FI955844A0 - Expression measuring device - Google Patents

Expression measuring device

Info

Publication number
FI955844A0
FI955844A0 FI955844A FI955844A FI955844A0 FI 955844 A0 FI955844 A0 FI 955844A0 FI 955844 A FI955844 A FI 955844A FI 955844 A FI955844 A FI 955844A FI 955844 A0 FI955844 A0 FI 955844A0
Authority
FI
Finland
Prior art keywords
measuring device
expression measuring
expression
measuring
Prior art date
Application number
FI955844A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI112115B (en
FI955844A (en
Inventor
Karlheinz Schaust
Reiner Henn
Original Assignee
Honeywell Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell Ag filed Critical Honeywell Ag
Publication of FI955844A0 publication Critical patent/FI955844A0/en
Publication of FI955844A publication Critical patent/FI955844A/en
Application granted granted Critical
Publication of FI112115B publication Critical patent/FI112115B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
FI955844A 1993-06-07 1995-12-05 Surface pressure measuring device FI112115B (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
EP93109108 1993-06-07
EP93109108A EP0628808B1 (en) 1993-06-07 1993-06-07 Apparatus for measuring basis weight
PCT/EP1994/001797 WO1994029700A1 (en) 1993-06-07 1994-06-03 Device for the determination of weight per unit area
EP9401797 1994-06-03

Publications (3)

Publication Number Publication Date
FI955844A0 true FI955844A0 (en) 1995-12-05
FI955844A FI955844A (en) 1995-12-05
FI112115B FI112115B (en) 2003-10-31

Family

ID=8212969

Family Applications (1)

Application Number Title Priority Date Filing Date
FI955844A FI112115B (en) 1993-06-07 1995-12-05 Surface pressure measuring device

Country Status (7)

Country Link
EP (1) EP0628808B1 (en)
JP (1) JPH09502014A (en)
KR (1) KR100307030B1 (en)
CN (1) CN1089901C (en)
DE (1) DE59308548D1 (en)
FI (1) FI112115B (en)
WO (1) WO1994029700A1 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE59605018D1 (en) * 1995-03-17 2000-05-31 Honeywell Ag Device for measuring the basis weight
DE19913929A1 (en) * 1999-03-26 2000-09-28 Voith Sulzer Papiertech Patent Equipment determining properties of band of paper, comprises source of electromagnetic or particulate radiation passing through or reflected by band to detector array with irregular subdivision
WO2002090939A1 (en) * 2001-05-09 2002-11-14 Vinod Unnikrishna Kurup Equipment for determining weight per unit area
US6995372B2 (en) * 2003-02-12 2006-02-07 Voith Paper Patent Gmbh Nuclear gauge for measuring a characteristic of a sheet material with sheet position and alignment compensation
SE525320C2 (en) * 2003-06-06 2005-02-01 More Res Oernskoeldsvik Ab Method and apparatus for assessing / measuring surface weight variation of sheet material
US7005639B2 (en) * 2003-07-28 2006-02-28 Abb Inc. System and method of composition correction for beta gauges
DE102004057743B4 (en) * 2004-09-08 2007-08-09 Mahlo Gmbh & Co Kg Method and device for determining the basis weight of a conveyed material sample
JP4919115B2 (en) 2009-09-24 2012-04-18 横河電機株式会社 Radiation inspection equipment
US8660682B2 (en) * 2010-11-22 2014-02-25 Honeywell Asca Inc. Air wipe and sheet guide temperature control on paper and continuous web scanners

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1812893A1 (en) * 1968-12-05 1970-06-18 Knapsack Ag, 5033 Knapsack Arrangement for measuring the thickness of rolling stock, especially foils
US4047029A (en) * 1976-07-02 1977-09-06 Allport John J Self-compensating X-ray or γ-ray thickness gauge
EP0233389A1 (en) * 1986-02-12 1987-08-26 Josef W. Repsch A method of measuring the weight per unit area, density and thickness of a moving sheet
CA1307056C (en) * 1987-03-31 1992-09-01 Adaptive Technologies, Inc. Thickness/density measuring apparatus

Also Published As

Publication number Publication date
JPH09502014A (en) 1997-02-25
CN1089901C (en) 2002-08-28
FI112115B (en) 2003-10-31
KR960702106A (en) 1996-03-28
EP0628808B1 (en) 1998-05-13
CN1125002A (en) 1996-06-19
WO1994029700A1 (en) 1994-12-22
FI955844A (en) 1995-12-05
KR100307030B1 (en) 2001-12-17
DE59308548D1 (en) 1998-06-18
EP0628808A1 (en) 1994-12-14

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