FI944023A - Menetelmä poikkeamien tunnistamiseksi tarkastettavasta pinnasta - Google Patents

Menetelmä poikkeamien tunnistamiseksi tarkastettavasta pinnasta Download PDF

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Publication number
FI944023A
FI944023A FI944023A FI944023A FI944023A FI 944023 A FI944023 A FI 944023A FI 944023 A FI944023 A FI 944023A FI 944023 A FI944023 A FI 944023A FI 944023 A FI944023 A FI 944023A
Authority
FI
Finland
Prior art keywords
inspected
identifying deviations
deviations
identifying
Prior art date
Application number
FI944023A
Other languages
English (en)
Swedish (sv)
Other versions
FI100366B (fi
FI944023A0 (fi
Inventor
Pertti Kontio
Original Assignee
Rautaruukki Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rautaruukki Oy filed Critical Rautaruukki Oy
Priority to FI944023A priority Critical patent/FI100366B/fi
Publication of FI944023A0 publication Critical patent/FI944023A0/fi
Priority to PCT/FI1995/000469 priority patent/WO1996007158A2/en
Publication of FI944023A publication Critical patent/FI944023A/fi
Application granted granted Critical
Publication of FI100366B publication Critical patent/FI100366B/fi

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20021—Dividing image into blocks, subimages or windows
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Image Analysis (AREA)
  • Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
FI944023A 1994-09-01 1994-09-01 Menetelmä poikkeamien tunnistamiseksi tarkastettavasta pinnasta FI100366B (fi)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FI944023A FI100366B (fi) 1994-09-01 1994-09-01 Menetelmä poikkeamien tunnistamiseksi tarkastettavasta pinnasta
PCT/FI1995/000469 WO1996007158A2 (en) 1994-09-01 1995-09-01 Method for detecting imperfections on a surface inspected

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI944023A FI100366B (fi) 1994-09-01 1994-09-01 Menetelmä poikkeamien tunnistamiseksi tarkastettavasta pinnasta

Publications (3)

Publication Number Publication Date
FI944023A0 FI944023A0 (fi) 1994-09-01
FI944023A true FI944023A (fi) 1996-03-02
FI100366B FI100366B (fi) 1997-11-14

Family

ID=8541287

Family Applications (1)

Application Number Title Priority Date Filing Date
FI944023A FI100366B (fi) 1994-09-01 1994-09-01 Menetelmä poikkeamien tunnistamiseksi tarkastettavasta pinnasta

Country Status (2)

Country Link
FI (1) FI100366B (fi)
WO (1) WO1996007158A2 (fi)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI20070085L (fi) * 2007-02-01 2008-08-02 Piitek Oy Lajittelumenetelmä
AT511399B1 (de) * 2011-05-13 2013-09-15 Polymer Competence Ct Leoben Gmbh Verfahren zur automatisierten klassifikation von einschlüssen

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0048568A3 (en) * 1980-09-19 1983-09-21 Trw Inc. Defect analysis system
US4519041A (en) * 1982-05-03 1985-05-21 Honeywell Inc. Real time automated inspection
JP3118725B2 (ja) * 1991-09-11 2000-12-18 株式会社日立製作所 自動分類方法
US5274713A (en) * 1991-09-23 1993-12-28 Industrial Technology Research Institute Real-time apparatus for detecting surface defects on objects
GB2270227A (en) * 1992-08-28 1994-03-02 Surface Inspection Ltd Linescan visual monitoring system

Also Published As

Publication number Publication date
FI100366B (fi) 1997-11-14
WO1996007158A3 (en) 1996-03-28
WO1996007158A2 (en) 1996-03-07
FI944023A0 (fi) 1994-09-01

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Owner name: SPECTRA-PHYSICS VISIONTECH OY