FR2006873A1 - - Google Patents

Info

Publication number
FR2006873A1
FR2006873A1 FR6905814A FR6905814A FR2006873A1 FR 2006873 A1 FR2006873 A1 FR 2006873A1 FR 6905814 A FR6905814 A FR 6905814A FR 6905814 A FR6905814 A FR 6905814A FR 2006873 A1 FR2006873 A1 FR 2006873A1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
FR6905814A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
Western Electric Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Western Electric Co Inc filed Critical Western Electric Co Inc
Publication of FR2006873A1 publication Critical patent/FR2006873A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49004—Electrical device making including measuring or testing of device or component part
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49082—Resistor making
    • Y10T29/49099—Coating resistive material on a base

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
FR6905814A 1968-04-25 1969-03-04 Withdrawn FR2006873A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US72416968A 1968-04-25 1968-04-25

Publications (1)

Publication Number Publication Date
FR2006873A1 true FR2006873A1 (fr) 1970-01-02

Family

ID=24909314

Family Applications (1)

Application Number Title Priority Date Filing Date
FR6905814A Withdrawn FR2006873A1 (fr) 1968-04-25 1969-03-04

Country Status (6)

Country Link
US (1) US3518545A (fr)
BE (1) BE728833A (fr)
DE (1) DE1920291A1 (fr)
FR (1) FR2006873A1 (fr)
GB (1) GB1269263A (fr)
NL (1) NL6904298A (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3650020A (en) * 1970-02-24 1972-03-21 Bell Telephone Labor Inc Method of monitoring semiconductor device fabrication
US3645631A (en) * 1970-05-05 1972-02-29 Gte Sylvania Inc Apparatus and method for measuring the carrier concentration of semiconductor materials
US3731192A (en) * 1971-05-28 1973-05-01 Bell Telephone Labor Inc Method and apparatus for analyzing semiconductors
US4360964A (en) * 1981-03-04 1982-11-30 Western Electric Co., Inc. Nondestructive testing of semiconductor materials
US4456879A (en) * 1981-09-02 1984-06-26 Rca Corporation Method and apparatus for determining the doping profile in epitaxial layers of semiconductors
US4564807A (en) * 1984-03-27 1986-01-14 Ga Technologies Inc. Method of judging carrier lifetime in semiconductor devices
US5103183A (en) * 1990-01-26 1992-04-07 Rockwell International Corporation Method of profiling compensator concentration in semiconductors

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2942329A (en) * 1956-09-25 1960-06-28 Ibm Semiconductor device fabrication

Also Published As

Publication number Publication date
DE1920291B2 (fr) 1971-02-04
DE1920291A1 (de) 1970-03-05
US3518545A (en) 1970-06-30
NL6904298A (fr) 1969-10-28
BE728833A (fr) 1969-08-01
GB1269263A (en) 1972-04-06

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Legal Events

Date Code Title Description
ST Notification of lapse