FR1576123A - - Google Patents

Info

Publication number
FR1576123A
FR1576123A FR1576123DA FR1576123A FR 1576123 A FR1576123 A FR 1576123A FR 1576123D A FR1576123D A FR 1576123DA FR 1576123 A FR1576123 A FR 1576123A
Authority
FR
France
Prior art keywords
circuit
voltage
output
bias
waveform
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
English (en)
French (fr)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Application granted granted Critical
Publication of FR1576123A publication Critical patent/FR1576123A/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2608—Circuits therefor for testing bipolar transistors
    • G01R31/2617—Circuits therefor for testing bipolar transistors for measuring switching properties thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
FR1576123D 1967-08-28 1968-07-29 Expired FR1576123A (c_deeref_Disk_and_Scratch_Disk_Pools_and_Their_Defaults.html)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US66371067A 1967-08-28 1967-08-28

Publications (1)

Publication Number Publication Date
FR1576123A true FR1576123A (c_deeref_Disk_and_Scratch_Disk_Pools_and_Their_Defaults.html) 1969-07-25

Family

ID=24662977

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1576123D Expired FR1576123A (c_deeref_Disk_and_Scratch_Disk_Pools_and_Their_Defaults.html) 1967-08-28 1968-07-29

Country Status (5)

Country Link
US (1) US3505598A (c_deeref_Disk_and_Scratch_Disk_Pools_and_Their_Defaults.html)
JP (1) JPS5132073B1 (c_deeref_Disk_and_Scratch_Disk_Pools_and_Their_Defaults.html)
DE (1) DE1766998C3 (c_deeref_Disk_and_Scratch_Disk_Pools_and_Their_Defaults.html)
FR (1) FR1576123A (c_deeref_Disk_and_Scratch_Disk_Pools_and_Their_Defaults.html)
GB (1) GB1239286A (c_deeref_Disk_and_Scratch_Disk_Pools_and_Their_Defaults.html)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3629852A (en) * 1969-02-13 1971-12-21 Pioneer Magnetics Inc Transient analyzer
US3739349A (en) * 1971-05-24 1973-06-12 Sperry Rand Corp Digital equipment interface unit
US3735261A (en) * 1971-06-07 1973-05-22 Northrop Corp Pulse analyzer
US3939405A (en) * 1974-08-19 1976-02-17 Deere & Company Apparatus and method for making decay rate measurements
US3928803A (en) * 1974-11-04 1975-12-23 Jean H Hugon Distribution function analyzer for measuring telephone equipment holding times
US4812943A (en) * 1987-12-24 1989-03-14 Sundstrand Corp. Current fault protection system
US4811136A (en) * 1987-12-24 1989-03-07 Jones Gregory D Phase controller for processing current and voltage faults
US4814934A (en) * 1987-12-24 1989-03-21 Sundstrand Corp. Voltage fault detector
US4879624A (en) * 1987-12-24 1989-11-07 Sundstrand Corporation Power controller
US5066909A (en) * 1990-01-30 1991-11-19 Hewlett-Packard Company Apparatus for testing an electronic circuit having an arbitrary output waveform
US5194818A (en) * 1991-02-27 1993-03-16 National Semiconductor Corporation Risetime and falltime test system and method
US5805460A (en) * 1994-10-21 1998-09-08 Alliedsignal Inc. Method for measuring RF pulse rise time, fall time and pulse width
GB2295236B (en) * 1994-10-21 1999-07-28 Allied Signal Inc Method for measuring pulse characteristics of a pulsed RF signal
US9310408B2 (en) * 2012-04-30 2016-04-12 Keysight Technologies, Inc. Power device analyzer
TW202526352A (zh) * 2023-12-06 2025-07-01 日商愛德萬測試股份有限公司 試驗裝置及試驗方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2517977A (en) * 1947-01-22 1950-08-08 Colonial Radio Corp Dynamic test apparatus for piezoelectric crystals
GB906068A (en) * 1959-11-04 1962-09-19 Atomic Energy Authority Uk Improvements in or relating to virtual-earth amplifiers
US3286180A (en) * 1962-06-22 1966-11-15 E H Res Lab Inc Electrical measuring apparatus for determining response time of transistors and the like
US3378785A (en) * 1964-11-02 1968-04-16 Weston Instruments Inc Ninety-degree amplifier phase shift circuit
US3437927A (en) * 1966-02-02 1969-04-08 Western Electric Co Peak detection system for arbitrary portions of repetitive pulses

Also Published As

Publication number Publication date
DE1766998C3 (de) 1981-06-25
GB1239286A (c_deeref_Disk_and_Scratch_Disk_Pools_and_Their_Defaults.html) 1971-07-14
DE1766998A1 (de) 1971-10-14
US3505598A (en) 1970-04-07
JPS5132073B1 (c_deeref_Disk_and_Scratch_Disk_Pools_and_Their_Defaults.html) 1976-09-10
DE1766998B2 (de) 1980-11-06

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Legal Events

Date Code Title Description
ST Notification of lapse