731B1 (ko) 1997-06-23 1999-10-15 윤종용 논리 디바이스 테스트 장치 및 방법
US6323694B1 (en) 1998-04-01 2001-11-27 Ltx Corporation Differential comparator with a programmable voltage offset for use in an automatic tester
US6570517B1 (en) * 2001-05-16 2003-05-27 Analog Devices, Inc. Digital to analog converting circuit
US20110191116A1 (en) * 2008-07-24 2011-08-04 Löser Medizintechnik GmbH Method for monitoring the medical condition of a patient
CN102859880A (zh) * 2010-04-09 2013-01-02 爱德万测试(新加坡)私人有限公司 用于信号转换器的源同步测试的装置和方法
CN106199381B (zh) * 2016-07-04 2020-05-22 深圳创维空调科技有限公司 变频空调主板的自动检测方法及装置
CN115902595B (zh) * 2023-02-20 2023-07-14 之江实验室 一种芯片测试系统以及芯片测试方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3219927A (en) * 1958-09-15 1965-11-23 North American Aviation Inc Automatic functional test equipment utilizing digital programmed storage means
US3082374A (en) * 1959-06-12 1963-03-19 Itt Automatic testing system and timing device therefor
CA768761A (en) * 1962-12-12 1967-10-03 E. Jones Harold Automatic logic circuit tester
US3353669A (en) * 1965-06-30 1967-11-21 Ibm Electrical component tester with duplexed handlers
US3492572A (en) * 1966-10-10 1970-01-27 Ibm Programmable electronic circuit testing apparatus having plural multifunction test condition generating circuits
US3546582A (en) * 1968-01-15 1970-12-08 Ibm Computer controlled test system for performing functional tests on monolithic devices
US3528006A (en) * 1968-04-01 1970-09-08 Sperry Rand Corp Apparatus for automatically testing the pulse propagation characteristics of digital electronic circuits

Also Published As

Publication number Publication date
DE2136034A1 (de) 1972-04-06
US3631229A (en) 1971-12-28
JPS5229581B1 (fr) 1977-08-03
GB1356324A (en) 1974-06-12
FR2108079A1 (fr) 1972-05-12

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Legal Events

Date Code Title Description
ST Notification of lapse