FI20095843A - Method and system for analyzing material measured from unorganized material by scattering measurements - Google Patents

Method and system for analyzing material measured from unorganized material by scattering measurements Download PDF

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Publication number
FI20095843A
FI20095843A FI20095843A FI20095843A FI20095843A FI 20095843 A FI20095843 A FI 20095843A FI 20095843 A FI20095843 A FI 20095843A FI 20095843 A FI20095843 A FI 20095843A FI 20095843 A FI20095843 A FI 20095843A
Authority
FI
Finland
Prior art keywords
unorganized
scattering measurements
analyzing
measured
material measured
Prior art date
Application number
FI20095843A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI20095843A0 (en
Inventor
Johannes Frantti
Yukari Fujioka
Original Assignee
Con Boys Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Con Boys Oy filed Critical Con Boys Oy
Priority to FI20095843A priority Critical patent/FI20095843A/en
Publication of FI20095843A0 publication Critical patent/FI20095843A0/en
Priority to EP10768039.9A priority patent/EP2464962B1/en
Priority to US13/390,133 priority patent/US20120150511A1/en
Priority to PCT/FI2010/050630 priority patent/WO2011018554A2/en
Publication of FI20095843A publication Critical patent/FI20095843A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Data Mining & Analysis (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Analysis (AREA)
  • General Engineering & Computer Science (AREA)
  • Software Systems (AREA)
  • Databases & Information Systems (AREA)
  • Pure & Applied Mathematics (AREA)
  • Mathematical Optimization (AREA)
  • Computational Mathematics (AREA)
  • Algebra (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FI20095843A 2009-08-14 2009-08-14 Method and system for analyzing material measured from unorganized material by scattering measurements FI20095843A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FI20095843A FI20095843A (en) 2009-08-14 2009-08-14 Method and system for analyzing material measured from unorganized material by scattering measurements
EP10768039.9A EP2464962B1 (en) 2009-08-14 2010-08-13 Method and system for analysing data obtained using scattering measurements from disordered material
US13/390,133 US20120150511A1 (en) 2009-08-14 2010-08-13 Method And System For Analysing Data Obtained Using Scattering Measurements From Disordered Material
PCT/FI2010/050630 WO2011018554A2 (en) 2009-08-14 2010-08-13 Method and system for analysing data obtained using scattering measurements from disordered material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20095843A FI20095843A (en) 2009-08-14 2009-08-14 Method and system for analyzing material measured from unorganized material by scattering measurements

Publications (2)

Publication Number Publication Date
FI20095843A0 FI20095843A0 (en) 2009-08-14
FI20095843A true FI20095843A (en) 2011-02-15

Family

ID=41050671

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20095843A FI20095843A (en) 2009-08-14 2009-08-14 Method and system for analyzing material measured from unorganized material by scattering measurements

Country Status (4)

Country Link
US (1) US20120150511A1 (en)
EP (1) EP2464962B1 (en)
FI (1) FI20095843A (en)
WO (1) WO2011018554A2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106535975B (en) 2014-07-10 2019-07-19 皇家飞利浦有限公司 For the wear indicator of patient interface
CA3041610A1 (en) * 2016-10-24 2018-05-03 Google Llc Simulating materials using quantum computation
WO2020084157A1 (en) 2018-10-25 2020-04-30 Reciprocal Engineering - Re Oy Electrically insulating ferromagnetic material transparent to visible light: synthetization method, material and use in devices

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5200910A (en) 1991-01-30 1993-04-06 The Board Of Trustees Of The Leland Stanford University Method for modelling the electron density of a crystal
US6192103B1 (en) * 1999-06-03 2001-02-20 Bede Scientific, Inc. Fitting of X-ray scattering data using evolutionary algorithms
US6430256B1 (en) 2001-04-30 2002-08-06 Yissum Research Development Company Of The Hebrew University Of Jerusalem Direct structure determination of systems with two dimensional periodicity
JP3953754B2 (en) * 2001-06-27 2007-08-08 株式会社リガク Non-uniform density sample analysis method and apparatus and system thereof
GB0116825D0 (en) * 2001-07-10 2001-08-29 Koninl Philips Electronics Nv Determination of material parameters
EP1522959B1 (en) * 2003-10-07 2009-09-02 Bruker AXS GmbH Application of an improved genetic algorithm for fitting X-ray scattering data
WO2005045726A2 (en) * 2003-10-27 2005-05-19 Ssci, Inc. Method for monte carlo indexing of powder diffraction data

Also Published As

Publication number Publication date
EP2464962B1 (en) 2014-02-19
WO2011018554A3 (en) 2011-04-07
FI20095843A0 (en) 2009-08-14
US20120150511A1 (en) 2012-06-14
WO2011018554A2 (en) 2011-02-17
EP2464962A2 (en) 2012-06-20

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