FI871929A0 - Interferometrisk maetanordning med gemensam optisk bana. - Google Patents

Interferometrisk maetanordning med gemensam optisk bana.

Info

Publication number
FI871929A0
FI871929A0 FI871929A FI871929A FI871929A0 FI 871929 A0 FI871929 A0 FI 871929A0 FI 871929 A FI871929 A FI 871929A FI 871929 A FI871929 A FI 871929A FI 871929 A0 FI871929 A0 FI 871929A0
Authority
FI
Finland
Prior art keywords
optical
optical path
beams
measurement
interferometric
Prior art date
Application number
FI871929A
Other languages
English (en)
Other versions
FI89307B (fi
FI871929A (fi
FI89307C (fi
Inventor
James P Waters
Mark R Fernald
Original Assignee
United Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by United Technologies Corp filed Critical United Technologies Corp
Publication of FI871929A0 publication Critical patent/FI871929A0/fi
Publication of FI871929A publication Critical patent/FI871929A/fi
Publication of FI89307B publication Critical patent/FI89307B/fi
Application granted granted Critical
Publication of FI89307C publication Critical patent/FI89307C/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062—Active error reduction, i.e. varying with time
    • G01B9/02064—Active error reduction, i.e. varying with time by particular adjustment of coherence gate, i.e. adjusting position of zero path difference in low coherence interferometry
    • G01B9/02065—Active error reduction, i.e. varying with time by particular adjustment of coherence gate, i.e. adjusting position of zero path difference in low coherence interferometry using a second interferometer before or after measuring interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02056—Passive reduction of errors
    • G01B9/02057—Passive reduction of errors by using common path configuration, i.e. reference and object path almost entirely overlapping
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J2009/0226—Fibres

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Measuring Cells (AREA)
  • Optical Fibers, Optical Fiber Cores, And Optical Fiber Bundles (AREA)
  • Spectrometry And Color Measurement (AREA)
FI871929A 1985-09-03 1987-04-30 Interferometrisk maetanordning med gemensam optisk bana FI89307C (fi)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US06/772,106 US4627731A (en) 1985-09-03 1985-09-03 Common optical path interferometric gauge
US77210685 1985-09-03
PCT/US1986/001798 WO1987001438A1 (en) 1985-09-03 1986-09-02 A common optical path interferometric gauge
US8601798 1986-09-02

Publications (4)

Publication Number Publication Date
FI871929A0 true FI871929A0 (fi) 1987-04-30
FI871929A FI871929A (fi) 1987-04-30
FI89307B FI89307B (fi) 1993-05-31
FI89307C FI89307C (fi) 1993-09-10

Family

ID=25093939

Family Applications (1)

Application Number Title Priority Date Filing Date
FI871929A FI89307C (fi) 1985-09-03 1987-04-30 Interferometrisk maetanordning med gemensam optisk bana

Country Status (7)

Country Link
US (1) US4627731A (fi)
EP (1) EP0241512B1 (fi)
JP (1) JPH0652164B2 (fi)
AT (1) ATE74425T1 (fi)
DE (1) DE3684703D1 (fi)
FI (1) FI89307C (fi)
WO (1) WO1987001438A1 (fi)

