FI884609A - Foerfarande och anordning foer att utfoera en optisk maetning i en automatisk analysapparat. - Google Patents

Foerfarande och anordning foer att utfoera en optisk maetning i en automatisk analysapparat. Download PDF

Info

Publication number
FI884609A
FI884609A FI884609A FI884609A FI884609A FI 884609 A FI884609 A FI 884609A FI 884609 A FI884609 A FI 884609A FI 884609 A FI884609 A FI 884609A FI 884609 A FI884609 A FI 884609A
Authority
FI
Finland
Prior art keywords
analysapparat
optisk
automatisk
maetning
anordning foer
Prior art date
Application number
FI884609A
Other languages
English (en)
Finnish (fi)
Other versions
FI884609A0 (fi
Inventor
Koichi Wakatake
Hidehiko Fujioka
Original Assignee
Nittec Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nittec Co Ltd filed Critical Nittec Co Ltd
Publication of FI884609A publication Critical patent/FI884609A/fi
Publication of FI884609A0 publication Critical patent/FI884609A0/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/251—Colorimeters; Construction thereof
    • G01N21/253—Colorimeters; Construction thereof for batch operation, i.e. multisample apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/025—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N2021/3129—Determining multicomponents by multiwavelength light
    • G01N2021/3133—Determining multicomponents by multiwavelength light with selection of wavelengths before the sample
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0439—Rotary sample carriers, i.e. carousels
    • G01N2035/0444—Rotary sample carriers, i.e. carousels for cuvettes or reaction vessels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/04—Batch operation; multisample devices
    • G01N2201/0415—Carrusel, sequential

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
FI884609A 1987-02-20 1988-10-07 Foerfarande och anordning foer att utfoera en optisk maetning i en automatisk analysapparat. FI884609A0 (fi)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP3587787 1987-02-20
JP62323774A JPS64451A (en) 1987-02-20 1987-12-23 Method and instrument for optical measurement with automatic analysis device
PCT/JP1988/000161 WO1988006286A1 (en) 1987-02-20 1988-02-17 Optical measurement method and apparatus therefor in automatic analyzer

Publications (2)

Publication Number Publication Date
FI884609A true FI884609A (fi) 1988-10-07
FI884609A0 FI884609A0 (fi) 1988-10-07

Family

ID=26374883

Family Applications (1)

Application Number Title Priority Date Filing Date
FI884609A FI884609A0 (fi) 1987-02-20 1988-10-07 Foerfarande och anordning foer att utfoera en optisk maetning i en automatisk analysapparat.

Country Status (7)

Country Link
EP (1) EP0303707A4 (ko)
JP (1) JPS64451A (ko)
KR (1) KR890700820A (ko)
CN (1) CN1016281B (ko)
AU (1) AU605840B2 (ko)
FI (1) FI884609A0 (ko)
WO (1) WO1988006286A1 (ko)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01145552A (ja) * 1987-12-02 1989-06-07 Olympus Optical Co Ltd 自動分析装置
US5116122A (en) * 1991-03-14 1992-05-26 Shimadzu Corporation Spectrophotometer
US5345395A (en) * 1991-10-31 1994-09-06 Baxter Diagnostics Inc. Specimen processing and analyzing systems and methods using photometry
AUPN825796A0 (en) * 1996-02-26 1996-03-14 Ashdown, Martin The application of infrared (ir) spectrometry to the investigations of components of blood and other body fluids
JP2006125953A (ja) * 2004-10-28 2006-05-18 Jeol Ltd 生化学自動分析装置
JP4598682B2 (ja) 2006-01-23 2010-12-15 株式会社日立ハイテクノロジーズ 自動分析装置
JP5134862B2 (ja) * 2007-05-16 2013-01-30 株式会社日立ハイテクノロジーズ 分析装置
JP5743558B2 (ja) * 2011-01-12 2015-07-01 株式会社東芝 分析装置
JP6129568B2 (ja) * 2013-01-31 2017-05-17 株式会社日立ハイテクノロジーズ 自動分析装置
JP6276087B2 (ja) * 2014-03-28 2018-02-07 シスメックス株式会社 検体分析装置及び検体分析方法
JP6312313B2 (ja) * 2014-04-17 2018-04-18 日本電子株式会社 自動分析装置及び自動分析方法
WO2018017762A1 (en) 2016-07-21 2018-01-25 Siemens Healthcare Diagnostics Inc. Eliminating source lamp intensity drift effect using reference measurement between cuvettes

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1648841A1 (de) * 1967-10-18 1971-07-22 Bodenseewerk Perkin Elmer Co Einstrahl-Photometer
US3609047A (en) * 1970-03-02 1971-09-28 Xerox Corp Single beam photometer system wherein the absorbance of a sample is determined relative to a reference
DE2408646A1 (de) * 1974-02-22 1975-08-28 Max Planck Gesellschaft Reaktionskinetisches messgeraet
JPS5630650A (en) * 1979-08-22 1981-03-27 Hitachi Ltd Automatic chemical analyzer
FR2470962A1 (fr) * 1979-11-30 1981-06-12 Instruments Sa Dispositif de mesure optique d'un parametre relatif a des echantillons de substances sous forme liquide et procede de mesure correspondant
JPS5772047A (en) * 1980-10-24 1982-05-06 Olympus Optical Co Ltd Component analyzing method
JPS60142234A (ja) * 1983-12-28 1985-07-27 Shimadzu Corp 自動分析装置
JPS6166950A (ja) * 1984-09-11 1986-04-05 Nippon Tectron Co Ltd 血液自動分析装置のデ−タ処理装置
JPH0518090A (ja) * 1991-07-10 1993-01-26 Asahi Chem Ind Co Ltd 薄石複合パネル構造体
JP2957797B2 (ja) * 1992-03-18 1999-10-06 三洋電機株式会社 光記録媒体の多重記録方法

Also Published As

Publication number Publication date
EP0303707A4 (en) 1990-05-14
AU605840B2 (en) 1991-01-24
JPS64451A (en) 1989-01-05
CN1016281B (zh) 1992-04-15
EP0303707A1 (en) 1989-02-22
WO1988006286A1 (en) 1988-08-25
CN88100938A (zh) 1988-09-14
KR890700820A (ko) 1989-04-27
FI884609A0 (fi) 1988-10-07
AU1297788A (en) 1988-09-14

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Legal Events

Date Code Title Description
FD Application lapsed
MM Patent lapsed

Owner name: NITTEC CO., LTD.