FR1406850A - Chi ray spectrometer - Google Patents

Chi ray spectrometer

Info

Publication number
FR1406850A
FR1406850A FR987162A FR987162A FR1406850A FR 1406850 A FR1406850 A FR 1406850A FR 987162 A FR987162 A FR 987162A FR 987162 A FR987162 A FR 987162A FR 1406850 A FR1406850 A FR 1406850A
Authority
FR
France
Prior art keywords
ray spectrometer
chi
chi ray
spectrometer
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR987162A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Priority to FR987162A priority Critical patent/FR1406850A/en
Application granted granted Critical
Publication of FR1406850A publication Critical patent/FR1406850A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
FR987162A 1963-09-04 1964-09-04 Chi ray spectrometer Expired FR1406850A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR987162A FR1406850A (en) 1963-09-04 1964-09-04 Chi ray spectrometer

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US30645363A 1963-09-04 1963-09-04
FR987162A FR1406850A (en) 1963-09-04 1964-09-04 Chi ray spectrometer

Publications (1)

Publication Number Publication Date
FR1406850A true FR1406850A (en) 1965-07-23

Family

ID=26209802

Family Applications (1)

Application Number Title Priority Date Filing Date
FR987162A Expired FR1406850A (en) 1963-09-04 1964-09-04 Chi ray spectrometer

Country Status (1)

Country Link
FR (1) FR1406850A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0189040A2 (en) * 1985-01-25 1986-07-30 Westinghouse Electric Corporation Method for monitoring the crystallographic texture of metallic tubes by use of x-ray diffraction

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0189040A2 (en) * 1985-01-25 1986-07-30 Westinghouse Electric Corporation Method for monitoring the crystallographic texture of metallic tubes by use of x-ray diffraction
EP0189040A3 (en) * 1985-01-25 1987-03-25 Westinghouse Electric Corporation Method for monitoring the crystallographic texture of metallic tubes by use of x-ray diffraction

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