FI20106359A - Method of producing an ultrasonic sensor and sensor structure - Google Patents
Method of producing an ultrasonic sensor and sensor structure Download PDFInfo
- Publication number
- FI20106359A FI20106359A FI20106359A FI20106359A FI20106359A FI 20106359 A FI20106359 A FI 20106359A FI 20106359 A FI20106359 A FI 20106359A FI 20106359 A FI20106359 A FI 20106359A FI 20106359 A FI20106359 A FI 20106359A
- Authority
- FI
- Finland
- Prior art keywords
- wafer
- sensor
- poly
- producing
- ultrasound
- Prior art date
Links
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B3/00—Devices comprising flexible or deformable elements, e.g. comprising elastic tongues or membranes
- B81B3/0018—Structures acting upon the moving or flexible element for transforming energy into mechanical movement or vice versa, i.e. actuators, sensors, generators
- B81B3/0021—Transducers for transforming electrical into mechanical energy or vice versa
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/125—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by capacitive pick-up
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B7/00—Microstructural systems; Auxiliary parts of microstructural devices or systems
- B81B7/02—Microstructural systems; Auxiliary parts of microstructural devices or systems containing distinct electrical or optical devices of particular relevance for their function, e.g. microelectro-mechanical systems [MEMS]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
- G01H15/00—Measuring mechanical or acoustic impedance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
- G01H9/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means
- G01H9/008—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means by using ultrasonic waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L11/00—Measuring steady or quasi-steady pressure of a fluid or a fluent solid material by means not provided for in group G01L7/00 or G01L9/00
- G01L11/04—Measuring steady or quasi-steady pressure of a fluid or a fluent solid material by means not provided for in group G01L7/00 or G01L9/00 by acoustic means
- G01L11/06—Ultrasonic means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
- G01L9/0041—Transmitting or indicating the displacement of flexible diaphragms
- G01L9/0051—Transmitting or indicating the displacement of flexible diaphragms using variations in ohmic resistance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/0802—Details
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Transducers For Ultrasonic Waves (AREA)
- Micromachines (AREA)
Abstract
The invention relates to a method for manufacturing an ultrasound sensor(1) comprising the steps for forming by conventional silicon technology a first wafer (111, device wafer) including at least one ultrasound transducer (200) and an ultrasound cavity (4). In accordance with the invention it includes following steps: connecting to the first wafer (111) a second wafer (112) including a substrate (108) and a poly-Silayer (201), the second wafer (112) is connected to the first wafer (111) such that the poly-Si layer (201) forms a connecting surface, and the substrate (109) of the second wafer (112) is etched away in the area of the cavity (4) in order to form a sensor diaphragm (201) of the poly-Silayer (111).
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20106359A FI20106359A (en) | 2010-12-21 | 2010-12-21 | Method of producing an ultrasonic sensor and sensor structure |
PCT/FI2011/051083 WO2012085335A1 (en) | 2010-12-21 | 2011-12-07 | Method for manufacturing an ultrasonic sensor and a sensor structure |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20106359A FI20106359A (en) | 2010-12-21 | 2010-12-21 | Method of producing an ultrasonic sensor and sensor structure |
Publications (2)
Publication Number | Publication Date |
---|---|
FI20106359A0 FI20106359A0 (en) | 2010-12-21 |
FI20106359A true FI20106359A (en) | 2012-06-22 |
Family
ID=43415049
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI20106359A FI20106359A (en) | 2010-12-21 | 2010-12-21 | Method of producing an ultrasonic sensor and sensor structure |
Country Status (2)
Country | Link |
---|---|
FI (1) | FI20106359A (en) |
WO (1) | WO2012085335A1 (en) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6338499B2 (en) * | 2014-09-24 | 2018-06-06 | 三菱電機株式会社 | Foreign matter adhesion detection device and foreign matter adhesion detection method |
FI128447B (en) | 2016-04-26 | 2020-05-15 | Teknologian Tutkimuskeskus Vtt Oy | Apparatus associated with analysis of thin film layer and manufacturing method thereof |
GB2561613B (en) * | 2017-04-21 | 2019-05-08 | The Technology Partnership Plc | Acoustic Sensor |
WO2020072938A1 (en) | 2018-10-05 | 2020-04-09 | Knowles Electronics, Llc | Methods of forming mems diaphragms including corrugations |
WO2020072920A1 (en) | 2018-10-05 | 2020-04-09 | Knowles Electronics, Llc | Microphone device with ingress protection |
WO2020072904A1 (en) | 2018-10-05 | 2020-04-09 | Knowles Electronics, Llc | Acoustic transducers with a low pressure zone and diaphragms having enhanced compliance |
CN112763052B (en) * | 2020-12-16 | 2022-04-08 | 华中科技大学 | Broadband acoustic wave sensor for anti-electronic monitoring |
US11528546B2 (en) | 2021-04-05 | 2022-12-13 | Knowles Electronics, Llc | Sealed vacuum MEMS die |
US11540048B2 (en) | 2021-04-16 | 2022-12-27 | Knowles Electronics, Llc | Reduced noise MEMS device with force feedback |
FI20215462A1 (en) | 2021-04-20 | 2022-10-21 | Teknologian Tutkimuskeskus Vtt Oy | Ultrasound sensor apparatus and method of transmitting of ultrasound |
US11649161B2 (en) | 2021-07-26 | 2023-05-16 | Knowles Electronics, Llc | Diaphragm assembly with non-uniform pillar distribution |
US11772961B2 (en) | 2021-08-26 | 2023-10-03 | Knowles Electronics, Llc | MEMS device with perimeter barometric relief pierce |
US11780726B2 (en) | 2021-11-03 | 2023-10-10 | Knowles Electronics, Llc | Dual-diaphragm assembly having center constraint |
CN114630236A (en) * | 2022-02-28 | 2022-06-14 | 歌尔微电子股份有限公司 | Vibration sensor and electronic device |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7489593B2 (en) * | 2004-11-30 | 2009-02-10 | Vermon | Electrostatic membranes for sensors, ultrasonic transducers incorporating such membranes, and manufacturing methods therefor |
US7037746B1 (en) * | 2004-12-27 | 2006-05-02 | General Electric Company | Capacitive micromachined ultrasound transducer fabricated with epitaxial silicon membrane |
FI20075879A0 (en) * | 2007-12-05 | 2007-12-05 | Valtion Teknillinen | Apparatus for measuring pressure, variation in sound pressure, magnetic field, acceleration, vibration and gas composition |
-
2010
- 2010-12-21 FI FI20106359A patent/FI20106359A/en not_active Application Discontinuation
-
2011
- 2011-12-07 WO PCT/FI2011/051083 patent/WO2012085335A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
FI20106359A0 (en) | 2010-12-21 |
WO2012085335A1 (en) | 2012-06-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Transfer of assignment of patent |
Owner name: TEKNOLOGIAN TUTKIMUSKESKUS VTT Free format text: TEKNOLOGIAN TUTKIMUSKESKUS VTT |
|
FD | Application lapsed |