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FR2613065B1 (fr) * 1987-03-24 1991-07-26 Electricite De France Interferometre de michelson a fibres optiques et son application notamment a la mesure des temperatures
US4784489A (en) * 1987-04-29 1988-11-15 Hewlett-Packard Company Fiber-optic based remote receiver for laser interferometer systems
US4902888A (en) * 1987-12-15 1990-02-20 Brother Kogyo Kabushiki Kaisha Optical fiber sensor
US4892406A (en) * 1988-01-11 1990-01-09 United Technologies Corporation Method of and arrangement for measuring vibrations
US4969736A (en) * 1988-06-17 1990-11-13 Slotwinski Anthony R Integrated fiber optic coupled proximity sensor for robotic end effectors and tools
FR2634080B1 (fr) * 1988-07-08 1991-04-19 Thomson Csf Dispositif de lecture par coherence de capteur optique
US4940328A (en) * 1988-11-04 1990-07-10 Georgia Tech Research Corporation Optical sensing apparatus and method
DE3841742A1 (de) * 1988-12-10 1990-06-13 Hueser Teuchert Dorothee Koordinatenmesstaster mit absolutinterferometrischem beruehrungslosem messprinzip
US4938596A (en) * 1989-01-05 1990-07-03 The University Of Rochester Phase conjugate, common path interferometer
AT396179B (de) * 1989-06-07 1993-06-25 Tabarelli Werner Interferometeranordnung
GB8926574D0 (en) * 1989-11-24 1990-01-17 Renishaw Plc Laser interferometer
AT397307B (de) * 1990-03-02 1994-03-25 Tabarelli Werner Interferometer insbesondere zur längenmessung
CA2013406C (en) * 1990-03-29 1998-06-16 Rene Heon Optical detection of a surface motion of an object
JPH06500857A (ja) * 1990-08-31 1994-01-27 コモンウェルス・サイエンティフィック・アンド・インダストリアル・リサーチ・オーガナイゼイション 干渉顕微鏡
IT1244170B (it) * 1990-12-04 1994-07-08 Cise Spa Apparecchiatura laser per la misura della velocita' di un fluido.
US5153669A (en) * 1991-03-27 1992-10-06 Hughes Danbury Optical Systems, Inc. Three wavelength optical measurement apparatus and method
US5159408A (en) * 1991-03-27 1992-10-27 Hughes Danbury Optical Systems, Inc. Optical thickness profiler using synthetic wavelengths
US5381229A (en) * 1991-03-29 1995-01-10 Center For Innovative Technology Sapphire optical fiber interferometer
DE69227902T3 (de) * 1991-04-29 2010-04-22 Massachusetts Institute Of Technology, Cambridge Vorrichtung für optische abbildung und messung
US5402230A (en) * 1991-12-16 1995-03-28 Tsinghua University Heterodyne interferometric optical fiber displacement sensor for measuring displacement of an object
CA2133556A1 (en) * 1992-04-03 1993-10-14 Steven James Friskin Improvements to optical phase shifting
US5323229A (en) * 1992-08-31 1994-06-21 Science Applications International Corporation Measurement system using optical coherence shifting interferometry
FR2699270A1 (fr) * 1992-12-10 1994-06-17 Merlin Gerin Capteur optique intégré pour la détection de la variation de chemin optique d'un faisceau lumineux.
JP3234353B2 (ja) * 1993-06-15 2001-12-04 富士写真フイルム株式会社 断層情報読取装置
BE1007876A4 (nl) * 1993-12-17 1995-11-07 Philips Electronics Nv Stralingsbron-eenheid voor het opwekken van een bundel met twee polarisatierichtingen en twee frequenties.
US5600440A (en) * 1995-07-05 1997-02-04 The United States Of America As Represented By The Secretary Of The Navy Liquid crystal interferometer
US6552803B1 (en) 1998-02-24 2003-04-22 Kla-Tencor Corporation Detection of film thickness through induced acoustic pulse-echos
DE19819762A1 (de) * 1998-05-04 1999-11-25 Bosch Gmbh Robert Interferometrische Meßeinrichtung
US6369888B1 (en) * 1999-11-17 2002-04-09 Applied Materials, Inc. Method and apparatus for article inspection including speckle reduction
JP4478302B2 (ja) * 2000-06-30 2010-06-09 キヤノン株式会社 干渉装置及びそれを搭載した半導体露光装置
DE10057540A1 (de) † 2000-11-20 2002-06-06 Bosch Gmbh Robert Interferometrische Messvorrichtung
US6985219B2 (en) * 2000-12-21 2006-01-10 Credence Systems Corporation Optical coupling for testing integrated circuits
US6873419B2 (en) * 2001-11-16 2005-03-29 National Research Council Of Canada Method and apparatus for three-dimensional compositional mapping of heterogeneous materials
DE10246798B3 (de) * 2002-10-08 2004-06-09 Robert Bosch Gmbh Interferometrische Messeinrichtung
DE10351319B4 (de) * 2003-10-31 2005-10-20 Med Laserzentrum Luebeck Gmbh Interferometer für die optische Kohärenztomographie
DE10360078A1 (de) * 2003-12-20 2005-07-21 Robert Bosch Gmbh Optische Messvorrichtung
US7502121B1 (en) * 2004-11-24 2009-03-10 Ahbee 1, L.P. Temperature insensitive low coherence based optical metrology for nondestructive characterization of physical characteristics of materials
US7319514B2 (en) * 2004-12-23 2008-01-15 Baker Hughes Incorporated Optical inclination sensor
DE102005009482B3 (de) * 2005-02-23 2006-06-14 V&M Deutschland Gmbh Verfahren und Vorrichtung zur Überwachung des Fertigungsprozesses zur Herstellung von warmgefertigten Rohren aus Stahl
EP2461131B1 (en) 2005-03-17 2017-08-09 The Board of Trustees of The Leland Stanford Junior University Apparatus and method for frequency-domain optical coherence tomography
EP1866616B1 (en) 2005-04-05 2013-01-16 The Board Of Trustees Of The Leland Stanford Junior University Optical image processing using minimum phase functions
US7379191B2 (en) * 2005-05-20 2008-05-27 The Boeing Company Optical MEMS wavefront diagnostic transceivers and receiver
DE102007018817A1 (de) * 2007-04-20 2008-10-23 Robert Bosch Gmbh Verfahren und Vorrichtung zur Druckmessung
DE102007022217A1 (de) * 2007-05-11 2008-11-13 Robert Bosch Gmbh Interferometrische Messeinrichtung
EP2037214A1 (de) * 2007-09-14 2009-03-18 Leica Geosystems AG Verfahren und Messgerät zum vermessen von Oberflächen
JP5752040B2 (ja) * 2008-09-11 2015-07-22 ニコン・メトロロジー・エヌヴェ 対チャープｆｍｃｗコヒーレントレーザレーダー用の小型の光ファイバ配置
DE102009027266A1 (de) * 2009-06-29 2010-12-30 Robert Bosch Gmbh Interferometrische Weg- und/oder Drehmessvorrichtung
FR2959305B1 (fr) * 2010-04-26 2014-09-05 Nanotec Solution Dispositif optique et procede d'inspection d'objets structures.
EP2541193A1 (de) 2011-06-27 2013-01-02 Hexagon Technology Center GmbH Interferometrisches Entfernungsmessverfahren zum Vermessen von Oberflächen und ebensolche Messanordnung
WO2018031462A1 (en) * 2016-08-12 2018-02-15 Canon U.S.A. Inc. Coherence range imaging using common path interference
US10660523B2 (en) * 2017-07-07 2020-05-26 Hideo Ando Light-source unit, measurement apparatus, near-infrared microscopic apparatus, optical detection method, imaging method, calculation method, functional bio-related substance, state management method, and manufacturing method

