FI20075829A0 - Menetelmä ja laitteisto liikkuvan pinnan topografian ja optisten ominaisuuksien määrittämiseksi - Google Patents

Menetelmä ja laitteisto liikkuvan pinnan topografian ja optisten ominaisuuksien määrittämiseksi

Info

Publication number
FI20075829A0
FI20075829A0 FI20075829A FI20075829A FI20075829A0 FI 20075829 A0 FI20075829 A0 FI 20075829A0 FI 20075829 A FI20075829 A FI 20075829A FI 20075829 A FI20075829 A FI 20075829A FI 20075829 A0 FI20075829 A0 FI 20075829A0
Authority
FI
Finland
Prior art keywords
topography
determining
optical properties
moving surface
moving
Prior art date
Application number
FI20075829A
Other languages
English (en)
Swedish (sv)
Other versions
FI121151B (fi
FI20075829A (fi
Inventor
Heimo Keraenen
Original Assignee
Valtion Teknillinen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Valtion Teknillinen filed Critical Valtion Teknillinen
Priority to FI20075829A priority Critical patent/FI121151B/fi
Publication of FI20075829A0 publication Critical patent/FI20075829A0/fi
Priority to ES08169222T priority patent/ES2388314T3/es
Priority to EP08169222A priority patent/EP2065675B1/en
Priority to US12/276,215 priority patent/US8363903B2/en
Publication of FI20075829A publication Critical patent/FI20075829A/fi
Application granted granted Critical
Publication of FI121151B publication Critical patent/FI121151B/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41F—PRINTING MACHINES OR PRESSES
    • B41F33/00—Indicating, counting, warning, control or safety devices
    • B41F33/0036—Devices for scanning or checking the printed matter for quality control
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41F—PRINTING MACHINES OR PRESSES
    • B41F33/00—Indicating, counting, warning, control or safety devices
    • B41F33/0063—Devices for measuring the thickness of liquid films on rollers or cylinders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2522—Projection by scanning of the object the position of the object changing and being recorded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Textile Engineering (AREA)
  • Quality & Reliability (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FI20075829A 2007-11-22 2007-11-22 Menetelmä ja laitteisto liikkuvan pinnan topografian ja optisten ominaisuuksien määrittämiseksi FI121151B (fi)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FI20075829A FI121151B (fi) 2007-11-22 2007-11-22 Menetelmä ja laitteisto liikkuvan pinnan topografian ja optisten ominaisuuksien määrittämiseksi
ES08169222T ES2388314T3 (es) 2007-11-22 2008-11-17 Método y aparato para deterrminar la topografía y las propiedades ópticas de una superficie móvil
EP08169222A EP2065675B1 (en) 2007-11-22 2008-11-17 Method and apparatus for determining the topography and optical properties of a moving surface
US12/276,215 US8363903B2 (en) 2007-11-22 2008-11-21 Method and apparatus for determining the topography and optical properties of a moving surface

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20075829A FI121151B (fi) 2007-11-22 2007-11-22 Menetelmä ja laitteisto liikkuvan pinnan topografian ja optisten ominaisuuksien määrittämiseksi
FI20075829 2007-11-22

Publications (3)

Publication Number Publication Date
FI20075829A0 true FI20075829A0 (fi) 2007-11-22
FI20075829A FI20075829A (fi) 2009-05-23
FI121151B FI121151B (fi) 2010-07-30

Family

ID=38786758

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20075829A FI121151B (fi) 2007-11-22 2007-11-22 Menetelmä ja laitteisto liikkuvan pinnan topografian ja optisten ominaisuuksien määrittämiseksi

Country Status (4)

Country Link
US (1) US8363903B2 (fi)
EP (1) EP2065675B1 (fi)
ES (1) ES2388314T3 (fi)
FI (1) FI121151B (fi)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI20075975L (fi) * 2007-12-31 2009-07-01 Metso Automation Oy Rainan mittaus
EP2500687A3 (en) * 2011-03-14 2013-02-20 Heliotis SA Structured light projector
DE102012104282A1 (de) * 2012-05-16 2013-11-21 Isra Vision Ag Verfahren und Vorrichtung zur Inspektion von Oberflächen eines untersuchten Objekts
US9581554B2 (en) * 2013-05-30 2017-02-28 Seagate Technology Llc Photon emitter array
JP6857079B2 (ja) * 2017-05-09 2021-04-14 株式会社キーエンス 画像検査装置
JPWO2019058750A1 (ja) * 2017-09-20 2020-09-03 倉敷紡績株式会社 撮像システム、撮像方法および撮像素子
KR101955847B1 (ko) * 2018-01-23 2019-03-11 한국표준과학연구원 위상천이 편향측정법에서 비선형 응답특성을 보상하기 위한 시스템 및 방법
DE102022002963A1 (de) 2022-08-16 2024-02-22 Baumer lnspection GmbH Optische Prüfvorrichtung und Prüfverfahren

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4634279A (en) * 1984-02-06 1987-01-06 Robotic Vision Systems, Inc. Method of three-dimensional measurement with few projected patterns
ES2153150T3 (es) 1997-08-22 2001-02-16 Fraunhofer Ges Forschung Metodo y aparato para la inspeccion automatica de superficies en movimiento.
JP3914638B2 (ja) * 1997-09-09 2007-05-16 シーケーディ株式会社 形状計測装置
FI20000032A0 (fi) * 2000-01-07 2000-01-07 Spectra Physics Visiontech Oy Järjestely ja menetelmä pinnan tarkistamiseksi
US6496270B1 (en) * 2000-02-17 2002-12-17 Gsi Lumonics, Inc. Method and system for automatically generating reference height data for use in a three-dimensional inspection system
US6501554B1 (en) * 2000-06-20 2002-12-31 Ppt Vision, Inc. 3D scanner and method for measuring heights and angles of manufactured parts
FI20001568A (fi) * 2000-06-30 2001-12-31 Thermo Radiometrie Oy Pinnan muotojen määrittäminen
DE10063293A1 (de) * 2000-12-19 2002-07-04 Fraunhofer Ges Forschung Verfahren und Vorrichtung zur mehrkanaligen Inspektion von Oberflächen im Durchlauf
US7440590B1 (en) * 2002-05-21 2008-10-21 University Of Kentucky Research Foundation System and technique for retrieving depth information about a surface by projecting a composite image of modulated light patterns
US20050219553A1 (en) * 2003-07-31 2005-10-06 Kelly Patrick V Monitoring apparatus
US7400414B2 (en) * 2005-10-31 2008-07-15 Mitutoyo Corporation Hand-size structured-light three-dimensional metrology imaging system and method

Also Published As

Publication number Publication date
US20090135434A1 (en) 2009-05-28
EP2065675A2 (en) 2009-06-03
FI121151B (fi) 2010-07-30
US8363903B2 (en) 2013-01-29
FI20075829A (fi) 2009-05-23
EP2065675A3 (en) 2010-08-25
ES2388314T8 (es) 2012-10-25
ES2388314T3 (es) 2012-10-11
EP2065675B1 (en) 2012-05-16

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