FR1357829A - X-ray analyzer - Google Patents

X-ray analyzer

Info

Publication number
FR1357829A
FR1357829A FR926501A FR926501A FR1357829A FR 1357829 A FR1357829 A FR 1357829A FR 926501 A FR926501 A FR 926501A FR 926501 A FR926501 A FR 926501A FR 1357829 A FR1357829 A FR 1357829A
Authority
FR
France
Prior art keywords
ray analyzer
analyzer
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR926501A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Compagnie Francaise Thomson Houston SA
Original Assignee
Compagnie Francaise Thomson Houston SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Compagnie Francaise Thomson Houston SA filed Critical Compagnie Francaise Thomson Houston SA
Priority to FR926501A priority Critical patent/FR1357829A/en
Application granted granted Critical
Publication of FR1357829A publication Critical patent/FR1357829A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
    • H01J47/08—Geiger-Müller counter tubes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
FR926501A 1962-03-01 1963-03-01 X-ray analyzer Expired FR1357829A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR926501A FR1357829A (en) 1962-03-01 1963-03-01 X-ray analyzer

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US17659562A 1962-03-01 1962-03-01
FR926501A FR1357829A (en) 1962-03-01 1963-03-01 X-ray analyzer

Publications (1)

Publication Number Publication Date
FR1357829A true FR1357829A (en) 1964-04-10

Family

ID=26200041

Family Applications (1)

Application Number Title Priority Date Filing Date
FR926501A Expired FR1357829A (en) 1962-03-01 1963-03-01 X-ray analyzer

Country Status (1)

Country Link
FR (1) FR1357829A (en)

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