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US3877813A (en) * 1972-08-21 1975-04-15 Rockwell International Corp Self-compensating interferometer
US3812496A (en) * 1972-08-22 1974-05-21 Trw Inc Optical signal recording system
US4013366A (en) * 1973-05-23 1977-03-22 Office National D'etudes Et De Recherches Aerospatiales (O.N.E.R.A.) Method and apparatus for investigation of small displacements of a solid body by means of coherent light
US4410244A (en) * 1977-12-23 1983-10-18 Randwal Instrument Co., Inc. Retinal acuity testing device
JPS5621004A (en) * 1979-07-30 1981-02-27 Toshiba Corp Optical sensing system
DE3044183A1 (de) * 1980-11-24 1982-06-24 Reinhard Dipl.-Phys. Dr. 7250 Leonberg Ulrich Verfahren zur optischen messung von laengen und laengenaenderungen und anordnung zur durchfuehrung des verfahrens
US4352565A (en) * 1981-01-12 1982-10-05 Rowe James M Speckle pattern interferometer
WO1982004311A1 (en) * 1981-05-26 1982-12-09 Inc Gould Fiber optic interferometer

Also Published As

Publication number Publication date
JPH0652164B2 (ja) 1994-07-06
DE3684703D1 (de) 1992-05-07
US4627731A (en) 1986-12-09
EP0241512A4 (en) 1990-11-28
FI89307B (fi) 1993-05-31
EP0241512B1 (en) 1992-04-01
ATE74425T1 (de) 1992-04-15
EP0241512A1 (en) 1987-10-21
FI871929A (fi) 1987-04-30
JPS63500744A (ja) 1988-03-17
WO1987001438A1 (en) 1987-03-12
FI89307C (fi) 1993-09-10

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Owner name: UNITED TECHNOLOGIES CORPORATION