FI20146152A - Optinen mittausjärjestelmä - Google Patents
Optinen mittausjärjestelmäInfo
- Publication number
- FI20146152A FI20146152A FI20146152A FI20146152A FI20146152A FI 20146152 A FI20146152 A FI 20146152A FI 20146152 A FI20146152 A FI 20146152A FI 20146152 A FI20146152 A FI 20146152A FI 20146152 A FI20146152 A FI 20146152A
- Authority
- FI
- Finland
- Prior art keywords
- measurement system
- optical measurement
- optical
- measurement
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20146152A FI126498B (fi) | 2014-12-29 | 2014-12-29 | Optinen mittausjärjestelmä |
JP2017535701A JP2018500576A (ja) | 2014-12-29 | 2015-12-11 | 光学測定の構成 |
US15/540,500 US20180003486A1 (en) | 2014-12-29 | 2015-12-11 | An arrangement of optical measurement |
EP15813474.2A EP3240993B1 (en) | 2014-12-29 | 2015-12-11 | An arrangement of optical measurement |
PCT/FI2015/050873 WO2016107969A1 (en) | 2014-12-29 | 2015-12-11 | An arrangement of optical measurement |
CN201580071630.0A CN107407555A (zh) | 2014-12-29 | 2015-12-11 | 光学测量布置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20146152A FI126498B (fi) | 2014-12-29 | 2014-12-29 | Optinen mittausjärjestelmä |
Publications (2)
Publication Number | Publication Date |
---|---|
FI20146152A true FI20146152A (fi) | 2016-06-30 |
FI126498B FI126498B (fi) | 2017-01-13 |
Family
ID=54937105
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI20146152A FI126498B (fi) | 2014-12-29 | 2014-12-29 | Optinen mittausjärjestelmä |
Country Status (6)
Country | Link |
---|---|
US (1) | US20180003486A1 (fi) |
EP (1) | EP3240993B1 (fi) |
JP (1) | JP2018500576A (fi) |
CN (1) | CN107407555A (fi) |
FI (1) | FI126498B (fi) |
WO (1) | WO2016107969A1 (fi) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7231432B2 (ja) * | 2019-02-15 | 2023-03-01 | 株式会社キーエンス | 画像処理装置 |
CN112213332A (zh) * | 2019-07-12 | 2021-01-12 | 无锡先导智能装备股份有限公司 | 表面检测设备 |
FI130408B (fi) | 2022-01-18 | 2023-08-17 | Helmee Imaging Oy | Järjestely ja vastaava menetelmä optisia mittauksia varten |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030067538A1 (en) * | 2001-10-04 | 2003-04-10 | Myers Kenneth J. | System and method for three-dimensional data acquisition |
US7830528B2 (en) * | 2005-12-14 | 2010-11-09 | Koh Young Technology, Inc. | 3D image measuring apparatus and method thereof |
JP5174684B2 (ja) * | 2006-03-14 | 2013-04-03 | プライムセンス リミテッド | スペックル・パターンを用いた三次元検出 |
DE102006050379A1 (de) * | 2006-10-25 | 2008-05-08 | Norbert Prof. Dr. Link | Verfahren und Vorrichtung zur Überwachung eines Raumvolumens sowie Kalibrierverfahren |
DE102008006449A1 (de) * | 2008-01-29 | 2009-07-30 | Kaba Gallenschütz GmbH | Verfahren und Vorrichtung zur Überwachung eines Raumvolumens |
US20100259746A1 (en) * | 2009-04-10 | 2010-10-14 | Omron Corporation | Profilometer |
DE102009059794A1 (de) * | 2009-12-21 | 2011-06-22 | Siemens Aktiengesellschaft, 80333 | Kamera-Projektor-System und ein Verfahren zum Auslösen einer Kamera |
JP5170154B2 (ja) * | 2010-04-26 | 2013-03-27 | オムロン株式会社 | 形状計測装置およびキャリブレーション方法 |
JP5917116B2 (ja) * | 2011-12-06 | 2016-05-11 | キヤノン株式会社 | 情報処理装置、情報処理装置の制御方法、およびプログラム |
FI125320B (fi) | 2012-01-05 | 2015-08-31 | Helmee Imaging Oy | Järjestely ja vastaava menetelmä optisia mittauksia varten |
CN104919272B (zh) * | 2012-10-29 | 2018-08-03 | 7D外科有限公司 | 集成照明及光学表面拓扑检测系统及其使用方法 |
JP6088855B2 (ja) * | 2013-02-28 | 2017-03-01 | モレックス エルエルシー | 外観検査装置及び外観検査方法 |
WO2016092451A1 (en) * | 2014-12-09 | 2016-06-16 | Basf Se | Optical detector |
-
2014
- 2014-12-29 FI FI20146152A patent/FI126498B/fi active IP Right Grant
-
2015
- 2015-12-11 WO PCT/FI2015/050873 patent/WO2016107969A1/en active Application Filing
- 2015-12-11 EP EP15813474.2A patent/EP3240993B1/en not_active Not-in-force
- 2015-12-11 US US15/540,500 patent/US20180003486A1/en not_active Abandoned
- 2015-12-11 JP JP2017535701A patent/JP2018500576A/ja active Pending
- 2015-12-11 CN CN201580071630.0A patent/CN107407555A/zh active Pending
Also Published As
Publication number | Publication date |
---|---|
EP3240993B1 (en) | 2018-12-05 |
JP2018500576A (ja) | 2018-01-11 |
CN107407555A (zh) | 2017-11-28 |
EP3240993A1 (en) | 2017-11-08 |
FI126498B (fi) | 2017-01-13 |
US20180003486A1 (en) | 2018-01-04 |
WO2016107969A1 (en) | 2016-07-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DK3249431T3 (da) | Optiske hulkernefibre | |
DK3376196T3 (da) | Skinnemålesystem | |
DK3163339T3 (da) | Polariseringsbevarende multikernefiber | |
DK3356633T3 (da) | Taper-loc-systemforbedringer | |
DK3140500T3 (da) | Brøndkompletteringssystem | |
DE112016004840A5 (de) | Optischer sensor | |
DK3161247T3 (da) | Brøndsystem | |
DK3136145T3 (da) | Multikerne-/multimodus-fiberkoblingsanordning | |
DK3185055T3 (da) | Optisk fiber | |
DK3234271T3 (da) | Gelændersystem | |
DK3652505T3 (da) | Målesystem | |
DK3394346T3 (da) | Adapter | |
FI20146152A (fi) | Optinen mittausjärjestelmä | |
DK3259549T3 (da) | Lyssporammunition | |
DK3196610T3 (da) | Kombinationsmåleindretning | |
GB2550721B (en) | Optical measurement system | |
FI11194U1 (fi) | Mittausjärjestely | |
ES1111905Y (es) | Adaptador multivia | |
IT201600070208A1 (it) | Apparecchio di misura | |
DE112016002291A5 (de) | Gurtretter-System | |
DK3156830T3 (da) | Optisk transmissionssystem | |
FI11024U1 (fi) | Heijastinnauha | |
DK3053873T3 (da) | Gjordsystem | |
DE112014007261A5 (de) | Messanordnung | |
FI20160246A (fi) | Optinen mittapää |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG | Patent granted |
Ref document number: 126498 Country of ref document: FI Kind code of ref document: B |