FR1439064A - Perfectionnements aux analyseurs ioniques - Google Patents

Perfectionnements aux analyseurs ioniques

Info

Publication number
FR1439064A
FR1439064A FR4833A FR4833A FR1439064A FR 1439064 A FR1439064 A FR 1439064A FR 4833 A FR4833 A FR 4833A FR 4833 A FR4833 A FR 4833A FR 1439064 A FR1439064 A FR 1439064A
Authority
FR
France
Prior art keywords
analyzers
ionic
ionic analyzers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR4833A
Other languages
English (en)
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Thales SA
Original Assignee
Centre National de la Recherche Scientifique CNRS
CSF Compagnie Generale de Telegraphie sans Fil SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS, CSF Compagnie Generale de Telegraphie sans Fil SA filed Critical Centre National de la Recherche Scientifique CNRS
Priority to FR4833A priority Critical patent/FR1439064A/fr
Priority to US525447A priority patent/US3500042A/en
Priority to GB5551/66A priority patent/GB1128851A/en
Priority to DE19661598245 priority patent/DE1598245C/de
Priority to JP41007212A priority patent/JPS4821068B1/ja
Application granted granted Critical
Publication of FR1439064A publication Critical patent/FR1439064A/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
    • H01J29/58—Arrangements for focusing or reflecting ray or beam
    • H01J29/60—Mirrors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/84—Traps for removing or diverting unwanted particles, e.g. negative ions, fringing electrons; Arrangements for velocity or mass selection
    • H01J29/845—Traps for removing or diverting unwanted particles, e.g. negative ions, fringing electrons; Arrangements for velocity or mass selection by means of magnetic systems
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/05—Electron or ion-optical arrangements for separating electrons or ions according to their energy or mass
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/284—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer
    • H01J49/286—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer with energy analysis, e.g. Castaing filter

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
FR4833A 1965-02-09 1965-02-09 Perfectionnements aux analyseurs ioniques Expired FR1439064A (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR4833A FR1439064A (fr) 1965-02-09 1965-02-09 Perfectionnements aux analyseurs ioniques
US525447A US3500042A (en) 1965-02-09 1966-02-07 Ionic microanalyzer which includes a convex mirror as an ion energy filter
GB5551/66A GB1128851A (en) 1965-02-09 1966-02-08 Improvements in ionic microanalyzers
DE19661598245 DE1598245C (de) 1965-02-09 1966-02-08 Ionen-Mikroanalysevorrichtung
JP41007212A JPS4821068B1 (enExample) 1965-02-09 1966-02-09

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR4833A FR1439064A (fr) 1965-02-09 1965-02-09 Perfectionnements aux analyseurs ioniques

Publications (1)

Publication Number Publication Date
FR1439064A true FR1439064A (fr) 1966-05-20

Family

ID=8570422

Family Applications (1)

Application Number Title Priority Date Filing Date
FR4833A Expired FR1439064A (fr) 1965-02-09 1965-02-09 Perfectionnements aux analyseurs ioniques

Country Status (4)

Country Link
US (1) US3500042A (enExample)
JP (1) JPS4821068B1 (enExample)
FR (1) FR1439064A (enExample)
GB (1) GB1128851A (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3749926A (en) * 1971-08-03 1973-07-31 Du Pont Charged particle energy analysis
US3783278A (en) * 1971-12-02 1974-01-01 Bell & Howell Co Single magnet tandem mass spectrometer
FR2193253B1 (enExample) * 1972-07-21 1975-03-07 Cameca
US4074139A (en) * 1976-12-27 1978-02-14 Rca Corporation Apparatus and method for maskless ion implantation
DE2753412C2 (de) * 1977-11-30 1983-06-23 Max Planck Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen Rotationssymmetrischer Ionen-Elektronen-Konverter
JPS6032309B2 (ja) * 1981-03-23 1985-07-27 株式会社村田製作所 質量分析装置
JPS6037642A (ja) * 1983-08-10 1985-02-27 Hitachi Ltd イオン打込装置用質量分離器
JPH08236067A (ja) * 1994-12-28 1996-09-13 Ebara Corp 磁場型質量分析器

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3126477A (en) * 1964-03-24 Multiple dispersion mass spectrometer
US2772363A (en) * 1952-03-21 1956-11-27 Cons Electrodynamics Corp Method and apparatus for ionization of solids
US2947868A (en) * 1959-07-27 1960-08-02 Geophysics Corp Of America Mass spectrometer
FR1240658A (fr) * 1959-07-30 1960-09-09 Centre Nat Rech Scient Dispositif permettant d'obtenir différentes images ioniques de la surface d'un échantillon, et donnant séparément la distribution superficielle de chaque élément constitutif de l'échantillon à étudier
FR1352167A (fr) * 1962-11-28 1964-02-14 Ct Nat De La Rech Scient Et Cs Nouveau dispositif de microanalyse par émission ionique secondaire

Also Published As

Publication number Publication date
DE1598245A1 (de) 1970-05-21
US3500042A (en) 1970-03-10
DE1598245B2 (de) 1973-01-18
GB1128851A (en) 1968-10-02
JPS4821068B1 (enExample) 1973-06-26

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