FR2074755A6 - Semiconductor radiation detector - Google Patents
Semiconductor radiation detectorInfo
- Publication number
- FR2074755A6 FR2074755A6 FR7002619A FR7002619A FR2074755A6 FR 2074755 A6 FR2074755 A6 FR 2074755A6 FR 7002619 A FR7002619 A FR 7002619A FR 7002619 A FR7002619 A FR 7002619A FR 2074755 A6 FR2074755 A6 FR 2074755A6
- Authority
- FR
- France
- Prior art keywords
- region
- radiation detector
- semiconductor radiation
- cut out
- incident radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000005855 radiation Effects 0.000 title abstract 3
- 239000004065 semiconductor Substances 0.000 title 1
- 239000013078 crystal Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
- H01L31/115—Devices sensitive to very short wavelength, e.g. X-rays, gamma-rays or corpuscular radiation
- H01L31/117—Devices sensitive to very short wavelength, e.g. X-rays, gamma-rays or corpuscular radiation of the bulk effect radiation detector type, e.g. Ge-Li compensated PIN gamma-ray detectors
- H01L31/1175—Li compensated PIN gamma-ray detectors
Abstract
The crystal consists of a first and a second outer region of opposite conductivity types with an intrinsic region separating them. On the side opposed to the incident radiation is a cut out forming an input window and the depth is at least equal to the thickness of its associated p or n type region. A corresponding matching cut out is made in the second region aligned with the window, so that when elements are stacked together with then region of one contacting the p region of the next, the incident radiation has to pass only through the intrinsic layers on the stack.
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US00108799A US3742215A (en) | 1970-01-26 | 1971-01-22 | Method and apparatus for a semiconductor radiation detector |
CH99871A CH518623A (en) | 1970-01-26 | 1971-01-22 | Semiconductor radiation detector and method of making the same |
JP46001918A JPS5121552B1 (en) | 1970-01-26 | 1971-01-23 | |
DE19712103615 DE2103615A1 (en) | 1970-01-26 | 1971-01-26 | Semiconductor radiation detector and method of making the same |
GB2025971A GB1334437A (en) | 1970-01-26 | 1971-04-19 | Semiconductor nuclear radiation detectors |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR178631 | 1968-12-17 |
Publications (1)
Publication Number | Publication Date |
---|---|
FR2074755A6 true FR2074755A6 (en) | 1971-10-08 |
Family
ID=8658469
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR178631A Expired FR1598473A (en) | 1968-12-17 | 1968-12-17 | |
FR7002619A Expired FR2074755A6 (en) | 1968-12-17 | 1970-01-26 | Semiconductor radiation detector |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR178631A Expired FR1598473A (en) | 1968-12-17 | 1968-12-17 |
Country Status (1)
Country | Link |
---|---|
FR (2) | FR1598473A (en) |
-
1968
- 1968-12-17 FR FR178631A patent/FR1598473A/fr not_active Expired
-
1970
- 1970-01-26 FR FR7002619A patent/FR2074755A6/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
FR1598473A (en) | 1970-07-06 |
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