BE728833A - - Google Patents

Info

Publication number
BE728833A
BE728833A BE728833DA BE728833A BE 728833 A BE728833 A BE 728833A BE 728833D A BE728833D A BE 728833DA BE 728833 A BE728833 A BE 728833A
Authority
BE
Belgium
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of BE728833A publication Critical patent/BE728833A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49004—Electrical device making including measuring or testing of device or component part
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49082—Resistor making
    • Y10T29/49099—Coating resistive material on a base

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
BE728833D 1968-04-25 1969-02-24 BE728833A (xx)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US72416968A 1968-04-25 1968-04-25

Publications (1)

Publication Number Publication Date
BE728833A true BE728833A (xx) 1969-08-01

Family

ID=24909314

Family Applications (1)

Application Number Title Priority Date Filing Date
BE728833D BE728833A (xx) 1968-04-25 1969-02-24

Country Status (6)

Country Link
US (1) US3518545A (xx)
BE (1) BE728833A (xx)
DE (1) DE1920291A1 (xx)
FR (1) FR2006873A1 (xx)
GB (1) GB1269263A (xx)
NL (1) NL6904298A (xx)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3650020A (en) * 1970-02-24 1972-03-21 Bell Telephone Labor Inc Method of monitoring semiconductor device fabrication
US3645631A (en) * 1970-05-05 1972-02-29 Gte Sylvania Inc Apparatus and method for measuring the carrier concentration of semiconductor materials
US3731192A (en) * 1971-05-28 1973-05-01 Bell Telephone Labor Inc Method and apparatus for analyzing semiconductors
US4360964A (en) * 1981-03-04 1982-11-30 Western Electric Co., Inc. Nondestructive testing of semiconductor materials
US4456879A (en) * 1981-09-02 1984-06-26 Rca Corporation Method and apparatus for determining the doping profile in epitaxial layers of semiconductors
US4564807A (en) * 1984-03-27 1986-01-14 Ga Technologies Inc. Method of judging carrier lifetime in semiconductor devices
US5103183A (en) * 1990-01-26 1992-04-07 Rockwell International Corporation Method of profiling compensator concentration in semiconductors

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2942329A (en) * 1956-09-25 1960-06-28 Ibm Semiconductor device fabrication

Also Published As

Publication number Publication date
FR2006873A1 (xx) 1970-01-02
US3518545A (en) 1970-06-30
DE1920291A1 (de) 1970-03-05
GB1269263A (en) 1972-04-06
NL6904298A (xx) 1969-10-28
DE1920291B2 (xx) 1971-02-04

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Legal Events

Date Code Title Description
RE Patent lapsed

Owner name: WESTERN ELECTRIC CY INC.

Effective date: 19850224