JPS5136010B1
(fr)
*
|
1970-11-06 |
1976-10-06 |
|
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FR2128290B1
(fr)
*
|
1971-03-10 |
1974-09-27 |
Siemens Ag |
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US3723868A
(en)
*
|
1972-01-21 |
1973-03-27 |
Gen Dynamics Corp |
System for testing electronic apparatus
|
US3789205A
(en)
*
|
1972-09-28 |
1974-01-29 |
Ibm |
Method of testing mosfet planar boards
|
CS169891B1
(fr)
*
|
1973-11-05 |
1976-07-29 |
|
|
US3967103A
(en)
*
|
1975-04-14 |
1976-06-29 |
Mcdonnell Douglas Corporation |
Decoder/analyzer test unit
|
JPS5361374A
(en)
*
|
1976-11-15 |
1978-06-01 |
Shin Shirasuna Electric Corp |
Method of measuring electrical analog quantity
|
US4108358A
(en)
*
|
1977-03-22 |
1978-08-22 |
The Bendix Corporation |
Portable circuit tester
|
JPS54947A
(en)
*
|
1977-06-06 |
1979-01-06 |
Hitachi Ltd |
Failure detection system for digital output circuit
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US4196386A
(en)
*
|
1978-04-13 |
1980-04-01 |
Ncr Corporation |
Method and portable apparatus for testing digital printed circuit boards
|
US4212075A
(en)
*
|
1978-10-10 |
1980-07-08 |
Usm Corporation |
Electrical component testing system for component insertion machine
|
US4262248A
(en)
*
|
1978-11-08 |
1981-04-14 |
Sybron Corporation |
System for servicing process instrumentation
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US4370746A
(en)
*
|
1980-12-24 |
1983-01-25 |
International Business Machines Corporation |
Memory address selector
|
US4412327A
(en)
*
|
1981-02-25 |
1983-10-25 |
Western Electric Company, Inc. |
Test circuit for checking memory output state continuously during time window
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US4395767A
(en)
*
|
1981-04-20 |
1983-07-26 |
Control Data Corporation |
Interconnect fault detector for LSI logic chips
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JPS5873881A
(ja)
*
|
1981-10-29 |
1983-05-04 |
Advantest Corp |
Icテスタ
|
US4546472A
(en)
*
|
1983-01-27 |
1985-10-08 |
Intel Corporation |
Method and means for testing integrated circuits
|
US4571724A
(en)
*
|
1983-03-23 |
1986-02-18 |
Data I/O Corporation |
System for testing digital logic devices
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US4637020A
(en)
*
|
1983-08-01 |
1987-01-13 |
Fairchild Semiconductor Corporation |
Method and apparatus for monitoring automated testing of electronic circuits
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US4635259A
(en)
*
|
1983-08-01 |
1987-01-06 |
Fairchild Semiconductor Corporation |
Method and apparatus for monitoring response signals during automated testing of electronic circuits
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US4646299A
(en)
*
|
1983-08-01 |
1987-02-24 |
Fairchild Semiconductor Corporation |
Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits
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US4656632A
(en)
*
|
1983-11-25 |
1987-04-07 |
Giordano Associates, Inc. |
System for automatic testing of circuits and systems
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US6304987B1
(en)
*
|
1995-06-07 |
2001-10-16 |
Texas Instruments Incorporated |
Integrated test circuit
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US5220280A
(en)
*
|
1989-05-11 |
1993-06-15 |
Vlsi Technology, Inc. |
Method and an apparatus for testing the assembly of a plurality of electrical components on a substrate
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JP3005250B2
(ja)
*
|
1989-06-30 |
2000-01-31 |
テキサス インスツルメンツ インコーポレイテツド |
バスモニター集積回路
|
US5196788A
(en)
*
|
1991-07-03 |
1993-03-23 |
The United States Of America As Represented By The Secretary Of The Navy |
Self-contained functional test apparatus for modular circuit cards
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JP3192278B2
(ja)
*
|
1993-06-10 |
2001-07-23 |
富士通株式会社 |
プリント板配線試験処理方法
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US6055661A
(en)
*
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1994-06-13 |
2000-04-25 |
Luk; Fong |
System configuration and methods for on-the-fly testing of integrated circuits
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US6408413B1
(en)
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1998-02-18 |
2002-06-18 |
Texas Instruments Incorporated |
Hierarchical access of test access ports in embedded core integrated circuits
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US6405335B1
(en)
|
1998-02-25 |
2002-06-11 |
Texas Instruments Incorporated |
Position independent testing of circuits
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US7058862B2
(en)
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2000-05-26 |
2006-06-06 |
Texas Instruments Incorporated |
Selecting different 1149.1 TAP domains from update-IR state
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US6728915B2
(en)
|
2000-01-10 |
2004-04-27 |
Texas Instruments Incorporated |
IC with shared scan cells selectively connected in scan path
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US6769080B2
(en)
|
2000-03-09 |
2004-07-27 |
Texas Instruments Incorporated |
Scan circuit low power adapter with counter
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JP3848255B2
(ja)
*
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2000-10-18 |
2006-11-22 |
株式会社アドバンテスト |
電子デバイス設計支援装置、電子デバイス設計支援方法、電子デバイス製造方法、及びプログラム
|