FR1182846A - Method and apparatus for testing semiconductor materials - Google Patents

Method and apparatus for testing semiconductor materials

Info

Publication number
FR1182846A
FR1182846A FR1182846DA FR1182846A FR 1182846 A FR1182846 A FR 1182846A FR 1182846D A FR1182846D A FR 1182846DA FR 1182846 A FR1182846 A FR 1182846A
Authority
FR
France
Prior art keywords
semiconductor materials
testing semiconductor
testing
materials
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ASSOCIATED ELECTRICAL IND CO L
Original Assignee
ASSOCIATED ELECTRICAL IND CO L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ASSOCIATED ELECTRICAL IND CO L filed Critical ASSOCIATED ELECTRICAL IND CO L
Application granted granted Critical
Publication of FR1182846A publication Critical patent/FR1182846A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2637—Circuits therefor for testing other individual devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
FR1182846D 1956-09-17 1957-09-17 Method and apparatus for testing semiconductor materials Expired FR1182846A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1182846X 1956-09-17

Publications (1)

Publication Number Publication Date
FR1182846A true FR1182846A (en) 1959-06-30

Family

ID=10880456

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1182846D Expired FR1182846A (en) 1956-09-17 1957-09-17 Method and apparatus for testing semiconductor materials

Country Status (1)

Country Link
FR (1) FR1182846A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1136017B (en) * 1959-09-24 1962-09-06 Telefunken Patent Method for measuring the electrical quantities of a semiconductor crystal

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1136017B (en) * 1959-09-24 1962-09-06 Telefunken Patent Method for measuring the electrical quantities of a semiconductor crystal

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