FI20012295A0 - Hyvyysluku - Google Patents

Hyvyysluku

Info

Publication number
FI20012295A0
FI20012295A0 FI20012295A FI20012295A FI20012295A0 FI 20012295 A0 FI20012295 A0 FI 20012295A0 FI 20012295 A FI20012295 A FI 20012295A FI 20012295 A FI20012295 A FI 20012295A FI 20012295 A0 FI20012295 A0 FI 20012295A0
Authority
FI
Finland
Prior art keywords
merit
Prior art date
Application number
FI20012295A
Other languages
English (en)
Swedish (sv)
Other versions
FI111660B (fi
FI20012295A (fi
Inventor
Esa Leikas
Henrik Haggren
Seppo Vaeaetaeinen
Original Assignee
Mapvision Oy Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mapvision Oy Ltd filed Critical Mapvision Oy Ltd
Priority to FI20012295A priority Critical patent/FI111660B/fi
Publication of FI20012295A0 publication Critical patent/FI20012295A0/fi
Priority to AU2002366128A priority patent/AU2002366128A1/en
Priority to US10/496,148 priority patent/US7324712B2/en
Priority to EP02803428A priority patent/EP1459032A1/en
Priority to PCT/FI2002/000949 priority patent/WO2003044459A1/en
Priority to JP2003546045A priority patent/JP2005509878A/ja
Publication of FI20012295A publication Critical patent/FI20012295A/fi
Application granted granted Critical
Publication of FI111660B publication Critical patent/FI111660B/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/55—Depth or shape recovery from multiple images
    • G06T7/593—Depth or shape recovery from multiple images from stereo images
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20088—Trinocular vision calculations; trifocal tensor
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30161—Wood; Lumber
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
FI20012295A 2001-11-23 2001-11-23 Hyvyysluku FI111660B (fi)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FI20012295A FI111660B (fi) 2001-11-23 2001-11-23 Hyvyysluku
AU2002366128A AU2002366128A1 (en) 2001-11-23 2002-11-25 Quality factor
US10/496,148 US7324712B2 (en) 2001-11-23 2002-11-25 Quality factor
EP02803428A EP1459032A1 (en) 2001-11-23 2002-11-25 Quality factor
PCT/FI2002/000949 WO2003044459A1 (en) 2001-11-23 2002-11-25 Quality factor
JP2003546045A JP2005509878A (ja) 2001-11-23 2002-11-25 Ｑ値

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20012295A FI111660B (fi) 2001-11-23 2001-11-23 Hyvyysluku
FI20012295 2001-11-23

Publications (3)

Publication Number Publication Date
FI20012295A0 true FI20012295A0 (fi) 2001-11-23
FI20012295A FI20012295A (fi) 2003-05-24
FI111660B FI111660B (fi) 2003-08-29

Family

ID=8562330

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20012295A FI111660B (fi) 2001-11-23 2001-11-23 Hyvyysluku

Country Status (6)

Country Link
US (1) US7324712B2 (fi)
EP (1) EP1459032A1 (fi)
JP (1) JP2005509878A (fi)
AU (1) AU2002366128A1 (fi)
FI (1) FI111660B (fi)
WO (1) WO2003044459A1 (fi)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007005769A1 (en) * 2005-06-30 2007-01-11 Applera Corporation Automated quality control method and system for genetic analysis
CA2683206C (en) * 2009-10-17 2018-07-03 Hermary Opto Electronics Inc. Enhanced imaging method and apparatus
DE102011006532A1 (de) 2011-03-31 2012-10-04 Bayerische Motoren Werke Aktiengesellschaft Schweißvorrichtung
JP5638578B2 (ja) * 2012-08-09 2014-12-10 株式会社東芝 観測支援装置、観測支援方法およびプログラム
FR3082934B1 (fr) * 2018-06-26 2021-10-08 Safran Nacelles Dispositif et procede de projection laser pour fabrication de pieces en materiau composite par drapage

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2029570A (en) 1978-09-08 1980-03-19 Cambridge Scientific Instr Ltd Improvements in and relating to image analysis system
GB2113838B (en) 1982-01-20 1985-09-18 Antony John Morgan Image analysis
FR2629198B1 (fr) 1988-03-25 1994-07-08 Kreon Ingenierie Marketing Procede de determination et de reconstitution des coordonnees spatiales de chacun des points d'un ensemble de points echantillonnant une surface tridimensionnelle, et procede de realisation d'une image tridimensionnelle de cette surface a partir desdites coordonnees
US5543921A (en) * 1989-05-08 1996-08-06 Canon Kabushiki Kaisha Aligning method utilizing reliability weighting coefficients
US5870178A (en) * 1996-02-20 1999-02-09 Canon Kabushiki Kaisha Distance measuring apparatus
US5886767A (en) * 1996-10-09 1999-03-23 Snook; Richard K. Keratometry system and method for measuring physical parameters of the cornea
CA2253085A1 (en) * 1998-11-06 2000-05-06 Industrial Metrics Inc. Methods and system for measuring three dimensional spatial coordinates and for external camera calibration necessary for that measurement
US6337657B1 (en) * 1999-03-12 2002-01-08 Topcon Positioning Systems, Inc. Methods and apparatuses for reducing errors in the measurement of the coordinates and time offset in satellite positioning system receivers
US6970591B1 (en) * 1999-11-25 2005-11-29 Canon Kabushiki Kaisha Image processing apparatus

Also Published As

Publication number Publication date
EP1459032A1 (en) 2004-09-22
US7324712B2 (en) 2008-01-29
FI111660B (fi) 2003-08-29
JP2005509878A (ja) 2005-04-14
AU2002366128A1 (en) 2003-06-10
WO2003044459A1 (en) 2003-05-30
US20050013510A1 (en) 2005-01-20
FI20012295A (fi) 2003-05-24

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Legal Events

Date Code Title Description
MA Patent expired