FR2041865A5 - - Google Patents
Info
- Publication number
- FR2041865A5 FR2041865A5 FR6911444A FR6911444A FR2041865A5 FR 2041865 A5 FR2041865 A5 FR 2041865A5 FR 6911444 A FR6911444 A FR 6911444A FR 6911444 A FR6911444 A FR 6911444A FR 2041865 A5 FR2041865 A5 FR 2041865A5
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical, image processing or photographic arrangements associated with the tube
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
- H01J37/256—Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US561997A US3479505A (en) | 1966-06-30 | 1966-06-30 | Method of operating an ion microprobe using secondary elections |
FR6911444A FR2041865A5 (enrdf_load_stackoverflow) | 1966-06-30 | 1969-04-14 | |
DE19691919880 DE1919880A1 (de) | 1969-04-14 | 1969-04-18 | Verfahren zum Betreiben einer Ionensonde |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US56199766A | 1966-06-30 | 1966-06-30 | |
FR6911444A FR2041865A5 (enrdf_load_stackoverflow) | 1966-06-30 | 1969-04-14 | |
DE19691919880 DE1919880A1 (de) | 1969-04-14 | 1969-04-18 | Verfahren zum Betreiben einer Ionensonde |
Publications (1)
Publication Number | Publication Date |
---|---|
FR2041865A5 true FR2041865A5 (enrdf_load_stackoverflow) | 1971-02-05 |
Family
ID=27616982
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR6911444A Expired FR2041865A5 (enrdf_load_stackoverflow) | 1966-06-30 | 1969-04-14 |
Country Status (2)
Country | Link |
---|---|
US (1) | US3479505A (enrdf_load_stackoverflow) |
FR (1) | FR2041865A5 (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0425204A3 (en) * | 1989-10-23 | 1992-01-02 | Hitachi, Ltd. | Secondary ion mass analyzing apparatus |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5034439B1 (enrdf_load_stackoverflow) * | 1969-05-16 | 1975-11-08 | ||
JPS5129437B1 (enrdf_load_stackoverflow) * | 1970-08-19 | 1976-08-25 | ||
US4629898A (en) * | 1981-10-02 | 1986-12-16 | Oregon Graduate Center | Electron and ion beam apparatus and passivation milling |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3103584A (en) * | 1963-09-10 | Electron microanalyzer system | ||
CH391912A (de) * | 1961-11-09 | 1965-05-15 | Trueb Taeuber & Co Ag | Verfahren zur Sichtbarmachung und Aufnahme von elektronenoptischen Bildern |
-
1966
- 1966-06-30 US US561997A patent/US3479505A/en not_active Expired - Lifetime
-
1969
- 1969-04-14 FR FR6911444A patent/FR2041865A5/fr not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0425204A3 (en) * | 1989-10-23 | 1992-01-02 | Hitachi, Ltd. | Secondary ion mass analyzing apparatus |
Also Published As
Publication number | Publication date |
---|---|
US3479505A (en) | 1969-11-18 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |