FI831714A0 - Maetanordning foer maetning av ett materialark - Google Patents

Maetanordning foer maetning av ett materialark

Info

Publication number
FI831714A0
FI831714A0 FI831714A FI831714A FI831714A0 FI 831714 A0 FI831714 A0 FI 831714A0 FI 831714 A FI831714 A FI 831714A FI 831714 A FI831714 A FI 831714A FI 831714 A0 FI831714 A0 FI 831714A0
Authority
FI
Finland
Prior art keywords
materialark
ett
foer maetning
maetanordning
maetanordning foer
Prior art date
Application number
FI831714A
Other languages
English (en)
Other versions
FI76435C (fi
FI76435B (fi
FI831714L (fi
Inventor
John Dahlquist
John Goss
Gunnar Wennerberg
Original Assignee
Measurex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Measurex Corp filed Critical Measurex Corp
Publication of FI831714A0 publication Critical patent/FI831714A0/fi
Publication of FI831714L publication Critical patent/FI831714L/fi
Application granted granted Critical
Publication of FI76435B publication Critical patent/FI76435B/fi
Publication of FI76435C publication Critical patent/FI76435C/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/48—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using wave or particle radiation means
    • G01D5/50—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using wave or particle radiation means derived from a radioactive source
    • G01D5/52—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using wave or particle radiation means derived from a radioactive source detected by a counter tube
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/40—Caliper-like sensors
    • G01B2210/42—Caliper-like sensors with one or more detectors on a single side of the object to be measured and with a backing surface of support or reference on the other side
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/40—Caliper-like sensors
    • G01B2210/46—Caliper-like sensors with one or more detectors on a single side of the object to be measured and with a transmitter on the other side

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Paper (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
FI831714A 1982-05-17 1983-05-16 Maetanordning foer maetning av ett arkmaterial. FI76435C (fi)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US37937782A 1982-05-17 1982-05-17
US37937782 1982-05-17

Publications (4)

Publication Number Publication Date
FI831714A0 true FI831714A0 (fi) 1983-05-16
FI831714L FI831714L (fi) 1983-11-18
FI76435B FI76435B (fi) 1988-06-30
FI76435C FI76435C (fi) 1988-10-10

Family

ID=23496984

Family Applications (1)

Application Number Title Priority Date Filing Date
FI831714A FI76435C (fi) 1982-05-17 1983-05-16 Maetanordning foer maetning av ett arkmaterial.

Country Status (7)

Country Link
US (1) US4678915B1 (fi)
EP (1) EP0094669B1 (fi)
JP (1) JPS5920806A (fi)
CA (1) CA1205925A (fi)
DE (1) DE3370181D1 (fi)
FI (1) FI76435C (fi)
IE (1) IE54249B1 (fi)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4970895A (en) * 1985-05-02 1990-11-20 Measurex Corporation System and method for the determination of certain physical characteristics of sheet materials.
US4866984A (en) * 1985-10-04 1989-09-19 Measurex Corporation Sensor and system for continuous determination of paper strength
US5010766A (en) * 1989-11-30 1991-04-30 Impact Systems, Inc. Error compensation for measuring gauges
US5164048A (en) * 1990-08-29 1992-11-17 Measurex Corporation Cooling structure for stabilizing the temperature of beams in a sheet-making apparatus
US5103471A (en) * 1991-01-17 1992-04-07 Spongr Jerry J Apparatus for measuring the thickness of a coating
US5099125A (en) * 1991-02-15 1992-03-24 Abb Process Automation Inc. Sheet material sensor compensation
US5117686A (en) * 1991-04-18 1992-06-02 Abb Process Automation Inc. Scanning head position sensing for web characteristic measuring system
US5233195A (en) * 1992-02-25 1993-08-03 Abb Process Automation, Inc. Methods and apparatus for measuring characteristics of moving webs
US5457539A (en) * 1993-06-18 1995-10-10 Abb Industrial Systems, Inc. On-line compensation for deflection in instruments using focused beams
EP0732569B1 (de) * 1995-03-17 2000-04-26 Honeywell Ag Vorrichtung zur Flächengewichtsmessung
US5714763A (en) * 1996-03-25 1998-02-03 Measurex Corporation Method and apparatus for optical alignment of a measuring head in an X-Y plane
US5773714A (en) * 1997-02-19 1998-06-30 Honeywell-Measurex Corporation Scanner beam dynamic deflection measurement system and method
US5915277A (en) * 1997-06-23 1999-06-22 General Electric Co. Probe and method for inspecting an object
US6281679B1 (en) 1998-12-21 2001-08-28 Honeywell - Measurex Web thickness measurement system
US6995372B2 (en) * 2003-02-12 2006-02-07 Voith Paper Patent Gmbh Nuclear gauge for measuring a characteristic of a sheet material with sheet position and alignment compensation
US7071480B2 (en) 2003-06-13 2006-07-04 Voith Paper Patent Gmbh Sensor with alignment self compensation
US6967726B2 (en) * 2003-10-03 2005-11-22 Honeywell International Inc. Means for in-place automated calibration of optically-based thickness sensor
US8083895B2 (en) * 2008-04-18 2011-12-27 Honeywell Asca Inc. Sheet stabilization with dual opposing cross direction air clamps
US8088255B2 (en) * 2008-04-18 2012-01-03 Honeywell Asca Inc Sheet stabilizer with dual inline machine direction air clamps and backsteps
US7892399B2 (en) * 2008-05-29 2011-02-22 Honeywell Asca Inc. Local tension generating air stabilization system for web products
US8083896B2 (en) * 2008-09-26 2011-12-27 Honeywell Asca Inc. Pressure equalizing baffle and coanda air clamp
DE102010063232A1 (de) * 2010-12-16 2012-06-21 Voith Patent Gmbh Vorrichtung und Verfahren zur Flächengewichtsbestimmung
US8742385B2 (en) * 2011-01-26 2014-06-03 Honeywell Asca Inc. Beam distortion control system using fluid channels
EP2909573B1 (en) * 2012-10-19 2017-09-06 Picometrix, LLC System for calculation of material properties using reflection terahertz radiation and an external reference structure
US11519710B2 (en) * 2020-02-26 2022-12-06 Honeywell Limited High accuracy and high stability magnetic displacement sensor in the presence of electromagnetic interferences
US20240159685A1 (en) * 2022-11-11 2024-05-16 Honeywell International Inc. Compact-Cross Direction C-Frame Scanner

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3243992A (en) * 1963-09-12 1966-04-05 Boeing Co Gauging device
US3479511A (en) * 1965-06-01 1969-11-18 Industrial Nucleonics Corp Nuclear radiation gauge system
US3552203A (en) * 1967-11-13 1971-01-05 Industrial Nucleonics Corp System for and method of measuring sheet properties
IT992864B (it) * 1972-08-22 1975-09-30 Maschf Augsburg Nuernberg Ag Apparato per determinare senza contatto esattamente e continua mente la temperatura di superfici
US3757126A (en) * 1972-08-28 1973-09-04 Bendix Corp Input stage amplifier gain and balance method of setting moire fringe transducer reading head skew angle and
US3793524A (en) * 1972-09-05 1974-02-19 Measurex Corp Apparatus for measuring a characteristic of sheet materials
JPS4965252A (fi) * 1972-10-23 1974-06-25
US3757122A (en) * 1972-10-30 1973-09-04 D Bossen Basis weight gauging apparatus system and method
DE2306550A1 (de) * 1973-02-10 1974-08-15 Frieseke & Hoepfner Gmbh Geraet zum messen des flaechengewichtes von textilbahnen oder aehnlichem bahnfoermigem messgut
DE2309278C2 (de) * 1973-02-24 1975-03-13 Frieseke & Hoepfner Gmbh, 8520 Erlangen Vorrichtung zur Messung der Konzentration von bestimmten Eigenschaften, zum Beispiel der Feuchtigkeit, bewegter Meßgutbahnen mittels Mikrowellenenergie
JPS5342762A (en) * 1976-09-29 1978-04-18 Seiko Instr & Electronics Ltd Radiation measuring apparatus
JPS5466167A (en) * 1977-11-04 1979-05-28 Hitachi Ltd Thickness measuring method of plate object
US4276480A (en) * 1979-09-28 1981-06-30 Accuray Corporation Sensor position independent material property determination using radiant energy

Also Published As

Publication number Publication date
US4678915B1 (en) 1996-07-16
IE54249B1 (en) 1989-08-02
JPS5920806A (ja) 1984-02-02
EP0094669A1 (en) 1983-11-23
IE831136L (en) 1983-11-17
FI76435C (fi) 1988-10-10
FI76435B (fi) 1988-06-30
CA1205925A (en) 1986-06-10
FI831714L (fi) 1983-11-18
EP0094669B1 (en) 1987-03-11
DE3370181D1 (en) 1987-04-16
US4678915A (en) 1987-07-07

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Legal Events

Date Code Title Description
MM Patent lapsed

Owner name: MEASUREX CORPORATION